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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 11 — Nov. 1, 1968
  • pp: 2190–2194

Electronic Scanning Spectrometer for Measurements of Rapidly Changing Spectra

Doran J. Baker and Allan J. Steed  »View Author Affiliations


Applied Optics, Vol. 7, Issue 11, pp. 2190-2194 (1968)
http://dx.doi.org/10.1364/AO.7.002190


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Abstract

This spectrometer has a resolution of 15 Å over the spectral region 0.6–1 μ, and can obtain electronically read out spectra at selectable scanning rates of up to 10,000 scans/sec. The technique of using an image dissector as the detector holds promise of even faster scan rates. The NEI of 4.6 × 10−5 W/cm2 at 0.8 μ is comparable with that of ir streak films. The instrument is ruggedized for field and airborne use.

© 1968 Optical Society of America

History
Original Manuscript: May 1, 1968
Published: November 1, 1968

Citation
Doran J. Baker and Allan J. Steed, "Electronic Scanning Spectrometer for Measurements of Rapidly Changing Spectra," Appl. Opt. 7, 2190-2194 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-11-2190

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