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Applied Optics

Applied Optics


  • Vol. 9, Iss. 9 — Sep. 1, 1970
  • pp: 2053–2058

Fizeau Interferometer–Fringe Sharpening

P. Langenbeck  »View Author Affiliations

Applied Optics, Vol. 9, Issue 9, pp. 2053-2058 (1970)

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A vector representation of the formation of fringe profiles in a Fizeau (wedge) interferometer shows that, under certain conditions, off-axis illumination may lead to fringe sharpening. The incident angle is such that the beam is first reflected toward the apex of the wedge and, following a certain controllable number of reflections, is reflected away from the apex. A typical example is shown.

© 1970 Optical Society of America

Original Manuscript: January 28, 1970
Published: September 1, 1970

P. Langenbeck, "Fizeau Interferometer–Fringe Sharpening," Appl. Opt. 9, 2053-2058 (1970)

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  1. J. Pastor, H. Lee, J. Opt. Soc. Amer. 58, 149 (1968). [CrossRef]
  2. P. Langenbeck, J. Opt. Soc. Amer. 58, 1568 (1968).
  3. J. Brossel, Proc. Phys. Soc. 59, 224 (1947). [CrossRef]
  4. T. A. Hall, J. Sci. Instrum. (J. Phys. E) 2, 837 (1969). [CrossRef]
  5. G. Koppelmann, Habilitationsschrift (Tech. Univ.Berlin, 1966).
  6. E. Roberts, P. Langenbeck, Appl. Opt. 8, 11 (1969). [CrossRef]

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