PATENTS

• Abstract
•  | Full Text: PDF (764 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2206– (1993)

Temperature and strain sensitivity measurements of high-birefringent polarization-maintaining fibers

• Abstract
•  | Full Text: PDF (617 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2213–2218 (1993)
• Feng Zhang and John W. Y. Lit

Double-slit camera

• Abstract
•  | Full Text: PDF (343 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2219–2221 (1993)
• H. J. Rabal and G. M. Bilmes

Liquid-crystal phase modulator for unpolarized light

• Abstract
•  | Full Text: PDF (305 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2222–2223 (1993)
• Gordon D. Love

Index of refraction measurement on sapphire at low temperatures and visible wavelengths

• Abstract
•  | Full Text: PDF (1067 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2224–2234 (1993)
• A. C. DeFranzo and B. G. Pazol

Generalization of the Ronchi, sinusoidal, and triangular rulings for Gaussian-laser-beam-diameter measurements

• Abstract
•  | Full Text: PDF (735 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2235–2242 (1993)
• A. K. Cherri, A. A. S. Awwal, and M. A. Karim

Tailored edge-ray concentrators as ideal second stages for Fresnel reflectors

• Abstract
•  | Full Text: PDF (1111 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2243–2251 (1993)
• J. M. Gordon and Harald Ries

Gaussian-to-Bessel beam transformation using a split refracting system

• Abstract
•  | Full Text: PDF (476 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2252–2256 (1993)
• Khan M. ftekharuddin, Abdul A. S. Awwal, and Mohammad A. Karim

Effect of axial pinhole displacement in confocal microscopes

• Abstract
•  | Full Text: PDF (596 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2257–2261 (1993)
• Shigeharu Kimura and Tony Wilson

Optical absorption and photoemission in semitransparent and opaque Cs₃Sb photocathodes

• Abstract
•  | Full Text: PDF (322 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2262–2265 (1993)
• Stuart M. Johnson, Jr.

Light scattering by red blood cells in ektacytometry: Fraunhofer versus anomalous diffraction

• Abstract
•  | Full Text: PDF (932 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2266–2272 (1993)
• Geert J. Streekstra, Alfons G. Hoekstra, Evert-Jan Nijhof, and Robert M. Heethaar

Intensity and resolution at the diffraction focus of optical systems with rotationally symmetric aberration functions: erratum

• Abstract
•  | Full Text: PDF (34 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2273–2273 (1993)
• Claudio Rivolta

Stepwise interferometric method of measuring the refractive index of liquid samples

• Abstract
•  | Full Text: PDF (553 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2274–2277 (1993)
• Tianchu Li and Xiaodi Tan

Electronic speckle photography: analysis of an algorithm giving the displacement with subpixel accuracy

• Abstract
•  | Full Text: PDF (954 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2278–2284 (1993)
• M. Sjödahl and L. R. Benckert

Interference patterns generated by a plane-parallel plate

• Abstract
•  | Full Text: PDF (879 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2285–2288 (1993)
• Z. S. Hegedus, Z. Zelenka, and G. Gardner

Efficient suppression of thermally induced nonreciprocity in fiber-optic Sagnac interferometers with novel double-layer winding

• Abstract
•  | Full Text: PDF (334 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2289–2291 (1993)
• Miroslav Chomát

Automatic interference method for measuring transparent film thickness

• Abstract
•  | Full Text: PDF (342 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2292–2294 (1993)
• A. González-Cano and E. Bernabáu

Athermalization of a single-component lens with diffractive optics

• Abstract
•  | Full Text: PDF (982 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2295–2302 (1993)
• Carmiña Londoño, William T. Plummer, and Peter P. Clark

Nonimaging reflectors for efficient uniform illumination: errata

• Abstract
•  | Full Text: PDF (46 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2303–2303 (1993)
• J. M. Gordon, Peter Kashin, and Ari Rabl

Influence of vibration on microdiameter measurements using a laser-charge-coupled device system

• Abstract
•  | Full Text: PDF (841 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2304–2311 (1993)
• Dexiu Shi, Xiaozheng Xing, and Myron L. Wolbarsht

Length measurement and stabilization of optical substrates

• Abstract
•  | Full Text: PDF (407 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2312–2314 (1993)
• Mark A. Linne

High-precision detection method for the reference position in an optical encoder

• Abstract
•  | Full Text: PDF (753 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2315–2319 (1993)
• Jun Akedo, Yoshiaki Kato, and Hiroshi Kobayashi

Velocity sensing by illumination with a laser-beam pattern

• Abstract
•  | Full Text: PDF (515 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2320–2322 (1993)
• Shu Wing Li and Tadashi Aruga

Inexpensive range camera operating at video speed

• Abstract
•  | Full Text: PDF (1323 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2323–2330 (1993)
• J. Kramer, P. Seitz, and H. Baltes

Photogeneration of refractive-index patterns in doped polyimide films

• Abstract
•  | Full Text: PDF (1222 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2331–2338 (1993)
• K. K. Chakravorty

Ellipsometry algorithm for absorbing films

• Abstract
•  | Full Text: PDF (804 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2339–2344 (1993)
• Frank K. Urban III

Optical properties of discontinuous copper films

• Abstract
•  | Full Text: PDF (1377 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2345–2350 (1993)
• Ewa Dobierzewska-Mozrzymas and Piotr Bieganski

Deposition error compensation for optical multilayer coatings. II. Experimental results—sputtering system

• Abstract
•  | Full Text: PDF (1455 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2351–2360 (1993)
• Brian T. Sullivan and J. A. Dobrowolski

Multilayer interference filters for the far-infrared and submillimeter regions

• Abstract
•  | Full Text: PDF (1125 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2361–2370 (1993)
• Jianxin Shao and J. A. Dobrowolski

Photographic response to x-ray irradiation. I: Estimation of the photographic error statistic and development of analytic density-intensity equations

• Abstract
•  | Full Text: PDF (2900 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2371–2397 (1993)
• C. T. Chantler

Photographic response to x-ray irradiation. II: Correlated models

• Abstract
•  | Full Text: PDF (1521 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2398–2410 (1993)
• C. T. Chantler

Photographic response to x-ray irradiation. III: Photographic linearization of beam-foil spectra

• Abstract
•  | Full Text: PDF (1782 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2411–2421 (1993)
• C. T. Chantler, J. D. Silver, and D. D. Dietrich

Dual-waveband operation of a multilayer-coated diffraction grating in the soft x-ray range at near-normal incidence

• Abstract
•  | Full Text: PDF (419 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2422–2425 (1993)
• M. P. Kowalski, J. F. Seely, W. R. Hunter, J. C. Rife, T. W. Barbee, Jr., G. E. Holland, C. N. Boyer, C. M. Brown, and R. G. Cruddace

Surface plasmon resonance microscopy: improvement of the resolution by rotation of the object

• Abstract
•  | Full Text: PDF (1409 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2426–2430 (1993)
• Helene E. de Bruijn, Rob P. H. Kooyman, and Jan Greve

Zernike-based matrix model of deformable mirrors: optimization of aperture size

• Abstract
•  | Full Text: PDF (1115 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2431–2438 (1993)
• Javier Alda and Glenn D. Boreman

Pulsed photothermal radiometry of port-wine-stain lesions

• Abstract
•  | Full Text: PDF (1139 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2439–2446 (1993)
• Steven L. Jacques, J. Stuart Nelson, William H. Wright, and Thomas E. Milner

Role of tissue optics and pulse duration on tissue effects during high-power laser irradiation

• Abstract
•  | Full Text: PDF (1133 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2447–2454 (1993)
• Steven L. Jacques

Acousto-optic multifrequency modulators: reduction of the phase-grating, intermodulation products

• Abstract
•  | Full Text: PDF (685 KB)

• Applied Optics, Vol. 32, Iss. 13, pp. 2455–2460 (1993)
• M. G. Gazalet, J. C. Kastelik, C. Bruneel, O. Bazzi, and E. Bridoux