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Interferometric Techniques for Measuring Dimensional Stability of Passive Etalons

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Abstract

Methods are described for investigating the dimensional stability of passive Fabry-Perot etalons with spacers made of low expansion materials. The measurements are made in terms of the Krypton 86 primary length standard which is reproducible to 1 part in 108. The precision of the measurements defined as LL when ΔL is the smallest detectable change in the optical length L is also of this order.

© 1970 Optical Society of America

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