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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 7, Iss. 8 — Aug. 1, 1968
  • pp: 1649–1652

Radiometry with Spectrally Selective Sensors

Fred E. Nicodemus  »View Author Affiliations


Applied Optics, Vol. 7, Issue 8, pp. 1649-1652 (1968)
http://dx.doi.org/10.1364/AO.7.001649


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No abstract available.

History
Original Manuscript: March 1, 1968
Published: August 1, 1968

Citation
Fred E. Nicodemus, "Radiometry with Spectrally Selective Sensors," Appl. Opt. 7, 1649-1652 (1968)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-7-8-1649


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References

  1. L. M. Biberman, Appl. Opt. 6, 1127 (1967). [CrossRef] [PubMed]
  2. F. H. Barr, E. H. Eberhardt, Appl. Opt. 6, 1575 (1967). [CrossRef] [PubMed]
  3. H. K. Hammond, Appl. Opt. 7, 985 (1968). [CrossRef]
  4. G. Kelton et al., Infrared Phys. 3, 139 (1963). [CrossRef]
  5. F. E. Nicodemus, “Treatment of Data, Use of Calibration Data,” Section 3 (Lecture No. 17) in “1966 Lectures at the University of Michigan Engineering Summer Conferences,” Sylvania Electronic Systems—Western Division, Mountain View, California, Rep. No. SESW–L41, 15September1996.
  6. “Relative Spectral Response Data for Photosensitive Devices (‘S’ Curves),” formulated by JEDEC Electron Tube Council, JEDEC Publication No. 50, October1964.
  7. “Typical Characteristics of Photosensitive Surfaces,” formulated by JEDEC Electron Tube Council, JEDEC Publication No. 61, December1966.
  8. W. A. Wildhack, R. C. Powell, H. L. Mason, Eds., “Accuracy in Measurements and Calibrations, 1965,” National Bureau of Standards, Technical Note 262, issued June15, 1965; see especially pp. 128–129.
  9. R. Stair, W. E. Schneider, J. K. Jackson, Appl. Opt. 2, 1151 (1963). [CrossRef]
  10. I. Wunderman, Appl. Opt. 7, 25 (1968). [CrossRef] [PubMed]
  11. I. Wunderman, Cintra Inc.; private communication.
  12. R. Engstrom, RCA-Lancaster; private communication.
  13. L. M. Biberman, Institute for Defense Analyses; private communication.

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