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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 9, Iss. 3 — Mar. 1, 1970
  • pp: 743–747

Interferometric Techniques for Measuring Dimensional Stability of Passive Etalons

C. F. Bruce and R. M. Duffy  »View Author Affiliations


Applied Optics, Vol. 9, Issue 3, pp. 743-747 (1970)
http://dx.doi.org/10.1364/AO.9.000743


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Abstract

Methods are described for investigating the dimensional stability of passive Fabry-Perot etalons with spacers made of low expansion materials. The measurements are made in terms of the Krypton 86 primary length standard which is reproducible to 1 part in 108. The precision of the measurements defined as LL when ΔL is the smallest detectable change in the optical length L is also of this order.

© 1970 Optical Society of America

History
Original Manuscript: September 2, 1969
Published: March 1, 1970

Citation
C. F. Bruce and R. M. Duffy, "Interferometric Techniques for Measuring Dimensional Stability of Passive Etalons," Appl. Opt. 9, 743-747 (1970)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-9-3-743

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