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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 53, Iss. 36 — Dec. 20, 2014
  • pp: 8374–8592

Optics InfoBase > Applied Optics > Volume 53 > Issue 36 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Detectors
  • Fourier Optics and Signal Processing
  • Geometric Optics
  • Holography
  • Image Processing
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Lasers and Laser Optics
  • Microscopy
  • Optical Devices
  • Optics in Computing
  • Ultrafast Optics
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Atmospheric and Oceanic Optics

  • Applied Optics Vol. 53, Iss. 36, pp. 8535–8543 (2014)
  • Monique Walker, Demetrius Venable, and David N. Whiteman

Detectors

  • Applied Optics Vol. 53, Iss. 36, pp. 8410–8423 (2014)
  • Geunsik Lim, Tariq Manzur, and Aravinda Kar

  • Applied Optics Vol. 53, Iss. 36, pp. 8549–8555 (2014)
  • Assaf Levanon, Daniel Rozban, Avihai Aharon (Akram), Natan S. Kopeika, Yitzhak Yitzhaky, and Amir Abramovich

Fourier Optics and Signal Processing

  • Applied Optics Vol. 53, Iss. 36, pp. 8381–8388 (2014)
  • Suchita Lakra and Sanjoy Mandal

Geometric Optics

  • Applied Optics Vol. 53, Iss. 36, pp. 8424–8435 (2014)
  • Jinkai Zhang, Xiaobo Chen, Juntong Xi, and Zhuoqi Wu

  • Applied Optics Vol. 53, Iss. 36, pp. 8436–8443 (2014)
  • João M. S. Sakamoto, Gefeson M. Pacheco, Cláudio Kitano, and Bernhard R. Tittmann

  • Applied Optics Vol. 53, Iss. 36, pp. 8481–8491 (2014)
  • Jui-Wen Pan and Yi-Chin Chen

  • Applied Optics Vol. 53, Iss. 36, pp. 8556–8563 (2014)
  • Jan Koenderink

Holography

  • Applied Optics Vol. 53, Iss. 36, pp. 8456–8462 (2014)
  • Cuiling Meng, Hua Zhao, Tingyu Xue, Jiayin Fu, and Jingwen Zhang

Image Processing

  • Applied Optics Vol. 53, Iss. 36, pp. 8449–8455 (2014)
  • Vasily Ezhov

Imaging Systems

  • Applied Optics Vol. 53, Iss. 36, pp. 8507–8513 (2014)
  • Dong Won Kang, Minwook Kang, and Jae W. Hahn

  • Applied Optics Vol. 53, Iss. 36, pp. 8514–8521 (2014)
  • Alex J. Yuffa, Kristan P. Gurton, and Gorden Videen

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 53, Iss. 36, pp. 8463–8470 (2014)
  • Tomáš Pikálek, Tomáš Fořt, and Zdeněk Buchta

  • Applied Optics Vol. 53, Iss. 36, pp. 8571–8584 (2014)
  • Junqiang Sun and Menghua Wang

Lasers and Laser Optics

  • Applied Optics Vol. 53, Iss. 36, pp. 8444–8448 (2014)
  • Hongmei Zou, He Huang, Shijie Chen, Qing Li, Jian Fu, Feng Lin, and X. Wu

  • Applied Optics Vol. 53, Iss. 36, pp. 8564–8570 (2014)
  • Yingye An, Jianqiu Cao, Zhihe Huang, Shaofeng Guo, Xiaojun Xu, and Jinbao Chen

  • Applied Optics Vol. 53, Iss. 36, pp. 8585–8592 (2014)
  • Paweena U-Thainual, Yi Yang, Hanh N. D. Le, and Do-Hyun Kim

Microscopy

  • Applied Optics Vol. 53, Iss. 36, pp. 8522–8534 (2014)
  • Rory M. Power, Daniel R. Burnham, and Jonathan P. Reid

Optical Devices

  • Applied Optics Vol. 53, Iss. 36, pp. 8374–8380 (2014)
  • Abbas Ghasempour Ardakani

  • Applied Optics Vol. 53, Iss. 36, pp. 8389–8394 (2014)
  • Longhai Lei, Jun Tang, Tianen Zhang, Hao Guo, Yanna Li, Chengfeng Xie, Chenglong Shang, Yu Bi, Wendong Zhang, Chenyang Xue, and Jun Liu

  • Applied Optics Vol. 53, Iss. 36, pp. 8471–8480 (2014)
  • Casey Douglas, Emek Köse, Nora Stack, and Caroline VanBlargan

  • Applied Optics Vol. 53, Iss. 36, pp. 8492–8498 (2014)
  • Simin Wang, Xing Chen, Mingxiang Chen, Huai Zheng, Hongru Yang, and Sheng Liu

  • Applied Optics Vol. 53, Iss. 36, pp. 8499–8506 (2014)
  • Jeakwon Ko, Kwang Jo Lee, and Byoung Yoon Kim

Optics in Computing

  • Applied Optics Vol. 53, Iss. 36, pp. 8400–8409 (2014)
  • Dilip Kumar Gayen, Tanay Chattopadhyay, Arunava Bhattacharyya, Saikat Basak, and Dipanti Dey

Ultrafast Optics

  • Applied Optics Vol. 53, Iss. 36, pp. 8395–8399 (2014)
  • Xiaofang Wang, Lihe Yan, Jinhai Si, Shigeki Matsuo, Huailiang Xu, and Xun Hou

  • Applied Optics Vol. 53, Iss. 36, pp. 8544–8548 (2014)
  • Jing Gao, Tingwu Ge, Wuyi Li, Hongshen Kuang, and Zhiyong Wang
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