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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 9 — Mar. 20, 2014
  • pp: 1794–1801

Absolute phase map recovery of two fringe patterns with flexible selection of fringe wavelengths

Jiale Long, Jiangtao Xi, Ming Zhu, Wenqing Cheng, Rui Cheng, Zhongwei Li, and Yusheng Shi  »View Author Affiliations

Applied Optics, Vol. 53, Issue 9, pp. 1794-1801 (2014)

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A novel approach is proposed to unwrap the phase maps of two fringe patterns in fringe pattern projection-based profilometry. In contrast to existing techniques, where spatial frequencies (i.e., the number of fringes on a pattern) of the two fringe patterns must be integers and coprime, the proposed method is applicable for any two fringe patterns with different fringe wavelengths (i.e., the number of pixels in a fringe) and thus provides more flexibility in the use of fringe patterns. Moreover, compared to the existing techniques, the proposed method is simpler in its implementation and has better antierror capability. Theoretical analysis and experiment results are presented to confirm the effectiveness of the proposed method.

© 2014 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(100.5088) Image processing : Phase unwrapping

ToC Category:
Imaging Systems

Original Manuscript: December 3, 2013
Revised Manuscript: February 5, 2014
Manuscript Accepted: February 8, 2014
Published: March 18, 2014

Jiale Long, Jiangtao Xi, Ming Zhu, Wenqing Cheng, Rui Cheng, Zhongwei Li, and Yusheng Shi, "Absolute phase map recovery of two fringe patterns with flexible selection of fringe wavelengths," Appl. Opt. 53, 1794-1801 (2014)

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