The theoretical background for a type of common path interferometer, the so-called axial twist interferometer, is discussed. Two devices capable of producing axially twisted bundles of rays are illustrated. Applications of the system are suggested with particular reference to interference microscopy. A simpler, related device, the planar inversion interferometer, is also described, and the characteristics and applicability of the two instruments are compared.
© 1968 Optical Society of America
Original Manuscript: February 2, 1968
Published: August 1, 1968
Ronald Alpiar, "Axial Twist and Planar Inversion Interferometers," Appl. Opt. 7, 1461-1465 (1968)