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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 12 — Dec. 1, 1968
  • pp: 2373–2375

Charge Deflection Experiments in Beam Foil Spectroscopy

Uwe Fink  »View Author Affiliations


Applied Optics, Vol. 7, Issue 12, pp. 2373-2375 (1968)
http://dx.doi.org/10.1364/AO.7.002373


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Abstract

The technique of static beam deflection in beam foil spectroscopy is discussed. This technique allows the determination of the parent ionization stage of the emitting ions. A comparison between electric and magnetic field deflection is made. Electric deflection experiments carried out to date are reviewed.

© 1968 Optical Society of America

History
Original Manuscript: June 17, 1968
Published: December 1, 1968

Citation
Uwe Fink, "Charge Deflection Experiments in Beam Foil Spectroscopy," Appl. Opt. 7, 2373-2375 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-12-2373


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References

  1. S. Bashkin, Appl. Opt. 7, 2341 (1968). [CrossRef] [PubMed]
  2. P. R. Malmberg, S. Bashkin, S. G. Tilford, Phys. Rev. Lett. 15, 98 (1965). [CrossRef]
  3. U. Fink, J. Opt. Soc. Amer. 58, 937 (1968). [CrossRef]
  4. W. Whaling, R. B. King, P. L. Smith, in Proceedings of the Beam-Foil Spectroscopy Conference, Tucson, Arizona, November, 1967, S. Bashkin, Ed. (Gordon and Breach, New York), 1968, in press.
  5. L. Brown, W. Kent Ford, V. Rubin, W. Trächslin, in Ref. 4.

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