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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 6, Iss. 11 — Nov. 1, 1967
  • pp: 1855–1860

A Crossed Interferometric–Spectrographic Method of Studying Physical Processes

A. M. Shukhtin  »View Author Affiliations


Applied Optics, Vol. 6, Issue 11, pp. 1855-1860 (1967)
http://dx.doi.org/10.1364/AO.6.001855


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Abstract

Methods are described in this paper by which the concentration of electrons in a plasma and the changes in the gas density can be measured by superposing spectrally scanned interference patterns.

© 1967 Optical Society of America

History
Original Manuscript: August 14, 1967
Published: November 1, 1967

Citation
A. M. Shukhtin, "A Crossed Interferometric–Spectrographic Method of Studying Physical Processes," Appl. Opt. 6, 1855-1860 (1967)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-6-11-1855

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