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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 11 — Nov. 1, 1968
  • pp: 2218–2220

A Sensitive Single Beam Device for Continuous Reflectance or Transmittance Measurements

D. Beaglehole  »View Author Affiliations


Applied Optics, Vol. 7, Issue 11, pp. 2218-2220 (1968)
http://dx.doi.org/10.1364/AO.7.002218


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Abstract

We describe a single beam device that records continuously as a function of wavelength, simple quantities related to the reflectance and transmittance, (1 − R)/(1 + R) and (1 − T)/(1 + T). The unit is easily attached to any spectrometer. It is sensitive to changes in these quantities of about 1 × 10−4, while systematic errors in alignment set an absolute accuracy of about 1 × 10−3.

© 1968 Optical Society of America

History
Original Manuscript: May 20, 1968
Published: November 1, 1968

Citation
D. Beaglehole, "A Sensitive Single Beam Device for Continuous Reflectance or Transmittance Measurements," Appl. Opt. 7, 2218-2220 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-11-2218


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References

  1. H. E. Bennett, W. F. Koehler, J. Opt. Soc. Amer. 50,1, 1960. [CrossRef]
  2. U. Gerhardt, James Franck Institute, Chicago (private communication).
  3. D. Beaglehole, W. F. Tseng., Bull. Am. Phys. Soc. Ser. II, 13, 388, 1968.

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