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Applied Optics

Applied Optics


  • Vol. 7, Iss. 11 — Nov. 1, 1968
  • pp: 2319–2320

Material Measurement Schemes for the Far Infrared

W. Block, D. Keune, and H. Sievering  »View Author Affiliations

Applied Optics, Vol. 7, Issue 11, pp. 2319-2320 (1968)

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No abstract available.

Original Manuscript: June 6, 1968
Published: November 1, 1968

W. Block, D. Keune, and H. Sievering, "Material Measurement Schemes for the Far Infrared," Appl. Opt. 7, 2319-2320 (1968)

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  1. A. Crocker et al., Nature 201, 250 (1964). [CrossRef]
  2. L. E. S. Mathias et al., Electron. Lett. 1, 45 (1965). [CrossRef]
  3. M. Yeow Ja, CSF Final Report, RADC TR66 185 (30December1965).
  4. J. E. Degenford, P. D. Coleman, Proc. IEEE 54, 520 (1966). [CrossRef]
  5. T. E. Talpey, IEEE Trans. MTT-2, 1 (1954).
  6. T. S. Moss, Optical Properties of Semi-Conductors (Butterworths, London, 1961), Chap. 1.
  7. P. L. Richards, J. Opt. Soc. Amer. 54, 1474 (1964). [CrossRef]

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