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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3700–4136

Optics InfoBase > Applied Optics > Volume 42 > Issue 19 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 19, pp. 3700–3700 (2003)
  • Glenn D. Boreman

  • Applied Optics, Vol. 42, Iss. 19, pp. 3701–3703 (2003)
  • A. Brunsting, V. D. Amirkhanian, P. W. Baumeister, G. E. Cohn, S. Daniels, J. A. Decker, D. S. Fisher, E. S. Gaynor, R. L. Hilliard, B. A. Horwitz, K. K. Lee, W.-H. Lee, E. G. Loewen, B. R. Masters, H. A. Miranda, G. L. Mitchell, A. Parretta, D. C. Rich, H. B. Schall, M. J. Simpson, S. N. Thennadil, S.-M. Tseng, A. Walczak, W. J. Walecki, R. H. Webb, and H. Zhao

  • Applied Optics, Vol. 42, Iss. 19, pp. 3705–3720 (2003)
  • Matthias Schöck, David Le Mignant, Gary A. Chanan, Peter L. Wizinowich, and Marcos A. van Dam

  • Applied Optics, Vol. 42, Iss. 19, pp. 3721–3725 (2003)
  • Stephen Padin

  • Applied Optics, Vol. 42, Iss. 19, pp. 3726–3736 (2003)
  • Michelle Stephens, Nelson Turner, and Jon Sandberg

  • Applied Optics, Vol. 42, Iss. 19, pp. 3737–3741 (2003)
  • Nazario Bautista-Elivar, Carlos Ignacio Robledo-Sánchez, Alberto Cordero-Dávila, and Alejandro Cornejo-Rodríguez

  • Applied Optics, Vol. 42, Iss. 19, pp. 3742–3744 (2003)
  • Ricardo A. Depine and Marina E. Inchaussandague

  • Applied Optics, Vol. 42, Iss. 19, pp. 3745–3753 (2003)
  • Mitchell Troy and Gary Chanan

  • Applied Optics, Vol. 42, Iss. 19, pp. 3754–3755 (2003)
  • José A. Ferrari and Alfredo Dubra

  • Applied Optics, Vol. 42, Iss. 19, pp. 3756–3764 (2003)
  • Donghyun Kim, Cardinal Warde, Kenneth Vaccaro, and Charles Woods

  • Applied Optics, Vol. 42, Iss. 19, pp. 3765–3765 (2003)
  • Gerald E. Jellison and Frank A. Modine

  • Applied Optics, Vol. 42, Iss. 19, pp. 3766–3771 (2003)
  • Thomas Allsop, Ron Neal, Domenico Giannone, David J. Webb, Des J. Mapps, and Ian Bennion

  • Applied Optics, Vol. 42, Iss. 19, pp. 3772–3775 (2003)
  • Yongqian Li, Fucai Zhang, and Toshihiko Yoshino

  • Applied Optics, Vol. 42, Iss. 19, pp. 3776–3779 (2003)
  • Abdelrafik Malki, Georges Humbert, Youcef Ouerdane, Aziz Boukhenter, and Azzedine Boudrioua

  • Applied Optics, Vol. 42, Iss. 19, pp. 3780–3784 (2003)
  • J. Balaji, Kanchan Garai, Subhasis Chakrabarti, and Sudipta Maiti

  • Applied Optics, Vol. 42, Iss. 19, pp. 3785–3791 (2003)
  • Kamna Pande and Bishnu P. Pal

  • Applied Optics, Vol. 42, Iss. 19, pp. 3792–3794 (2003)
  • James E. Harvey and Andrey Krywonos

  • Applied Optics, Vol. 42, Iss. 19, pp. 3795–3799 (2003)
  • Tatsuo Shiina, Yohei Moritani, Masafumi Ito, and Yasuyuki Okamura

  • Applied Optics, Vol. 42, Iss. 19, pp. 3800–3810 (2003)
  • Julien Moreau, Vincent Loriette, and Albert-Claude Boccara

  • Applied Optics, Vol. 42, Iss. 19, pp. 3811–3818 (2003)
  • Julien Moreau, Vincent Loriette, and Albert-Claude Boccara

  • Applied Optics, Vol. 42, Iss. 19, pp. 3819–3826 (2003)
  • Dola Roy Chowdhury, Kallol Bhattacharya, Ajay Kumar Chakroborty, and Raja Ghosh

  • Applied Optics, Vol. 42, Iss. 19, pp. 3827–3831 (2003)
  • Cho Jui Tay, Xin Kang, Chenggen Quan, Xiao Yuan He, and Huai Min Shang

  • Applied Optics, Vol. 42, Iss. 19, pp. 3832–3842 (2003)
  • Alexander V. Prokhorov, Sergey N. Mekhontsev, and Leonard M. Hanssen

  • Applied Optics, Vol. 42, Iss. 19, pp. 3843–3852 (2003)
  • Lars Büttner and Jürgen Czarske

  • Applied Optics, Vol. 42, Iss. 19, pp. 3853–3863 (2003)
  • Jian-Xin Guo and Xiao-Wei Sun

  • Applied Optics, Vol. 42, Iss. 19, pp. 3864–3881 (2003)
  • Lori S. Goldner, Michael J. Fasolka, Sophie Nougier, Hoang-Phi Nguyen, Garnett W. Bryant, Jeeseong Hwang, Kenneth D. Weston, Kathryn L. Beers, Augustine Urbas, and Edwin L. Thomas

  • Applied Optics, Vol. 42, Iss. 19, pp. 3882–3887 (2003)
  • Giuseppe Coppola, Pietro Ferraro, Mario Iodice, and Sergio De Nicola

  • Applied Optics, Vol. 42, Iss. 19, pp. 3888–3895 (2003)
  • Kenichi Hibino, Bozenko F. Oreb, and Philip S. Fairman

  • Applied Optics, Vol. 42, Iss. 19, pp. 3896–3902 (2003)
  • Christoph Hauger, Marco Wörz, and Thomas Hellmuth

  • Applied Optics, Vol. 42, Iss. 19, pp. 3903–3909 (2003)
  • Brian DeBoo and Jose Sasian

  • Applied Optics, Vol. 42, Iss. 19, pp. 3910–3914 (2003)
  • Matteo Galli, Franco Marabelli, and Giorgio Guizzetti

  • Applied Optics, Vol. 42, Iss. 19, pp. 3915–3926 (2003)
  • Erik Fällman and Ove Axner

  • Applied Optics, Vol. 42, Iss. 19, pp. 3927–3934 (2003)
  • Moon S. Kim, Alan M. Lefcourt, and Yud-Ren Chen

  • Applied Optics, Vol. 42, Iss. 19, pp. 3935–3943 (2003)
  • Alan M. Lefcourt, Moon S. Kim, and Yud-Ren Chen

  • Applied Optics, Vol. 42, Iss. 19, pp. 3944–3949 (2003)
  • Huiguang Kou, Wenfang Shi, Lin Tang, and Hai Ming

  • Applied Optics, Vol. 42, Iss. 19, pp. 3950–3956 (2003)
  • Gianni Corti and Marco Romoli

  • Applied Optics, Vol. 42, Iss. 19, pp. 3957–3969 (2003)
  • Tryfon T. Charalampopoulos and Guocai Shu

  • Applied Optics, Vol. 42, Iss. 19, pp. 3970–3980 (2003)
  • Giampiero Naletto, Alessio Boscolo, Jeffery Wyss, and Alberto Quaranta

  • Applied Optics, Vol. 42, Iss. 19, pp. 3981–3991 (2003)
  • Geoffrey B. Smith, Jacob C. Jonsson, and James Franklin

  • Applied Optics, Vol. 42, Iss. 19, pp. 3992–4001 (2003)
  • Jacques Duparré and Rolf Göring

  • Applied Optics, Vol. 42, Iss. 19, pp. 4002–4007 (2003)
  • Takuo Tanaka and Sadahiko Yamamoto

  • Applied Optics, Vol. 42, Iss. 19, pp. 4008–4015 (2003)
  • Hiromoto Tamura, Ryousuke Kojima, and Hiroaki Usui

  • Applied Optics, Vol. 42, Iss. 19, pp. 4016–4022 (2003)
  • Jeronimus Petrus Antonius Johannes van Beeck, Thomas Grosges, and Maria Grazia De Giorgi

  • Applied Optics, Vol. 42, Iss. 19, pp. 4023–4030 (2003)
  • Giovanni Zaccanti, Samuele Del Bianco, and Fabrizio Martelli

  • Applied Optics, Vol. 42, Iss. 19, pp. 4031–4036 (2003)
  • Ming Zhao, Lei Jin, Bo Chen, Yao Ding, Hui Ma, and Dieyan Chen

  • Applied Optics, Vol. 42, Iss. 19, pp. 4037–4044 (2003)
  • Daniel Poitras, J. A. Dobrowolski, Tom Cassidy, and Simona Moisa

  • Applied Optics, Vol. 42, Iss. 19, pp. 4045–4048 (2003)
  • Iwao Hosako

  • Applied Optics, Vol. 42, Iss. 19, pp. 4049–4058 (2003)
  • Eberhard Spiller, Sherry L. Baker, Paul B. Mirkarimi, Victor Sperry, Eric M. Gullikson, and Daniel G. Stearns

  • Applied Optics, Vol. 42, Iss. 19, pp. 4059–4071 (2003)
  • Daniel B. Sinars, Guy R. Bennett, David F. Wenger, Michael E. Cuneo, and John L. Porter

  • Applied Optics, Vol. 42, Iss. 19, pp. 4072–4079 (2003)
  • Klaus B. Mogensen, Jamil El-Ali, Anders Wolff, and Jörg P. Kutter

  • Applied Optics, Vol. 42, Iss. 19, pp. 4080–4087 (2003)
  • Alexandra Alimova, Alvin Katz, Howard E. Savage, Mahendra Shah, Glenn Minko, Daniel V. Will, Richard B. Rosen, Steven A. McCormick, and Robert R. Alfano

  • Applied Optics, Vol. 42, Iss. 19, pp. 4088–4094 (2003)
  • Jun Li, Sava Sakadžić, Geng Ku, and Lihong V. Wang

  • Applied Optics, Vol. 42, Iss. 19, pp. 4095–4101 (2003)
  • Arjen Amelink, Martin P. L. Bard, Sjaak A. Burgers, and Henricus J. C. M. Sterenborg

  • Applied Optics, Vol. 42, Iss. 19, pp. 4102–4114 (2003)
  • Minming Huang, Tuqiang Xie, Nan Guang Chen, and Quing Zhu

  • Applied Optics, Vol. 42, Iss. 19, pp. 4115–4118 (2003)
  • Walter K. Niblack, John Otto Schenk, Bin Liu, and Mark E. Brezinski

  • Applied Optics, Vol. 42, Iss. 19, pp. 4119–4124 (2003)
  • Takashi Fukano and Atsushi Miyawaki

  • Applied Optics, Vol. 42, Iss. 19, pp. 4125–4136 (2003)
  • Alan B. Thompson, Daniel J. Hawrysz, and Eva M. Sevick-Muraca
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