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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 8 — Aug. 1, 1968
  • pp: 1461–1465

Axial Twist and Planar Inversion Interferometers

Ronald Alpiar  »View Author Affiliations


Applied Optics, Vol. 7, Issue 8, pp. 1461-1465 (1968)
http://dx.doi.org/10.1364/AO.7.001461


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Abstract

The theoretical background for a type of common path interferometer, the so-called axial twist interferometer, is discussed. Two devices capable of producing axially twisted bundles of rays are illustrated. Applications of the system are suggested with particular reference to interference microscopy. A simpler, related device, the planar inversion interferometer, is also described, and the characteristics and applicability of the two instruments are compared.

© 1968 Optical Society of America

History
Original Manuscript: February 2, 1968
Published: August 1, 1968

Citation
Ronald Alpiar, "Axial Twist and Planar Inversion Interferometers," Appl. Opt. 7, 1461-1465 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-8-1461


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References

  1. J. B. Saunders, Appl. Opt. 6, 1581 (1967). [CrossRef] [PubMed]
  2. M. V. R. K. Murty, E. C. Hagerott, Appl. Opt. 5, 615 (1966). [CrossRef] [PubMed]
  3. M. Françon, in Progress in Microscopy (Pergamon Press, New York, 1961), pp. 107–109, 113–117.
  4. W. Kosters, Interferenzdoppelprisma für Messzwecke, German Pat.595211 (1934).

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