OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 9, Iss. 3 — Mar. 1, 1970
  • pp: 669–673

A Laser-Assisted Infrared Scanning Technique for Evaluating Bonded Connections on Beam Lead Microcircuits

B. C. Miao and J. Longfellow  »View Author Affiliations


Applied Optics, Vol. 9, Issue 3, pp. 669-673 (1970)
http://dx.doi.org/10.1364/AO.9.000669


View Full Text Article

Enhanced HTML    Acrobat PDF (669 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

An argon ion laser and an ir microscope have been combined to function as a unique combination for non-destructively testing the quality of bonded connections in microcircuits of the beam lead type. A microcircuit is heated with the focused beam from the laser and scanned with the microscope to determine the temperature pattern. Nonbonded microcircuits, poorly bonded microcircuits, and a multiplicity of adjacent poorly bonded leads have been detected by using this scanner. Preliminary results have indicated that a single nonbonded connection in an array of well bonded connections may be detected. An analytical check by computer analysis demonstrates the validity of the experimental data.

© 1970 Optical Society of America

History
Original Manuscript: September 11, 1969
Published: March 1, 1970

Citation
B. C. Miao and J. Longfellow, "A Laser-Assisted Infrared Scanning Technique for Evaluating Bonded Connections on Beam Lead Microcircuits," Appl. Opt. 9, 669-673 (1970)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-9-3-669

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited