Millimeter–submillimeter wavelength filter system

Lyman A. Page, Edward S. Cheng, Boris Golubovic, Joshua Gundersen, and Stephan S. Meyer

Appl. Opt. 33(1), 11-23 (1994)  View: HTML | PDF

Phase-shifting errors in interferometric tests with high-numerical-aperture reference surfaces

Katherine Creath and P. Hariharan

Appl. Opt. 33(1), 24-25 (1994)  View: HTML | PDF

Infrared absorber for ferroelectric detectors

Vincent T. Bly and J. Thomas Cox

Appl. Opt. 33(1), 26-30 (1994)  View: HTML | PDF

Four-beam laser interferometry for three-dimensional microscopic coordinate measurement

Osamu Nakamura and Mitsuo Goto

Appl. Opt. 33(1), 31-36 (1994)  View: HTML | PDF

Two-beam prism interferometer for noise-free fringe generation

Hiroyuki Ichikawa

Appl. Opt. 33(1), 37-38 (1994)  View: HTML | PDF

Far-infrared bandpass filters from perforated metal screens

P. G. Huggard, M. Meyringer, A. Schilz, K. Goller, and W. Prettl

Appl. Opt. 33(1), 39-41 (1994)  View: HTML | PDF

Ray matrices and double-grating imaging

Feihong Yu, Liren Liu, and Jeffrey A. Davis

Appl. Opt. 33(1), 42-49 (1994)  View: HTML | PDF

Evaluation of refractive-index and material dispersion in fluoride glasses

Lipeng Zhang, Fuxi Gan, and Paul Wang

Appl. Opt. 33(1), 50-56 (1994)  View: HTML | PDF

Far-infrared spectra of magnesium oxide

Xavier Gerbaux, Armand Hadni, Masato Tazawa, and J. C. Villegier

Appl. Opt. 33(1), 57-59 (1994)  View: HTML | PDF

Dynamic equation for the polarization state in inhomogeneous anisotropic media

Claire Gu and Pochi Yeh

Appl. Opt. 33(1), 60-63 (1994)  View: HTML | PDF

Nonuniform temperature distribution monitoring with an IR fiber-optic radiometer

Edward Belotserkovsky, Albert Zur, and Abraham Katzir

Appl. Opt. 33(1), 64-67 (1994)  View: HTML | PDF

High-current hollow-cathode source as a radiant intensity standard in the 40–125-nm wavelength range

Jörg Hollandt, Michael Kühne, and Burkhard Wende

Appl. Opt. 33(1), 68-74 (1994)  View: HTML | PDF

Evaluation of a Hadamard-coded photodiode-array spectrometer under low illumination

Joseph L. Robichaud, Wallace K. Wong, and Roger A. Van Tassel

Appl. Opt. 33(1), 75-81 (1994)  View: HTML | PDF

Absolute brightness of laser plasmas in the soft-x-ray emission band

F. Bijkerk, E. Louis, G. E. van Dorssen, A. P. Shevelko, and A. A. Vasilyev

Appl. Opt. 33(1), 82-88 (1994)  View: HTML | PDF

Float-polishing process and analysis of float-polished quartz

S. F. Soares, D. R. Baselt, J. P. Black, K. C. Jungling, and W. K. Stowell

Appl. Opt. 33(1), 89-95 (1994)  View: HTML | PDF

Fabrication and evaluation of an etched infrared diffraction grating

U. U. Graf, D. T. Jaffe, E. J. Kim, J. H. Lacy, H. Ling, J. T. Moore, and G. Rebeiz

Appl. Opt. 33(1), 96-102 (1994)  View: HTML | PDF

Proximity-compensated blazed transmission grating manufacture with direct-writing, electron-beam lithography

M. Ekberg, F. Nikolajeff, M. Larsson, and S. Hård

Appl. Opt. 33(1), 103-107 (1994)  View: HTML | PDF

Molded-glass optical element for focusing servos

Yasuhiro Tanaka, Masaaki Sunohara, Jun Murata, Tohru Nakamura, and Hideki Aikoh

Appl. Opt. 33(1), 108-112 (1994)  View: HTML | PDF

Nanometer-resolution distance measurement with a noninterferometric method

Kung-Li Deng and Jyhpyng Wang

Appl. Opt. 33(1), 113-116 (1994)  View: HTML | PDF

Absorption measurements of mixed silver halide crystals and fibers by laser calorimetry

D. Bunimovich, L. Nagli, and A. Katzir

Appl. Opt. 33(1), 117-119 (1994)  View: HTML | PDF

Automatic north sensor using a fiber-optic gyroscope

Tomohiro Tanaka, Yuichi Igarashi, Makoto Nara, and Toshihiko Yoshino

Appl. Opt. 33(1), 120-123 (1994)  View: HTML | PDF

Analysis of dispersion effects for white-light interferometric fiber-optic sensors

Waclaw Urbanczyk and Wojtek J. Bock

Appl. Opt. 33(1), 124-129 (1994)  View: HTML | PDF

Determination of the absolute order of shadow moiré fringes by using two differently colored light sources

Keun Cheol Yuk, Jae Heung Jo, and Soo Chang

Appl. Opt. 33(1), 130-132 (1994)  View: HTML | PDF