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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 21 — Jul. 20, 2002
  • pp: 4209–4432

Optics InfoBase > Applied Optics > Volume 41 > Issue 21 > Table of Contents

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  • Applied Optics, Vol. 41, Iss. 21, pp. 4209–4219 (2002)
  • Bormin Huang, William L. Smith, Hung-Lung Huang, and Harold M. Woolf

  • Applied Optics, Vol. 41, Iss. 21, pp. 4220–4233 (2002)
  • Charles L. Gallegos and Patrick J. Neale

  • Applied Optics, Vol. 41, Iss. 21, pp. 4234–4244 (2002)
  • Sergey Oshchepkov, Yasuhiro Sasano, and Tatsuya Yokota

  • Applied Optics, Vol. 41, Iss. 21, pp. 4245–4257 (2002)
  • Vincent Noel, Helene Chepfer, Guy Ledanois, Arnaud Delaval, and Pierre H. Flamant

  • Applied Optics, Vol. 41, Iss. 21, pp. 4258–4266 (2002)
  • Lee E. Estes and Gilbert Fain

  • Applied Optics, Vol. 41, Iss. 21, pp. 4267–4272 (2002)
  • Julie Reppel and Zeyad T. Alwahabi

  • Applied Optics, Vol. 41, Iss. 21, pp. 4273–4277 (2002)
  • Martin Huber, Mario Blumthaler, Josef Schreder, Alkis Bais, and Chrysanthi Topaloglou

  • Applied Optics, Vol. 41, Iss. 21, pp. 4278–4282 (2002)
  • Julian Gröbner, Diana Rembges, Alkiviadis F. Bais, Mario Blumthaler, Thierry Cabot, Weine Josefsson, Tapani Koskela, Trond M. Thorseth, Ann R. Webb, and Ulf Wester

  • Applied Optics, Vol. 41, Iss. 21, pp. 4283–4306 (2002)
  • John P. Doyle and Giuseppe Zibordi

  • Applied Optics, Vol. 41, Iss. 21, pp. 4307–4313 (2002)
  • William C. Snyder

  • Applied Optics, Vol. 41, Iss. 21, pp. 4314–4317 (2002)
  • Jennifer E. Logan, Peter G. Halverson, Martin W. Regehr, and Robert E. Spero

  • Applied Optics, Vol. 41, Iss. 21, pp. 4318–4324 (2002)
  • Yoshihisa Yamaoka, Kaoru Minoshima, and Hirokazu Matsumoto

  • Applied Optics, Vol. 41, Iss. 21, pp. 4325–4330 (2002)
  • Lasse Leick, Anders Harpøth, and Mikael Svalgaard

  • Applied Optics, Vol. 41, Iss. 21, pp. 4331–4335 (2002)
  • S. Maile Giffin, Glenn W. Baxter, Iain T. McKinnie, and Valerii V. Ter-Mikirtychev

  • Applied Optics, Vol. 41, Iss. 21, pp. 4336–4340 (2002)
  • Yangjian Cai and Qiang Lin

  • Applied Optics, Vol. 41, Iss. 21, pp. 4341–4346 (2002)
  • Chandler J. Kennedy

  • Applied Optics, Vol. 41, Iss. 21, pp. 4347–4355 (2002)
  • Jean-François Lepage and Nathalie McCarthy

  • Applied Optics, Vol. 41, Iss. 21, pp. 4356–4359 (2002)
  • Alphan Sennaroglu

  • Applied Optics, Vol. 41, Iss. 21, pp. 4360–4364 (2002)
  • Matthias Will, Stefan Nolte, Boris N. Chichkov, and Andreas Tünnermann

  • Applied Optics, Vol. 41, Iss. 21, pp. 4365–4376 (2002)
  • Adrian Dragonmir, John G. McInerney, and David N. Nikogosyan

  • Applied Optics, Vol. 41, Iss. 21, pp. 4377–4384 (2002)
  • Johannes A. L’huillier, Gunter Bitz, Volker Wesemann, Patric von Loewis of Menar, Richard Wallenstein, Annette Borsutzky, Lothar Ackermann, Klaus Dupré, Daniel Rytz, and Sophie Vernay

  • Applied Optics, Vol. 41, Iss. 21, pp. 4385–4389 (2002)
  • Rena J. Kasumova

  • Applied Optics, Vol. 41, Iss. 21, pp. 4390–4393 (2002)
  • Vincent Boucher and Xuan Nguyen-Phu

  • Applied Optics, Vol. 41, Iss. 21, pp. 4394–4399 (2002)
  • Tomoyuki Kato, Shuichi Suzuki, Yasuo Kokubun, and Sai Tak Chu

  • Applied Optics, Vol. 41, Iss. 21, pp. 4400–4410 (2002)
  • Xinzhao Chu, Weilin Pan, George C. Papen, Chester S. Gardner, and Jerry A. Gelbwachs

  • Applied Optics, Vol. 41, Iss. 21, pp. 4411–4415 (2002)
  • Christopher D. Brewer, Peter E. Powers, Sean M. Kirkpatrick, and Edward A. Watson

  • Applied Optics, Vol. 41, Iss. 21, pp. 4416–4420 (2002)
  • Sanna Kaasalainen, Jukka Piironen, Karri Muinonen, Hannu Karttunen, and Jouni Peltoniemi

  • Applied Optics, Vol. 41, Iss. 21, pp. 4421–4431 (2002)
  • R. Patrick Earhart and Terry E. Parker

  • Applied Optics, Vol. 41, Iss. 21, pp. 4432–4432 (2002)
  • Steven C. Hill, Ronald G. Pinnick, Stanley Niles, Nicholas F. Fell, Yong-Le Pan, Jerold Bottiger, Burt V. Bronk, Stephen Holler, and Richard K. Chang
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