On the Calculation of Thin Film Refractive Index and Thickness by Ellipsometry
Applied Optics, Vol. 6, Issue 1, pp. 168-169 (1967)
http://dx.doi.org/10.1364/AO.6.000168
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Abstract
Citation
D. A. Holmes, "On the Calculation of Thin Film Refractive Index and Thickness by Ellipsometry," Appl. Opt. 6, 168-169 (1967)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-6-1-168
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