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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 8, Iss. 8 — Aug. 1, 1969
  • pp: 1667–1671

Far Infrared Measurement of the Dielectric Properties of GaAs and CdTe at 300 K and 8 K

C. J. Johnson, G. H. Sherman, and R. Weil  »View Author Affiliations


Applied Optics, Vol. 8, Issue 8, pp. 1667-1671 (1969)
http://dx.doi.org/10.1364/AO.8.001667


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Abstract

The real refractive index n and power absorption coefficient α of high resistivity GaAs and CdTe have been directly measured at 300 K and 8 K in the wavelength region from 12.5 μ to 300 μ. This spectral region contains the fundamental lattice resonance of both materials: 37.2 μ for GaAs and 71.4 μ for CdTe. This resonance causes large dispersion in the linear material properties. Single Drude-type oscillators have been visually fit to the measured n data with the results that for GaAs, dc = 12.8 ± 0.5 at 300 K and 12.6 ± 0.5 at 8 K, and ′ = 10.9 ± 0.4 at 300 K and 8 K; for CdTe, dc = 9.4 ± 0.4 at 300 K and 9.0 ± 0.4 at 8 K, and ′ = 6.7 ± 0.3 at 300 K and 8 K. The GaAs data clarifies the role of dispersion in n in the 5–20 μ region where previous results differ considerably. For both materials the n and α data in the region past 30 μ are the first to be reported.

© 1969 Optical Society of America

History
Original Manuscript: March 4, 1969
Published: August 1, 1969

Citation
C. J. Johnson, G. H. Sherman, and R. Weil, "Far Infrared Measurement of the Dielectric Properties of GaAs and CdTe at 300 K and 8 K," Appl. Opt. 8, 1667-1671 (1969)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-8-8-1667

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