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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 8 — Aug. 1, 1968
  • pp: 1559–1563

Escape Probability of Photoelectrons into Vacuum

John A. Love, III and John R. Sizelove  »View Author Affiliations


Applied Optics, Vol. 7, Issue 8, pp. 1559-1563 (1968)
http://dx.doi.org/10.1364/AO.7.001559


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Abstract

The spectral response of photocathodes is severely degraded toward the ir portion of the optical spectrum. This paper compares the quantum efficiency of the S–11 and the S–20 photocathodes, based on an absorption diffusion model, with their quantum efficiency as reported by the ITT spectral response curves. This comparison (ratio) shows that the ir-degradation is due primarily to the poor escape probability of a low energy photoelectron over the surface potential barrier rather than degradation in absorption. This ratio is used to estimate an escape probability that is plotted as a function of photon energy.

© 1968 Optical Society of America

History
Original Manuscript: February 1, 1967
Published: August 1, 1968

Citation
John A. Love and John R. Sizelove, "Escape Probability of Photoelectrons into Vacuum," Appl. Opt. 7, 1559-1563 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-8-1559

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