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Applied Optics

Applied Optics



About the Journal

A highly regarded, premium quality must read for everyone in the optics field that offers applications-centered research in optics, photonics, imaging, and sensing. Topics germane to the journal include optical technology, lasers, photonics, environmental optics, and information processing.

Editor-in-Chief: Ronald Driggers, St. Johns Optical Systems
ISSN: 1559-128X | eISSN: 2155-3165
Frequency: Rapid article-at-a-time publication; 3 issues per month
2013 Impact Factor: 1.649

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Simulation, fabrication, and characterization of a tunable electrowetting-based lens with a wedge-shaped PDMS dielectric layer
Microlenses with tunable focal length have wide applications in optofluidic devices. This work presents a... Applied Optics, Vol. 54 Issue 10, pp.3010-3017 (2015)

Periodic modulation-based spectral and temporal superresolution with a single measurement
In a superresolution technique, based on periodic modulation of the signal to be tested, high resolution is... Applied Optics, Vol. 54 Issue 10, pp.2999-3009 (2015)

Correction of large retardation window effect for ellipsometry measurements using quasi-Newton method
Optical windows attached to the sample chamber for ellipsometry measurements often manifest stress-induced... Applied Optics, Vol. 54 Issue 10, pp.2991-2998 (2015)

Instrument transfer function of slope measuring deflectometry systems
Slope measuring deflectometry (SMD) systems are developing rapidly in testing freeform optics. They measure... Applied Optics, Vol. 54 Issue 10, pp.2981-2990 (2015)

Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage
An unsupervised approach for the inspection of defects in textiles by applying Fourier analysis and wavelet... Applied Optics, Vol. 54 Issue 10, pp.2963-2980 (2015)

Parametric analysis of damage probability: a tool to identify weak layers within multilayer coatings
The role of defects, inherent to fused silica substrate due to polishing and deposition processes, is... Applied Optics, Vol. 54 Issue 10, pp.2953-2962 (2015)

Analyzing closed-fringe images using two-dimensional Fan wavelets
In this paper, it will be shown how the use of two 2D Fan wavelets to analyze closed-fringe images can lead... Applied Optics, Vol. 54 Issue 10, pp.2939-2952 (2015)

Structural compensation enhancement method for nonuniform illumination images
A structural compensation enhancement method is proposed to resolve the issue of nonuniform illumination... Applied Optics, Vol. 54 Issue 10, pp.2929-2938 (2015)

Orthonormal polynomials for annular pupil including a cross-shaped obstruction
By nonrecursive matrix method using the Zernike circle polynomials as the basis functions, we derived a set... Applied Optics, Vol. 54 Issue 10, pp.2922-2928 (2015)

Extractive FTIR spectroscopy with cryogen-free low-temperature inert preconcentration for autonomous measurements of atmospheric organics: 1: Instrument development and preliminary performance
In collaboration with the Jefferson County Department of Health and the Environmental Protection Agency... Applied Optics, Vol. 54 Issue 10, pp.2908-2921 (2015)

Object tracking based on incremental Bi-2DPCA learning with sparse structure
In this paper, we propose a novel object tracking method that can work well in challenging scenarios such as... Applied Optics, Vol. 54 Issue 10, pp.2897-2907 (2015)

High time–bandwidth product and high repetition rate period signal generation based on spectral hole burning crystal
This paper proposes an approach for the generation of high time–bandwidth product (TBP) and high... Applied Optics, Vol. 54 Issue 10, pp.2891-2896 (2015)

Small displacement measurements based on an angular-deviation amplifier and interferometric phase detection
We propose a method for small displacement measurement based on the angle deviation to phase change... Applied Optics, Vol. 54 Issue 10, pp.2885-2890 (2015)

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Call for Papers

Optical Design and Testing 2015
  • Yi-Chin Fang, Chao-Wen Liang, Yi-Ching Fang, John Koshel, Chao-Wen Liang, Jose Sasian, Yongtian Wang, Toyohiko Yatagai, James M. Zavisian
  • Submission opens: 15 March 2015; submission deadline: 15 May 2015

In Progress

Imaging Systems and Signal Recovery
  • Gisele Bennett, Christy Fernandez-Cull, David Gerwe, Michael Kriss, Edmund Lam, Zeev Zalevsky
  • In progress (no new submissions accepted)


Focus on Compressive Sensing (Invited Only)
  • Joseph N. Mait, Abhijit Mahalanobis, Mark A. Neifeld, and Ravindra A. Athale
  • Published
Light and Color in the Open Air
  • Joseph A. Shaw, Raymond L. Lee, and Philip Laven
  • Published
2014 Digital Holography and 3-D Imaging
  • Yoshio Hayasaki (lead), Marc Georges, and Jung-Ping Liu
  • Published
Optical Design and Testing
  • Bob Breault, Yi-Ching Fang, John Koshel, Chao-Wen Liang, Jose Sasian, Yongtian Wang
  • Published
Advances in Lithography
  • Bruce Smith, Rongguang Liang, Andreas Erdmann, Apo Sezginer
  • Published
Laser Interaction with Materials (Invited only)
  • Claude Phipps (Lead), Willy Bohn, Thierry Sarnet
  • Published
Digital Holography and 3-D Imaging
  • Myung K. Kim, Chau-Jern Cheng, Jinwoong Kim, Wolfgang Osten, Pascal Picart, Hiroshi Yoshikawa
  • Published
Focus on Sandia National Laboratories (Invited Only)
  • Robert Boye
  • Published

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