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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 20 — Jul. 10, 2014
  • pp: 4363–4627

Optics InfoBase > Applied Optics > Volume 53 > Issue 20 > Table of Contents

Topics in this Issue

 
  • Diffraction and Gratings
  • Fiber Optics and Optical Communications
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Materials
  • Medical Optics and Biotechnology
  • Microscopy
  • Optical Devices
  • Physical Optics
  • Remote Sensing and Sensors
  • Spectroscopy
  • Thin Films
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Diffraction and Gratings

  • Applied Optics Vol. 53, Iss. 20, pp. 4460–4467 (2014)
  • Victor Dmitriev, Gianni Portela, and Raphael Batista

Fiber Optics and Optical Communications

  • Applied Optics Vol. 53, Iss. 20, pp. 4398–4404 (2014)
  • Chia-Chin Chiang and Chien-Chia Tseng

  • Applied Optics Vol. 53, Iss. 20, pp. 4413–4419 (2014)
  • Erik Lucas, Laurent Lombard, Yves Jaouën, Sylvain Bordais, and Guillaume Canat

  • Applied Optics Vol. 53, Iss. 20, pp. 4519–4523 (2014)
  • Xia Hao, Zhengrong Tong, Junfa Zhao, Ye Cao, and Lan Li

  • Applied Optics Vol. 53, Iss. 20, pp. 4539–4547 (2014)
  • B. Deepan, C. Quan, Y. Wang, and C. J. Tay

Holography

  • Applied Optics Vol. 53, Iss. 20, pp. 4375–4381 (2014)
  • Masanori Takabayashi, Atsushi Okamoto, Taisuke Eto, and Takashi Okamoto

Image Processing

  • Applied Optics Vol. 53, Iss. 20, pp. 4440–4449 (2014)
  • Jaime Zabalza, Jinchang Ren, Jie Ren, Zhe Liu, and Stephen Marshall

  • Applied Optics Vol. 53, Iss. 20, pp. 4503–4508 (2014)
  • Garreth J. Ruane, Prachyathit Kanburapa, Jiaxuan Han, and Grover A. Swartzlander

  • Applied Optics Vol. 53, Iss. 20, pp. 4585–4593 (2014)
  • Yu Lu, Sook Yoon, Shan Juan Xie, Jucheng Yang, Zhihui Wang, and Dong Sun Park

Imaging Systems

  • Applied Optics Vol. 53, Iss. 20, pp. 4431–4439 (2014)
  • S. Padin

  • Applied Optics Vol. 53, Iss. 20, pp. 4483–4492 (2014)
  • Ariel Schwarz, Amir Shemer, and Zeev Zalevsky

  • Applied Optics Vol. 53, Iss. 20, pp. 4548–4554 (2014)
  • Douglas J. Little and Deb M. Kane

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 20, pp. 4363–4374 (2014)
  • Thomas O. H. Charrett, Ian A. Bledowski, Stephen W. James, and Ralph P. Tatam

  • Applied Optics Vol. 53, Iss. 20, pp. 4405–4412 (2014)
  • Hanlin Zhang, Yongjie Ren, Changjie Liu, and Jigui Zhu

  • Applied Optics Vol. 53, Iss. 20, pp. 4468–4474 (2014)
  • Hannes Duncker, Ortwin Hellmig, André Wenzlawski, Alexander Grote, Amir Jones Rafipoor, Mona Rafipoor, Klaus Sengstock, and Patrick Windpassinger

  • Applied Optics Vol. 53, Iss. 20, pp. 4532–4538 (2014)
  • Quandou Wang, Ulf Griesmann, and Johannes A. Soons

  • Applied Optics Vol. 53, Iss. 20, pp. 4604–4610 (2014)
  • Jong-Ahn Kim, Chu-Shik Kang, Tae Bong Eom, Jonghan Jin, Ho Suhng Suh, and Jae Wan Kim

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 20, pp. 4382–4385 (2014)
  • Xiaowei Ma, Shujun Luo, and Daru Chen

  • Applied Optics Vol. 53, Iss. 20, pp. 4555–4564 (2014)
  • Kelly C. Jorge, Rudimar Riva, Nicolau A. S. Rodrigues, João M. S. Sakamoto, and Marcelo G. Destro

  • Applied Optics Vol. 53, Iss. 20, pp. 4611–4615 (2014)
  • Laura Abrardi, Marek A. Gusowski, and Thomas Feurer

Medical Optics and Biotechnology

  • Applied Optics Vol. 53, Iss. 20, pp. 4509–4518 (2014)
  • Hancong Xu, Jinfeng Liu, Yang Li, Yan Yin, Chenxu Zhu, and Hua Lu

  • Applied Optics Vol. 53, Iss. 20, pp. 4580–4584 (2014)
  • Tiziano Binzoni and Fabrizio Martelli

Microscopy

  • Applied Optics Vol. 53, Iss. 20, pp. 4450–4459 (2014)
  • Ki-Chul Kwon, Ji-Seong Jeong, Munkh-Uchral Erdenebat, Young-Tae Lim, Kwan-Hee Yoo, and Nam Kim

Optical Devices

  • Applied Optics Vol. 53, Iss. 20, pp. 4420–4430 (2014)
  • Ivan Moreno, Maximino Avendaño-Alejo, Tonatiuh Saucedo-A, and Alejandra Bugarin

Physical Optics

  • Applied Optics Vol. 53, Iss. 20, pp. 4524–4531 (2014)
  • Roger L. Garay-Avendaño and Michel Zamboni-Rached

  • Applied Optics Vol. 53, Iss. 20, pp. 4616–4627 (2014)
  • Oksana Mys, Myroslav Kostyrko, Mykola Smyk, Oleh Krupych, and Rostyslav Vlokh

Remote Sensing and Sensors

  • Applied Optics Vol. 53, Iss. 20, pp. 4386–4397 (2014)
  • Zhongtao Cheng, Dong Liu, Jing Luo, Yongying Yang, Lin Su, Liming Yang, Hanlu Huang, and Yibing Shen

  • Applied Optics Vol. 53, Iss. 20, pp. 4565–4579 (2014)
  • Visa Korkiakoski, Christoph U. Keller, Niek Doelman, Matthew Kenworthy, Gilles Otten, and Michel Verhaegen

Spectroscopy

  • Applied Optics Vol. 53, Iss. 20, pp. 4475–4480 (2014)
  • Andriy A. Danylov, Alexander R. Light, Jerry Waldman, Neal Erickson, and Xifeng Qian

  • Applied Optics Vol. 53, Iss. 20, pp. 4594–4603 (2014)
  • Sascha Grusche

Thin Films

  • Applied Optics Vol. 53, Iss. 20, pp. 4493–4502 (2014)
  • Laurent Frey, Lilian Masarotto, Patrick Gros D’Aillon, Catherine Pellé, Marilyn Armand, Michel Marty, Clémence Jamin-Mornet, Sandrine Lhostis, and Olivier Le Briz

Errata

Materials

  • Applied Optics Vol. 53, Iss. 20, pp. 4481–4482 (2014)
  • V. Adamiv, I. Teslyuk, Ya. Dyachok, G. Romanyuk, O. Krupych, O. Mys, I. Martynyuk-Lototska, Ya. Burak, and R. Vlokh
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