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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 6, Iss. 11 — Nov. 1, 1967
  • pp: 1917–1923

The Determination of the Absolute Contours of Optical Flats

William Primak  »View Author Affiliations


Applied Optics, Vol. 6, Issue 11, pp. 1917-1923 (1967)
http://dx.doi.org/10.1364/AO.6.001917


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Abstract

Emerson’s procedure (the one in use at the National Bureau of Standards) for determining the absolute contours of optical flats was refined to increase the precision of the method and the speed of taking readings. The fringes were scanned over a photoelectric detector and the intensity profile presented on an oscilloscope. Setting accuracy of a fraction of a hundredth of a fringe was achieved. The data were gathered on a data logger. A complete set of data was obtained in about 5 min. The precision of determining a set of differences of two plates was 1 600 fringe and the precision achieved in determining the absolute plate contours is estimated as 0.005 fringe. The problem of extending the method to 0.002 fringe is discussed.

© 1967 Optical Society of America

History
Original Manuscript: May 26, 1967
Published: November 1, 1967

Citation
William Primak, "The Determination of the Absolute Contours of Optical Flats," Appl. Opt. 6, 1917-1923 (1967)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-6-11-1917


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References

  1. W. B. Emerson, J. Res. Natl. Bur. Std. 49, 241 (1952). [CrossRef]
  2. D. B. Spangenberg, Engineering Metrology Section, Metrology Division, Institute for Basic Standards, National Bureau of Standards, private communication, June24, 1965.
  3. W. Primak, J. Opt. Soc. Am. 49, 375 (1958). [CrossRef]
  4. F. L. Roesler, W. Traub, Appl. Opt. 5, 463 (1966); T. Duong, S. Gerstenkorn, J. M. Hilbert, J. Physique (in press). [CrossRef] [PubMed]
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  9. E. Passaglia, R. R. Stromberg, J. Kruger, Eds., Ellipsometry in the Measurement of Surfaces and Thin Films, NBS Misc. Pub. 256 (1964), p. 154.

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