A dual beam bidirectional reflectance attachment, which permits the sample plane to be tilted to plus or minus 45°, is described. No restriction is placed on the type of sample which can be investigated because the incident light impinges on the sample from above. Reflectance spectra of a variety of materials are shown, as well as an indicatrix for a specular and a diffuse reflector. The use of this attachment provides spectra of the kind necessary for interpreting terrestrial and planetary remote sensing data.
© 1967 Optical Society of America
Graham R. Hunt and Howard P. Ross, "A Bidirectional Reflectance Accessory for Spectroscopic Measurements," Appl. Opt. 6, 1687-1690 (1967)