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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 13 — May. 1, 2003
  • pp: 2251–2449

Optics InfoBase > Applied Optics > Volume 42 > Issue 13 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 13, pp. 2251–2256 (2003)
  • Richelieu Hemphill and Jerry Edelstein

  • Applied Optics, Vol. 42, Iss. 13, pp. 2257–2263 (2003)
  • Carl V. Brown and Emmanouil E. Kriezis

  • Applied Optics, Vol. 42, Iss. 13, pp. 2264–2272 (2003)
  • Oleg V. Ivanov and Lon A. Wang

  • Applied Optics, Vol. 42, Iss. 13, pp. 2273–2277 (2003)
  • Yunqi Liu, Jianping Yao, and Jianliang Yang

  • Applied Optics, Vol. 42, Iss. 13, pp. 2278–2283 (2003)
  • Joel Villatoro, David Monzón-Hernández, and Efrain Mejía

  • Applied Optics, Vol. 42, Iss. 13, pp. 2284–2288 (2003)
  • Vladimir Goloborodko, Shay Keren, Amir Rosenthal, Boris Levit, and Moshe Horowitz

  • Applied Optics, Vol. 42, Iss. 13, pp. 2289–2300 (2003)
  • Douglas L. Cohen

  • Applied Optics, Vol. 42, Iss. 13, pp. 2301–2311 (2003)
  • Matthieu F. Bal, Florian Bociort, and Joseph J. M. Braat

  • Applied Optics, Vol. 42, Iss. 13, pp. 2312–2316 (2003)
  • Muhammad Nadeem Akram and Muhammad Hammad Asghar

  • Applied Optics, Vol. 42, Iss. 13, pp. 2317–2326 (2003)
  • Tohru Iuchi, Tohru Furukawa, and Shigenobu Wada

  • Applied Optics, Vol. 42, Iss. 13, pp. 2327–2328 (2003)
  • Simeon Sainov, Yanko Sarov, and Stoyan Kurtev

  • Applied Optics, Vol. 42, Iss. 13, pp. 2329–2335 (2003)
  • Chenggen Quan, Cho Jui Tay, Xin Kang, Xiao Yuan He, and Huai Min Shang

  • Applied Optics, Vol. 42, Iss. 13, pp. 2336–2340 (2003)
  • Mikhail Sumetsky, Yury Dulashko, Tom P. White, Tim Olsen, Paul S. Westbrook, and Benjamin J. Eggleton

  • Applied Optics, Vol. 42, Iss. 13, pp. 2341–2345 (2003)
  • Nabeel A. Riza and Muzammil A. Arain

  • Applied Optics, Vol. 42, Iss. 13, pp. 2346–2353 (2003)
  • Mustapha Abarkan, Jean Paul Salvestrini, Michel Aillerie, and Marc D. Fontana

  • Applied Optics, Vol. 42, Iss. 13, pp. 2354–2365 (2003)
  • Leslie L. Deck

  • Applied Optics, Vol. 42, Iss. 13, pp. 2366–2371 (2003)
  • Mitsunori Saito and Teruyuki Yasuda

  • Applied Optics, Vol. 42, Iss. 13, pp. 2372–2376 (2003)
  • Tsong-Ru Tsai, Chao-Yuan Chen, Ci-Ling Pan, Ru-Pin Pan, and Xi-Cheng Zhang

  • Applied Optics, Vol. 42, Iss. 13, pp. 2377–2382 (2003)
  • Jérôme Néauport, Xavier Ribeyre, Jérôme Daurios, Denis Valla, Martine Lavergne, Vincent Beau, and Laurent Videau

  • Applied Optics, Vol. 42, Iss. 13, pp. 2383–2387 (2003)
  • Chengde Li and Suwas Nikumb

  • Applied Optics, Vol. 42, Iss. 13, pp. 2388–2397 (2003)
  • Juliana Tu, Dwight Howard, Scott D. Collins, and Rosemary L. Smith

  • Applied Optics, Vol. 42, Iss. 13, pp. 2398–2406 (2003)
  • Neil C. Bruce

  • Applied Optics, Vol. 42, Iss. 13, pp. 2407–2414 (2003)
  • Philip Baumeister

  • Applied Optics, Vol. 42, Iss. 13, pp. 2415–2421 (2003)
  • David L. Windt, Soizik Donguy, Charles J. Hailey, Jason Koglin, Veijo Honkimaki, Eric Ziegler, Finn E. Christensen, Hubert Chen, Fiona A. Harrison, and William W. Craig

  • Applied Optics, Vol. 42, Iss. 13, pp. 2422–2430 (2003)
  • Thomas H. K. Irving, Andrew G. Peele, and Keith A. Nugent

  • Applied Optics, Vol. 42, Iss. 13, pp. 2431–2435 (2003)
  • Katsumasa Iwai, Yi-Wei Shi, Koh Nito, Yuji Matsuura, Takao Kasai, Mitsunobu Miyagi, Seichi Saito, Youichi Arai, Naomasa Ioritani, Yoshihide Okagami, Michal Nemec, Jan Sulc, Helena Jelinkova, Miroslav Zavoral, Oto Kohler, and Pavel Drlik

  • Applied Optics, Vol. 42, Iss. 13, pp. 2436–2442 (2003)
  • Kevin R. Diamond, Michael S. Patterson, and Thomas J. Farrell

  • Applied Optics, Vol. 42, Iss. 13, pp. 2443–2449 (2003)
  • Emil N. Sobol, Alexander P. Sviridov, Moishe S. Kitai, and Glenn S. Edwards
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