1 April 2000, Volume 39, Issue 10, pp. 1469-1667  
30 articles

Low sideband guided-mode resonant filter

Appl. Opt. 39(10), 1469-1473 (2000)  View: HTML | PDF

Design for an aberration-corrected concave grating for a mid-infrared long-slit spectrometer

Appl. Opt. 39(10), 1474-1479 (2000)  View: HTML | PDF

Speckle imaging and hidden phase

Appl. Opt. 39(10), 1480-1485 (2000)  View: HTML | PDF

Fabrication of thin-film micropolarizer arrays for visible imaging polarimetry

Appl. Opt. 39(10), 1486-1492 (2000)  View: HTML | PDF

Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings

Appl. Opt. 39(10), 1493-1499 (2000)  View: HTML | PDF

Sampling period criterion in a scanning-beam technique

Appl. Opt. 39(10), 1500-1504 (2000)  View: HTML | PDF

Position and displacement sensing with Shack–Hartmann wave-front sensors

Appl. Opt. 39(10), 1511-1520 (2000)  View: HTML | PDF

High-precision velocimetry: optimization of a Fabry–Perot interferometer

Appl. Opt. 39(10), 1521-1526 (2000)  View: HTML | PDF

Diffractive grazing-incidence interferometer

Appl. Opt. 39(10), 1527-1530 (2000)  View: HTML | PDF

Use of radiation and hybrid modes to increase the accuracy in the determination of the refractive indices of rutile

Appl. Opt. 39(10), 1531-1536 (2000)  View: HTML | PDF

Optical properties of hot-pressed B4C in the extreme ultraviolet

Appl. Opt. 39(10), 1537-1540 (2000)  View: HTML | PDF

Grinding process for beveling and lapping operations in lens manufacturing

Appl. Opt. 39(10), 1541-1548 (2000)  View: HTML | PDF

Two-dimensional polarization encoding with a phase-only liquid-crystal spatial light modulator

Appl. Opt. 39(10), 1549-1554 (2000)  View: HTML | PDF

Fabrication of hollow waveguides for CO2 lasers

Appl. Opt. 39(10), 1555-1560 (2000)  View: HTML | PDF

Slope distribution of a rough surface measured by transmission scattering and polarization

Appl. Opt. 39(10), 1561-1569 (2000)  View: HTML | PDF

Refractive-index and element-spacing effects on the spectral behavior of infrared frequency-selective surfaces

Appl. Opt. 39(10), 1570-1574 (2000)  View: HTML | PDF

Monte Carlo simulations of the diffuse backscattering Mueller matrix for highly scattering media

Appl. Opt. 39(10), 1580-1588 (2000)  View: HTML | PDF

Defect formation in hafnium dioxide thin films

Appl. Opt. 39(10), 1589-1599 (2000)  View: HTML | PDF

On the etalon effect generated by a Pockels cell with high-quality antireflection coatings

Appl. Opt. 39(10), 1600-1601 (2000)  View: HTML | PDF

Correction masks for thickness uniformity in large-area thin films

Appl. Opt. 39(10), 1602-1610 (2000)  View: HTML | PDF

Correlation between optical path modulations and transmittance spectra of a-Si:H thin films

Appl. Opt. 39(10), 1611-1616 (2000)  View: HTML | PDF

Mo/Si and Mo/Be multilayer thin films on Zerodur substrates for extreme-ultraviolet lithography

Appl. Opt. 39(10), 1617-1625 (2000)  View: HTML | PDF

Relation between coupled-mode theory and equivalent layers for multilayer interference coatings

Appl. Opt. 39(10), 1626-1632 (2000)  View: HTML | PDF

X-ray interferometry of surfaces with Fresnel mirrors

Appl. Opt. 39(10), 1633-1636 (2000)  View: HTML | PDF

Optimum modulation and demodulation matrices for solar polarimetry

Appl. Opt. 39(10), 1637-1642 (2000)  View: HTML | PDF

Polarization effects in 4Pi confocal microscopy studied with water-immersion lenses

Appl. Opt. 39(10), 1652-1658 (2000)  View: HTML | PDF

Chemometric analysis of frequency-domain photon migration data: quantitative measurements of optical properties and chromophore concentrations in multicomponent turbid media

Appl. Opt. 39(10), 1659-1667 (2000)  View: HTML | PDF