A procedure for making quantitative measurements of the mean lives of electronic levels in beam foil-excited ions is described. Special emphasis is given to the theoretical equations that must be fitted to data and various beam particle monitoring techniques.
© 1968 Optical Society of America
Original Manuscript: August 1, 1968
Published: December 1, 1968
William S. Bickel, "Mean Life Measurements Using the Beam Foil Light Source," Appl. Opt. 7, 2367-2372 (1968)