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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 18 — Jun. 20, 2003
  • pp: 3451–3683

Optics InfoBase > Applied Optics > Volume 42 > Issue 18 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 18, pp. 3451–3459 (2003)
  • Rachel A. Johnston, Nicholas J. Wooder, Frederick C. Reavell, Mark Bernhardt, and Christopher Dainty

  • Applied Optics, Vol. 42, Iss. 18, pp. 3460–3471 (2003)
  • Takashi Y. Nakajima, Hiroshi Murakami, Masahiro Hori, Teruyuki Nakajima, Teruo Aoki, Tomohiko Oishi, and Akihiko Tanaka

  • Applied Optics, Vol. 42, Iss. 18, pp. 3472–3479 (2003)
  • Britt Ann K. Høiskar, Rolf Haugen, Tron Danielsen, Arve Kylling, Kåre Edvardsen, Arne Dahlback, Bjørn Johnsen, Mario Blumthaler, and Josef Schreder

  • Applied Optics, Vol. 42, Iss. 18, pp. 3480–3487 (2003)
  • George W. Sutton

  • Applied Optics, Vol. 42, Iss. 18, pp. 3488–3494 (2003)
  • Husain A. Jamid and Muhammad N. Akram

  • Applied Optics, Vol. 42, Iss. 18, pp. 3495–3499 (2003)
  • An Vu Tran, Chang-Joon Chae, and Rodney S. Tucker

  • Applied Optics, Vol. 42, Iss. 18, pp. 3500–3504 (2003)
  • Toshiya Sato

  • Applied Optics, Vol. 42, Iss. 18, pp. 3505–3508 (2003)
  • Yuji Matsuura, Daisuke Akiyama, and Mitsunobu Miyagi

  • Applied Optics, Vol. 42, Iss. 18, pp. 3509–3515 (2003)
  • Yeuk L. Hoo, Wei Jin, Chunzheng Shi, Hoi L. Ho, Dong N. Wang, and Shuang C. Ruan

  • Applied Optics, Vol. 42, Iss. 18, pp. 3516–3521 (2003)
  • Julian Gröbner

  • Applied Optics, Vol. 42, Iss. 18, pp. 3522–3523 (2003)
  • Kevin L. McNesby and Andrzej W. Miziolek

  • Applied Optics, Vol. 42, Iss. 18, pp. 3524–3527 (2003)
  • Weili Zhao, Liping Duo, Fengting Sang, and Fang Chen

  • Applied Optics, Vol. 42, Iss. 18, pp. 3528–3530 (2003)
  • Anting Wang, Hai Ming, Jianping Xie, Xiyao Chen, Liang Lv, Wencai Huang, and Lixin Xu

  • Applied Optics, Vol. 42, Iss. 18, pp. 3531–3537 (2003)
  • Uri P. Oppenheim

  • Applied Optics, Vol. 42, Iss. 18, pp. 3538–3545 (2003)
  • Om Prakash, Gorakh N. Tiwari, Sudhir K. Dixit, and Rajiva Bhatnagar

  • Applied Optics, Vol. 42, Iss. 18, pp. 3546–3549 (2003)
  • Stuart D. Jackson and Simon Mossman

  • Applied Optics, Vol. 42, Iss. 18, pp. 3550–3554 (2003)
  • Darrell J. Armstrong, Mark C. Phillips, and Arlee V. Smith

  • Applied Optics, Vol. 42, Iss. 18, pp. 3555–3557 (2003)
  • Theodore G. Pavlopoulos, David A. Lightner, and Justin O. Brower

  • Applied Optics, Vol. 42, Iss. 18, pp. 3558–3563 (2003)
  • Mark L. Biermann, James Diaz-Barriga, and William S. Rabinovich

  • Applied Optics, Vol. 42, Iss. 18, pp. 3564–3569 (2003)
  • Thomas A. Reichardt, Ray P. Bambha, Thomas J. Kulp, and Randal L. Schmitt

  • Applied Optics, Vol. 42, Iss. 18, pp. 3570–3579 (2003)
  • Ulrich Streppel, Peter Dannberg, Christoph Wächter, Andreas Bräuer, and Richard Kowarschik

  • Applied Optics, Vol. 42, Iss. 18, pp. 3580–3582 (2003)
  • Shibu K. Mathew

  • Applied Optics, Vol. 42, Iss. 18, pp. 3583–3594 (2003)
  • Petter Weibring, Hans Edner, and Sune Svanberg

  • Applied Optics, Vol. 42, Iss. 18, pp. 3595–3609 (2003)
  • Emmanuel Dufour and François-Marie Bréon

  • Applied Optics, Vol. 42, Iss. 18, pp. 3610–3619 (2003)
  • Ilse Aben, Cristina P. Tanzi, Wouter Hartmann, Daphne M. Stam, and Piet Stammes

  • Applied Optics, Vol. 42, Iss. 18, pp. 3620–3633 (2003)
  • Susanne Reichardt and Jens Reichardt

  • Applied Optics, Vol. 42, Iss. 18, pp. 3634–3646 (2003)
  • Dariusz Stramski and Jacek Piskozub

  • Applied Optics, Vol. 42, Iss. 18, pp. 3647–3652 (2003)
  • Gorden Videen, Karri Muinonen, and Kari Lumme

  • Applied Optics, Vol. 42, Iss. 18, pp. 3653–3661 (2003)
  • Fabián A. Videla, Daniel C. Schinca, and Jorge O. Tocho

  • Applied Optics, Vol. 42, Iss. 18, pp. 3662–3669 (2003)
  • Virendra N. Rai, Hansheng Zhang, Fang Y. Yueh, Jagdish P. Singh, and Akshaya Kumar

  • Applied Optics, Vol. 42, Iss. 18, pp. 3670–3677 (2003)
  • Nicola J. van Leeuwen, Jan C. Diettrich, and Andrew C. Wilson

  • Applied Optics, Vol. 42, Iss. 18, pp. 3678–3683 (2003)
  • Dongfeng Liu and Jiayin Qin

  • Applied Optics, Vol. 42, Iss. 18, pp. 3701–3703 (2003)
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