Continuous frequency scanning of a stabilized single-mode Q-switched Nd³⁺: glass laser

• Abstract
•  | Full Text: PDF (461 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 141–142 (1979)
• J. Morellec, D. Normand, and G. Petite

Laser resonators folded by diffraction gratings: errata

• Abstract
•  | Full Text: PDF (645 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 142–143 (1979)
• S. O. Kanstad and G. Wang

Nearly degenerate four-wave mixing applied to optical filters

• Abstract
•  | Full Text: PDF (791 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 143–145 (1979)
• Joseph Nilsen and Amnon Yariv

Mode conversion in a thin film waveguide by a two-stage coupling process

• Abstract
•  | Full Text: PDF (712 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 145–146 (1979)
• G. A. Teh and G. I. Stegeman

Optical computation using residue arithmetic

• Abstract
•  | Full Text: PDF (1750 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 149–162 (1979)
• Alan Huang, Yoshito Tsunoda, Joseph W. Goodman, and Satoshi Ishihara

Optical residue arithmetic: a correlation approach

• Abstract
•  | Full Text: PDF (1274 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 163–171 (1979)
• Demetri Psaltis and David Casasent

Real-time tracking of moving objects by optical correlation

• Abstract
•  | Full Text: PDF (635 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 172–174 (1979)
• Aaron D. Gara

Measurement of the gain and refraction effects in a solid state laser

• Abstract
•  | Full Text: PDF (308 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 175–178 (1979)
• J. Fesquet, H. Irla, and J. Roig

Active cavity radiometer type IV

• Abstract
•  | Full Text: PDF (1280 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 179–188 (1979)
• Richard C. Willson

Approximate analytic solutions for the optical pumping of fluorescent dyes

• Abstract
•  | Full Text: PDF (372 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 189–192 (1979)
• Nabil M. Lawandy

Automatic phase-matched frequency-doubling system for the 240–350-nm region

• Abstract
•  | Full Text: PDF (447 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 193–196 (1979)
• Seishiro Saikan, Donald Ouw, and Fritz P. Schäfer

Threaded article parameter measurement by spatial spectra analysis

• Abstract
•  | Full Text: PDF (456 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 197–200 (1979)
• R. M. Bytchkov, V. P. Koronkevitch, and Yu. V. Chugui

Strain induced anisotropy in As₂S₃, As₂Se₃, and ZnSe films on KCI substrates via 10.6-µm and 0.6328-µm ellipsometer measurements and 0.6328-µm reflector measurements

• Abstract
•  | Full Text: PDF (1340 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 201–211 (1979)
• M. E. Pedinoff and O. M. Stafsudd

Multiwavelength rainbow holographic interferometry

• Abstract
•  | Full Text: PDF (1703 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 212–218 (1979)
• F. T. S. Yu, Anthony Tai, and Hsuan Chen

Two-frequency laser interferometer for small displacement measurements in a low frequency range

• Abstract
•  | Full Text: PDF (796 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 219–224 (1979)
• Yoshihiro Ohtsuka and Kazuyoshi Itoh

Absolute distance measurements by CO₂ laser multiwavelength interferometry

• Abstract
•  | Full Text: PDF (318 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 225–227 (1979)
• G. L. Bourdet and A. G. Orszag

Exposure time for space-borne ir spatial interferometer

• Abstract
•  | Full Text: PDF (571 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 228–232 (1979)
• Robert H. Wolfe, Jr. and Richard S. Simpson

Transient deformation of liquid surfaces by laser-induced thermocapillarity

• Abstract
•  | Full Text: PDF (314 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 233–235 (1979)
• G. Da Costa and J. Calatroni

Assessment of surface roughness by x-ray scattering and differential interference contrast microscopy

• Abstract
•  | Full Text: PDF (2267 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 236–242 (1979)
• P. A. J. de Korte and R. Lainé

Optical remote sensing of atmospheric turbulence: a comparison with simultaneous thermal measurements

• Abstract
•  | Full Text: PDF (465 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 243–247 (1979)
• J. Vernin, R. Barletti, G. Ceppatelli, L. Paternò, A. Righini, and N. Speroni

Scanning-electron-microscope-written gratings in chalcogenide films for optical integrated circuits

• Abstract
•  | Full Text: PDF (770 KB)

• Applied Optics, Vol. 18, Iss. 2, pp. 248–252 (1979)
• Y. Handa, T. Suhara, H. Nishihara, and J. Koyama