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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 28 — Oct. 1, 2014
  • pp: 6332–6618

Optics InfoBase > Applied Optics > Volume 53 > Issue 28 > Table of Contents

Topics in this Issue

 
  • Detectors
  • Fiber Optics and Optical Communications
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Integrated Optics
  • Lasers and Laser Optics
  • Materials
  • Nonlinear Optics
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Optoelectronics
  • Remote Sensing and Sensors
  • Scattering
  • Spectroscopy
  • Thin Films
  • X-ray Optics
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Detectors

  • Applied Optics Vol. 53, Iss. 28, pp. 6457–6463 (2014)
  • Tiancheng Gong, Yong Zhu, Wenbin Xie, Ning Wang, Jie Zhang, and Wenjie Ren

Fiber Optics and Optical Communications

  • Applied Optics Vol. 53, Iss. 28, pp. 6382–6388 (2014)
  • Yanhui Qi, Lin Ma, Zexin Kang, Yunlong Bai, Bin Yin, and Shuisheng Jian

  • Applied Optics Vol. 53, Iss. 28, pp. 6414–6421 (2014)
  • Seyyed Esmail Hosseini and Ali Banai

  • Applied Optics Vol. 53, Iss. 28, pp. 6452–6456 (2014)
  • Lei Gao, Tao Zhu, Wei Huang, and Jing Zeng

Geometric Optics

  • Applied Optics Vol. 53, Iss. 28, pp. 6444–6451 (2014)
  • Fei Liu and Yanqiu Li

Holography

  • Applied Optics Vol. 53, Iss. 28, pp. 6591–6597 (2014)
  • A. Yu. Betin, V. I. Bobrinev, S. S. Donchenko, S. B. Odinokov, N. N. Evtikhiev, R. S. Starikov, S. N. Starikov, and E. Yu. Zlokazov

Image Processing

  • Applied Optics Vol. 53, Iss. 28, pp. 6340–6343 (2014)
  • Asaf Ilovitsh and Zeev Zalevsky

  • Applied Optics Vol. 53, Iss. 28, pp. 6435–6443 (2014)
  • Kazuya Nakano, Masafumi Takeda, Hiroyuki Suzuki, and Masahiro Yamaguchi

  • Applied Optics Vol. 53, Iss. 28, pp. 6464–6471 (2014)
  • Kaveh Heidary

  • Applied Optics Vol. 53, Iss. 28, pp. 6472–6481 (2014)
  • Hukum Singh, A. K. Yadav, Sunanda Vashisth, and Kehar Singh

  • Applied Optics Vol. 53, Iss. 28, pp. 6518–6526 (2014)
  • Ying Li, Pengcheng Li, and Qiang Shen

Imaging Systems

  • Applied Optics Vol. 53, Iss. 28, pp. 6389–6398 (2014)
  • Qingchun Lei, Yue Wu, Heng Xiao, and Lin Ma

  • Applied Optics Vol. 53, Iss. 28, pp. 6508–6512 (2014)
  • Daniel Pätz, Tobias Deutschmann, Egbert Oesterschulze, and Stefan Sinzinger

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 28, pp. 6351–6361 (2014)
  • Carlos Toro N., Luis Arias P., Sergio Torres, and Daniel Sbarbaro

  • Applied Optics Vol. 53, Iss. 28, pp. 6482–6493 (2014)
  • Lijun Xu, Lulu Chen, Xiaolu Li, and Tao He

  • Applied Optics Vol. 53, Iss. 28, pp. 6494–6502 (2014)
  • Junjie Wang, Meng Wang, Jian Xu, Li Peng, Minghong Yang, Minghe Xia, and Desheng Jiang

  • Applied Optics Vol. 53, Iss. 28, pp. 6503–6507 (2014)
  • Daniel Schütze, Vitali Müller, and Gerhard Heinzel

  • Applied Optics Vol. 53, Iss. 28, pp. 6605–6611 (2014)
  • Shin-Woong Park, Eunkyong Moon, Hayun Chung, Joon-Yong Lee, Chanyeol Bae, Jin-Woo Kim, and Hwi Kim

  • Applied Optics Vol. 53, Iss. 28, pp. 6612–6618 (2014)
  • M. Taghi Tavassoly and Katayoon Samavati

Integrated Optics

  • Applied Optics Vol. 53, Iss. 28, pp. 6527–6536 (2014)
  • Purnima Sethi and Sukhdev Roy

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 28, pp. 6371–6374 (2014)
  • Chenwei Zhang, Huadong Lu, Qiwei Yin, and Jing Su

  • Applied Optics Vol. 53, Iss. 28, pp. 6409–6413 (2014)
  • Hailong Yu, Rumao Tao, Xiaolin Wang, Pu Zhou, and Jinbao Chen

  • Applied Optics Vol. 53, Iss. 28, pp. 6554–6568 (2014)
  • Wei Shi, Qiang Fang, Xiushan Zhu, R. A. Norwood, and N. Peyghambarian

  • Applied Optics Vol. 53, Iss. 28, pp. 6569–6578 (2014)
  • Huan Huang, Lih-Mei Yang, Shuang Bai, and Jian Liu

Materials

  • Applied Optics Vol. 53, Iss. 28, pp. 6598–6604 (2014)
  • Tibor Gál, Örs Sepsi, Paul A. Medwick, Andrew Wagner, and Pál Koppa

Nonlinear Optics

  • Applied Optics Vol. 53, Iss. 28, pp. 6422–6426 (2014)
  • Q. L. Guo, B. L. Liang, Y. Wang, G. Y. Deng, Y. H. Jiang, S. H. Zhang, G. S. Fu, and P. J. Simmonds

  • Applied Optics Vol. 53, Iss. 28, pp. 6579–6585 (2014)
  • Sean P. Kearney

Optical Design and Fabrication

  • Applied Optics Vol. 53, Iss. 28, pp. 6332–6339 (2014)
  • Xuqing Nie, Shengyi Li, Hao Hu, and Qi Li

Optical Devices

  • Applied Optics Vol. 53, Iss. 28, pp. 6427–6430 (2014)
  • Guofang Fan, Yuan Li, Chunguang Hu, Lihua Lei, Dong Zhao, Hongyu Li, and Zhen Zhen

Optics at Surfaces

  • Applied Optics Vol. 53, Iss. 28, pp. 6431–6434 (2014)
  • Zhongwei Liao, Bingpu Zhou, Yingzhou Huang, Shunbo Li, Shuxia Wang, and Weijia Wen

Optoelectronics

  • Applied Optics Vol. 53, Iss. 28, pp. 6546–6553 (2014)
  • Ahmad Naseri Taheri and Hassan Kaatuzian

Remote Sensing and Sensors

  • Applied Optics Vol. 53, Iss. 28, pp. 6375–6381 (2014)
  • Tao Dongxing, Zhao Huijie, Jia Guorui, and Yuan Yan

  • Applied Optics Vol. 53, Iss. 28, pp. 6586–6590 (2014)
  • Xiaonan Hui, Taihang Ye, Shilie Zheng, Jinhai Zhou, Hao Chi, Xiaofeng Jin, and Xianmin Zhang

Scattering

  • Applied Optics Vol. 53, Iss. 28, pp. 6537–6545 (2014)
  • Marie Lécureux, Stefan Enoch, Carole Deumié, and Gérard Tayeb

Spectroscopy

  • Applied Optics Vol. 53, Iss. 28, pp. 6399–6408 (2014)
  • Hui Geng, Jian-Guo Liu, Yabai He, Yu-Jun Zhang, Zhen-Yu Xu, Jun Ruan, Lu Yao, and Rui-Feng Kan

Thin Films

  • Applied Optics Vol. 53, Iss. 28, pp. 6344–6350 (2014)
  • Yanfei Zhou, Pengfei Zhang, Yonghong He, Zihao Xu, Le Liu, Yanhong Ji, and Hui Ma

  • Applied Optics Vol. 53, Iss. 28, pp. 6513–6517 (2014)
  • Tianyan Yu, Dingquan Liu, and Yang Qin

X-ray Optics

  • Applied Optics Vol. 53, Iss. 28, pp. 6362–6370 (2014)
  • Keliang Liao, Youli Hong, and Weifan Sheng
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