Endoscope with optical sectioning capability

• Abstract
•  | Full Text: PDF (410 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2888–2890 (1993)
• L. Giniunas, R. Juškaitis, and S. V. Shatalin

Multimode analysis of compound parabolic concentrators with flat absorber

• Abstract
•  | Full Text: PDF (904 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2891–2900 (1993)
• Naum Fraidenraich and Ignacio H. Salcedo

Surface-plasmon excitation using a polarization-preserving optical fiber and an index-matching fluid optical cell

• Abstract
•  | Full Text: PDF (738 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2901–2906 (1993)
• J. D. Richards, R. Garabedian, C. Gonzalez, A. Knoesen, R. L. Smith, R. Spencer, and S. D. Collins

400-ps time resolution with a passively quenched avalanche photodiode

• Abstract
•  | Full Text: PDF (441 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2907–2910 (1993)
• T. P. Grayson and L. J. Wang

Diffraction characteristics of surface-relief gratings

• Abstract
•  | Full Text: PDF (751 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2911–2917 (1993)
• Mool C. Gupta and S. T. Peng

Laser beam collimation using Talbot interferometry

• Abstract
•  | Full Text: PDF (536 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2918–2920 (1993)
• A. R. Ganesan and Putcha Venkateswarlu

Reconstruction of refractive index fields by using relative fringe data

• Abstract
•  | Full Text: PDF (725 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2921–2926 (1993)
• Yan Zhang and Gary A. Ruff

Measuring humidity with planar polyimide light guides

• Abstract
•  | Full Text: PDF (992 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2927–2935 (1993)
• H. Franke, D. Wagner, T. Kleckers, R. Reuter, H. V. Rohitkumar, and B. A. Blech

National Institute of Standards and Technology detector-based photometric scale

• Abstract
•  | Full Text: PDF (1725 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2936–2948 (1993)
• C. L. Cromer, G. Eppeldauer, J. E. Hardis, T. C. Larason, and A. C. Parr

GEMINI spectrograph optics

• Abstract
•  | Full Text: PDF (736 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2949–2956 (1993)
• Ian Powell

Focused-beam attenuated total-reflection technique on absorptive film in Kretschmann’s configuration

• Abstract
•  | Full Text: PDF (1110 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2957–2962 (1993)
• Keh-su Chang, Chien Chou, and Chin-hwa Lin

Resolution of two problems in the Fourier analysis of thin films

• Abstract
•  | Full Text: PDF (598 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2963–2968 (1993)
• Ronald R. Willey

Design of optical coatings for two widely separated spectral regions

• Abstract
•  | Full Text: PDF (806 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2969–2975 (1993)
• Li Li and J. A. Dobrowolski

Technique for measuring the reflectance of irregular, submillimeter-sized samples

• Abstract
•  | Full Text: PDF (1193 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2976–2983 (1993)
• Christopher C. Homes, M. Reedyk, D. A. Cradles, and T. Timusk

Comparison of the smoothing and shaping of optics by plasma-assisted chemical etching and ion milling using the surface evolution theory

• Abstract
•  | Full Text: PDF (1878 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2984–2991 (1993)
• C. B. Zarowin

Combined approach to the Hubble Space Telescope wave-front distortion analysis

• Abstract
•  | Full Text: PDF (2871 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 2992–3008 (1993)
• Claude Roddier and François Roddier

Diffuser speckle model: application to multiple moving diffusers

• Abstract
•  | Full Text: PDF (759 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 3009–3014 (1993)
• William N. Partlo and William G. Oldham

Optimum color filters for CCD digital cameras

• Abstract
•  | Full Text: PDF (1285 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 3015–3023 (1993)
• Kai Engelhardt and Peter Seitz

Analytical modeling of the interfacial shearing stress in dual-coated optical fiber specimens subjected to tension

• Abstract
•  | Full Text: PDF (1120 KB)

• Applied Optics, Vol. 32, Iss. 16, pp. 3024–3034 (1993)
• E. Suhir