This paper describes the construction and performance of a computer-operated following ellipsometer. By modifying a conventional ellipsometer and operating it with a process control computer, the polarizer and analyzer null positions can he located in about one second with a resolution of 0.01°. This instrument has been used successfully for in situ studies of the buildup and removal of thin anodic oxide films. As the growth of a film is monitored, the computer also plots the null positions of an X-Y recorder and stores all the experimental data for later printing, punching on cards, or replotting along with theoretical curves.
© 1967 Optical Society of America
Original Manuscript: April 12, 1967
Published: October 1, 1967
J. L. Ord and B. L. Wills, "A Computer-Operated Following Ellipsometer," Appl. Opt. 6, 1673-1677 (1967)