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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 12 — Dec. 1, 1968
  • pp: 2373–2375

Charge Deflection Experiments in Beam Foil Spectroscopy

Uwe Fink  »View Author Affiliations


Applied Optics, Vol. 7, Issue 12, pp. 2373-2375 (1968)
http://dx.doi.org/10.1364/AO.7.002373


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Abstract

The technique of static beam deflection in beam foil spectroscopy is discussed. This technique allows the determination of the parent ionization stage of the emitting ions. A comparison between electric and magnetic field deflection is made. Electric deflection experiments carried out to date are reviewed.

© 1968 Optical Society of America

History
Original Manuscript: June 17, 1968
Published: December 1, 1968

Citation
Uwe Fink, "Charge Deflection Experiments in Beam Foil Spectroscopy," Appl. Opt. 7, 2373-2375 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-12-2373

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