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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 19 — Jul. 1, 2014
  • pp: 4089–4362

Optics InfoBase > Applied Optics > Volume 53 > Issue 19 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Fiber Optics and Optical Communications
  • Fourier Optics and Signal Processing
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Optical Data Storage
  • Optical Design and Fabrication
  • Optical Devices
  • Physical Optics
  • Remote Sensing and Sensors
  • Scattering
  • Spectroscopy
  • Thin Films
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Atmospheric and Oceanic Optics

  • Applied Optics Vol. 53, Iss. 19, pp. 4100–4116 (2014)
  • Chester S. Gardner and Fabio A. Vargas

  • Applied Optics Vol. 53, Iss. 19, pp. 4282–4296 (2014)
  • Vivian Issa and Zahir A. Daya

Fiber Optics and Optical Communications

  • Applied Optics Vol. 53, Iss. 19, pp. 4094–4099 (2014)
  • Yi Qin, Zhipeng Wang, and Qiong Gong

  • Applied Optics Vol. 53, Iss. 19, pp. 4123–4127 (2014)
  • H. Ahmad, N. F. Razak, M. Z. Zulkifli, F. D. Muhammad, Y. Munajat, and S. W. Harun

  • Applied Optics Vol. 53, Iss. 19, pp. 4200–4205 (2014)
  • Jun Lou, Hong-zhi Xu, Ben Xu, Jie Huang, Ben-chong Li, and Wei-min Shen

Fourier Optics and Signal Processing

  • Applied Optics Vol. 53, Iss. 19, pp. 4297–4300 (2014)
  • Zhi Zhong, Pengjun Gao, Mingguang Shan, Ying Wang, and Yabin Zhang

  • Applied Optics Vol. 53, Iss. 19, pp. 4301–4312 (2014)
  • Iftach Klapp, Asi Solodar, and Ibrahim Abdulhalim

Geometric Optics

  • Applied Optics Vol. 53, Iss. 19, pp. 4248–4255 (2014)
  • Likai Li, Thomas W. Raasch, Ingo Sieber, Erik Beckert, Ralf Steinkopf, Ulrich Gengenbach, and Allen Y. Yi

  • Applied Optics Vol. 53, Iss. 19, pp. 4343–4348 (2014)
  • Shuma Horiuchi, Shuhei Yoshida, and Manabu Yamamoto

Holography

  • Applied Optics Vol. 53, Iss. 19, pp. 4150–4157 (2014)
  • Rahul G. Waghmare, Deepak Mishra, G. R. K. Sai Subrahmanyam, Earu Banoth, and Sai Siva Gorthi

  • Applied Optics Vol. 53, Iss. 19, pp. 4206–4210 (2014)
  • Yi Xie, Ming-Wu Kang, and Bao-Ping Wang

Image Processing

  • Applied Optics Vol. 53, Iss. 19, pp. 4141–4149 (2014)
  • Wenda Zhao, Zhijun Xu, Jian Zhao, Fan Zhao, and Xizhen Han

  • Applied Optics Vol. 53, Iss. 19, pp. 4164–4171 (2014)
  • Roberto Reif, Utku Baran, and Ruikang K. Wang

Imaging Systems

  • Applied Optics Vol. 53, Iss. 19, pp. 4228–4232 (2014)
  • Alexis Matwyschuk

  • Applied Optics Vol. 53, Iss. 19, pp. 4327–4333 (2014)
  • Alex Côté, Simon Levasseur, Sylvain Boudreau, and Jérôme Genest

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 19, pp. 4216–4227 (2014)
  • Bing Pan, Liping Yu, and Dafang Wu

  • Applied Optics Vol. 53, Iss. 19, pp. 4256–4263 (2014)
  • Yan Gao, Yanguang Yu, Jiangtao Xi, and Qinghua Guo

  • Applied Optics Vol. 53, Iss. 19, pp. 4313–4319 (2014)
  • Saulius Nevas, Julian Gröbner, Luca Egli, and Mario Blumthaler

  • Applied Optics Vol. 53, Iss. 19, pp. 4334–4342 (2014)
  • Peter J. de Groot

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 19, pp. 4089–4093 (2014)
  • Duanduan Wu, Fengfu Xiong, Cankun Zhang, Shanshan Chen, Huiying Xu, Zhiping Cai, Weiwei Cai, Kaijun Che, and Zhengqian Luo

  • Applied Optics Vol. 53, Iss. 19, pp. 4180–4186 (2014)
  • Wei Zhang, You Wang, He Cai, Liangping Xue, Juhong Han, Hongyuan Wang, and Zhiye Liao

  • Applied Optics Vol. 53, Iss. 19, pp. 4195–4199 (2014)
  • Yanxiong Niu, Haisha Niu, Ning Liu, and Jiang Li

  • Applied Optics Vol. 53, Iss. 19, pp. 4233–4238 (2014)
  • Richard M. Carter, Jianyong Chen, Jonathan D. Shephard, Robert R. Thomson, and Duncan P. Hand

  • Applied Optics Vol. 53, Iss. 19, pp. 4349–4358 (2014)
  • Guangzhi Zhu, Xiao Zhu, Yan Huang, Hailin Wang, and Changhong Zhu

  • Applied Optics Vol. 53, Iss. 19, pp. 4359–4362 (2014)
  • Yanxiong Niu, Caili Wang, Wenwen Liu, Haisha Niu, Bing Xu, and Da Man

Optical Data Storage

  • Applied Optics Vol. 53, Iss. 19, pp. 4136–4140 (2014)
  • Yusuke Saita and Takanori Nomura

Optical Design and Fabrication

  • Applied Optics Vol. 53, Iss. 19, pp. 4266–4274 (2014)
  • Wenlin Liao, Yifan Dai, Xuhui Xie, and Lin Zhou

  • Applied Optics Vol. 53, Iss. 19, pp. 4275–4281 (2014)
  • Wenlin Liao, Yifan Dai, Xuhui Xie, and Lin Zhou

Optical Devices

  • Applied Optics Vol. 53, Iss. 19, pp. 4158–4163 (2014)
  • Kunhua Wen, Yihua Hu, Li Chen, Liang Lei, and Zhen Guo

Physical Optics

  • Applied Optics Vol. 53, Iss. 19, pp. 4172–4179 (2014)
  • Yi Tian, Gang Sun, Hui Yan, Li Zhang, and Zhuo Li

Remote Sensing and Sensors

  • Applied Optics Vol. 53, Iss. 19, pp. 4187–4194 (2014)
  • Gerard van Harten, Frans Snik, Jeroen H. H. Rietjens, J. Martijn Smit, and Christoph U. Keller

Scattering

  • Applied Optics Vol. 53, Iss. 19, pp. 4239–4247 (2014)
  • Grzegorz Swirniak, Grzegorz Glomb, and Janusz Mroczka

Spectroscopy

  • Applied Optics Vol. 53, Iss. 19, pp. 4117–4122 (2014)
  • Sébastien B. Morales, Edouard Pangui, Xavier Landsheere, Ha Tran, and Jean-Michel Hartmann

  • Applied Optics Vol. 53, Iss. 19, pp. 4128–4135 (2014)
  • Yedhu Krishna, Sean O’Byrne, and Joseph John Kurtz

  • Applied Optics Vol. 53, Iss. 19, pp. 4320–4326 (2014)
  • V. K. Saini, P. Kumar, S. K. Dixit, and S. V. Nakhe

Thin Films

  • Applied Optics Vol. 53, Iss. 19, pp. 4211–4215 (2014)
  • Guoying Yan, Zilong Bai, Shufang Wang, Liqing Sun, Jianglong Wang, and Guangsheng Fu

Errata

Physical Optics

  • Applied Optics Vol. 53, Iss. 19, pp. 4264–4265 (2014)
  • Thomas Essinger-Hileman
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