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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 12 — Dec. 1, 1968
  • pp: 2367–2372

Mean Life Measurements Using the Beam Foil Light Source

William S. Bickel  »View Author Affiliations


Applied Optics, Vol. 7, Issue 12, pp. 2367-2372 (1968)
http://dx.doi.org/10.1364/AO.7.002367


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Abstract

A procedure for making quantitative measurements of the mean lives of electronic levels in beam foil-excited ions is described. Special emphasis is given to the theoretical equations that must be fitted to data and various beam particle monitoring techniques.

© 1968 Optical Society of America

History
Original Manuscript: August 1, 1968
Published: December 1, 1968

Citation
William S. Bickel, "Mean Life Measurements Using the Beam Foil Light Source," Appl. Opt. 7, 2367-2372 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-12-2367

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