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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 5 — Feb. 10, 2014
  • pp: 923–930

Binary pattern deflectometry

Guillaume P. Butel, Greg A. Smith, and James H. Burge  »View Author Affiliations


Applied Optics, Vol. 53, Issue 5, pp. 923-930 (2014)
http://dx.doi.org/10.1364/AO.53.000923


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Abstract

Deflectometry is widely used to accurately calculate the slopes of any specular reflective surface, ranging from car bodies to nanometer-level mirrors. This paper presents a new deflectometry technique using binary patterns of increasing frequency to retrieve the surface slopes. Binary Pattern Deflectometry allows almost instant, simple, and accurate slope retrieval, which is required for applications using mobile devices. The paper details the theory of this deflectometry method and the challenges of its implementation. Furthermore, the binary pattern method can also be combined with a classic phase-shifting method to eliminate the need of a complex unwrapping algorithm and retrieve the absolute phase, especially in cases like segmented optics, where spatial algorithms have difficulties. Finally, whether it is used as a stand-alone or combined with phase-shifting, the binary patterns can, within seconds, calculate the slopes of any specular reflective surface.

© 2014 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 12, 2013
Revised Manuscript: January 3, 2014
Manuscript Accepted: January 4, 2014
Published: February 6, 2014

Citation
Guillaume P. Butel, Greg A. Smith, and James H. Burge, "Binary pattern deflectometry," Appl. Opt. 53, 923-930 (2014)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-53-5-923


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