Methods are described in this paper by which the concentration of electrons in a plasma and the changes in the gas density can be measured by superposing spectrally scanned interference patterns.
© 1967 Optical Society of America
Original Manuscript: August 14, 1967
Published: November 1, 1967
A. M. Shukhtin, "A Crossed Interferometric–Spectrographic Method of Studying Physical Processes," Appl. Opt. 6, 1855-1860 (1967)