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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 3 — Jan. 20, 2002
  • pp: 401–578

Optics InfoBase > Applied Optics > Volume 41 > Issue 3 > Table of Contents

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  • Applied Optics, Vol. 41, Iss. 3, pp. 401–406 (2002)
  • Kwi Joo Lee, Youngsik Park, Alexey Bunkin, Raul Nunes, Serguei Pershin, and Konstantin Voliak

  • Applied Optics, Vol. 41, Iss. 3, pp. 407–411 (2002)
  • Ahmed M. Farah, Demetrius D. Venable, Arthur N. Thorpe, Frederick Marsh, and William S. Heaps

  • Applied Optics, Vol. 41, Iss. 3, pp. 412–423 (2002)
  • Banghua Yan, Knut Stamnes, Wei Li, Bingquan Chen, Jakob J. Stamnes, and Si-Chee Tsay

  • Applied Optics, Vol. 41, Iss. 3, pp. 424–433 (2002)
  • Georges Durry, Théodore Danguy, and Ivan Pouchet

  • Applied Optics, Vol. 41, Iss. 3, pp. 434–436 (2002)
  • Petter Weibring, Thomas Johansson, Hans Edner, Sune Svanberg, Barbro Sundnér, Valentina Raimondi, Giovanna Cecchi, and Luca Pantani

  • Applied Optics, Vol. 41, Iss. 3, pp. 437–441 (2002)
  • Chris Lawrence, Peter Vukusic, and Roy Sambles

  • Applied Optics, Vol. 41, Iss. 3, pp. 442–445 (2002)
  • Yuji Matsuura, Goro Takada, Takashi Yamamoto, Yi-Wei Shi, and Mitsunobu Miyagi

  • Applied Optics, Vol. 41, Iss. 3, pp. 446–452 (2002)
  • Jason J. Nikkari, Joanna M. Di Iorio, and Murray J. Thomson

  • Applied Optics, Vol. 41, Iss. 3, pp. 453–458 (2002)
  • Jinan Xia and Min Hee Lee

  • Applied Optics, Vol. 41, Iss. 3, pp. 459–463 (2002)
  • Ulrich Roth and Jürg E. Balmer

  • Applied Optics, Vol. 41, Iss. 3, pp. 464–469 (2002)
  • Ulrich Roth, Michael Tröbs, Thomas Graf, Jürg E. Balmer, and Heinz P. Weber

  • Applied Optics, Vol. 41, Iss. 3, pp. 470–474 (2002)
  • Heidrun Schmitzer, Hans-Peter Wagner, Wolfgang Dultz, and Michael Kühnelt

  • Applied Optics, Vol. 41, Iss. 3, pp. 475–482 (2002)
  • Jing-yuan Zhang, Yufei Kong, Zuyan Xu, and Dezhong Shen

  • Applied Optics, Vol. 41, Iss. 3, pp. 483–492 (2002)
  • Efim Khazanov, Nicolay Andreev, Oleg Palashov, Anatoly Poteomkin, Alexander Sergeev, Oliver Mehl, and David H. Reitze

  • Applied Optics, Vol. 41, Iss. 3, pp. 493–502 (2002)
  • Michaël Sicard, Patrick Chazette, Jacques Pelon, Jae Gwang Won, and Soon-Chang Yoon

  • Applied Optics, Vol. 41, Iss. 3, pp. 503–510 (2002)
  • Didier Bruneau

  • Applied Optics, Vol. 41, Iss. 3, pp. 511–514 (2002)
  • Ulla Wandinger and Albert Ansmann

  • Applied Optics, Vol. 41, Iss. 3, pp. 515–523 (2002)
  • Dave L. Smith, Chris T. Mutlow, and C. R. Nagaraja Rao

  • Applied Optics, Vol. 41, Iss. 3, pp. 524–531 (2002)
  • Takashi Fujii, Tetsuo Fukuchi, Nianwen Cao, Koshichi Nemoto, and Nobuo Takeuchi

  • Applied Optics, Vol. 41, Iss. 3, pp. 532–542 (2002)
  • Kevin D. Ridley, Stephen M. Watson, Eric Jakeman, and Michael Harris

  • Applied Optics, Vol. 41, Iss. 3, pp. 543–559 (2002)
  • Gábor Horváth, András Barta, József Gál, Bence Suhai, and Ottó Haiman

  • Applied Optics, Vol. 41, Iss. 3, pp. 560–563 (2002)
  • Gao Zhan

  • Applied Optics, Vol. 41, Iss. 3, pp. 564–572 (2002)
  • Christian Brackmann, Joakim Bood, Per-Erik Bengtsson, Thomas Seeger, Martin Schenk, and Alfred Leipertz

  • Applied Optics, Vol. 41, Iss. 3, pp. 573–578 (2002)
  • Anatoliy A. Kosterev, Robert F. Curl, Frank K. Tittel, Rüdeger Köhler, Claire Gmachl, Federico Capasso, Deborah L. Sivco, and Alfred Y. Cho
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