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Applied Optics

Applied Optics


  • Vol. 7, Iss. 12 — Dec. 1, 1968
  • pp: 2367–2372

Mean Life Measurements Using the Beam Foil Light Source

William S. Bickel  »View Author Affiliations

Applied Optics, Vol. 7, Issue 12, pp. 2367-2372 (1968)

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A procedure for making quantitative measurements of the mean lives of electronic levels in beam foil-excited ions is described. Special emphasis is given to the theoretical equations that must be fitted to data and various beam particle monitoring techniques.

© 1968 Optical Society of America

Original Manuscript: August 1, 1968
Published: December 1, 1968

William S. Bickel, "Mean Life Measurements Using the Beam Foil Light Source," Appl. Opt. 7, 2367-2372 (1968)

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  1. S. Bashkin, Appl. Opt. 7, 2341 (1968). [CrossRef] [PubMed]
  2. W. S. Bickel, Appl. Opt. 6, 1309 (1967). [CrossRef] [PubMed]
  3. J. B. Marion, Rev. Mod. Phys. 38, 660 (1966). [CrossRef]
  4. L. C. Northcliffe, Ann. Rev. Nucl. Sci. 13, 67 (1963). [CrossRef]

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