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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 9, Iss. 3 — Mar. 1, 1970
  • pp: 669–673

A Laser-Assisted Infrared Scanning Technique for Evaluating Bonded Connections on Beam Lead Microcircuits

B. C. Miao and J. Longfellow  »View Author Affiliations


Applied Optics, Vol. 9, Issue 3, pp. 669-673 (1970)
http://dx.doi.org/10.1364/AO.9.000669


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Abstract

An argon ion laser and an ir microscope have been combined to function as a unique combination for non-destructively testing the quality of bonded connections in microcircuits of the beam lead type. A microcircuit is heated with the focused beam from the laser and scanned with the microscope to determine the temperature pattern. Nonbonded microcircuits, poorly bonded microcircuits, and a multiplicity of adjacent poorly bonded leads have been detected by using this scanner. Preliminary results have indicated that a single nonbonded connection in an array of well bonded connections may be detected. An analytical check by computer analysis demonstrates the validity of the experimental data.

© 1970 Optical Society of America

History
Original Manuscript: September 11, 1969
Published: March 1, 1970

Citation
B. C. Miao and J. Longfellow, "A Laser-Assisted Infrared Scanning Technique for Evaluating Bonded Connections on Beam Lead Microcircuits," Appl. Opt. 9, 669-673 (1970)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-9-3-669


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References

  1. M. P. Lepselter, Bell System Tech. J. 45, 233 (1966).
  2. F. L. Howland, J. E. Clark, M. P. Eleftherion, “Bonding of Beam Load Integrated Circuits,” Paper presented to the International Electron Device Meeting, 19 October 1967.
  3. M. P. Eleftherion, F. J. Schneider, W. R. Wanesky, Proceedings 1968 Electronic Components Conference (IEEE, May1968), p. 419.
  4. A. Coucoulas, B. H. Cranston, IEEE Trans. Electron Devices ED-15, 664 (1968). [CrossRef]
  5. F. E. Alzofon, A. D. McDonald, Mater. Evaluation 25, 183 (1967).
  6. D. H. Schumacher, Transactions Infrared and Thermal Sessions (American Society for Nondestructive Testing, October1967), p. 42.
  7. C. D. Irish, private communication, used by permission of Bell Laboratories, Holmdel, N. J.
  8. E. F. Labuda, E. I. Gordon, R. C. Miller, IEEE J. Quantum Electron. QE-1, 273 (1965). [CrossRef]
  9. J. R. Yoder, Appl. Opt. 7, 1791 (1968). [CrossRef] [PubMed]
  10. V. L. Hein, Bell System Tech. J. 46, 1659 (1967).

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