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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 22 — Aug. 1, 2003
  • pp: 4415–4632

Optics InfoBase > Applied Optics > Volume 42 > Issue 22 > Table of Contents

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Articles Sorted by Page Range

  • Applied Optics, Vol. 42, Iss. 22, pp. 4415–4422 (2003)
  • Chris Hicks, Mark Kalatsky, Richard A. Metzler, and Alexander O. Goushcha

  • Applied Optics, Vol. 42, Iss. 22, pp. 4423–4426 (2003)
  • Yu-Chi Chang, Hao-Ting Tien, Chung-Dau Sung, Chien-Chieh Lee, Chih-Ming Wang, and Jenq-Yang Chang

  • Applied Optics, Vol. 42, Iss. 22, pp. 4427–4430 (2003)
  • Xiaodong Zeng and Yuying An

  • Applied Optics, Vol. 42, Iss. 22, pp. 4431–4433 (2003)
  • Changsen Sun, Yang Zhao, Adam Tennant, and Farhad Ansari

  • Applied Optics, Vol. 42, Iss. 22, pp. 4434–4444 (2003)
  • Xi Chen and Nicholas George

  • Applied Optics, Vol. 42, Iss. 22, pp. 4445–4451 (2003)
  • Timothy J. McIntyre, Alexis I. Bishop, Troy N. Eichmann, and Halina Rubinsztein-Dunlop

  • Applied Optics, Vol. 42, Iss. 22, pp. 4452–4462 (2003)
  • Diana Tentori and Javier Camacho

  • Applied Optics, Vol. 42, Iss. 22, pp. 4463–4467 (2003)
  • Mike Melnichuk and Lowell T. Wood

  • Applied Optics, Vol. 42, Iss. 22, pp. 4468–4479 (2003)
  • Stephan Reichelt, Christof Pruss, and Hans J. Tiziani

  • Applied Optics, Vol. 42, Iss. 22, pp. 4480–4487 (2003)
  • Jessica Schneider, Klaus Mantel, Roland Schreiner, Norbert Lindlein, and Johannes Schwider

  • Applied Optics, Vol. 42, Iss. 22, pp. 4488–4498 (2003)
  • Nicolas B. E. Sawyer, Stephen P. Morgan, Michael G. Somekh, Chung W. See, Eugene Astrakharchik-Farrimond, and Boris Y. Shekunov

  • Applied Optics, Vol. 42, Iss. 22, pp. 4499–4504 (2003)
  • Rabi Rabady and Ivan Avrutsky

  • Applied Optics, Vol. 42, Iss. 22, pp. 4505–4513 (2003)
  • Chun Ye

  • Applied Optics, Vol. 42, Iss. 22, pp. 4514–4521 (2003)
  • Ivan Moreno, Gonzalo Paez, and Marija Strojnik

  • Applied Optics, Vol. 42, Iss. 22, pp. 4522–4528 (2003)
  • Zhi-mei Qi, Naoki Matsuda, Takamitsu Yoshida, Akiko Takatsu, and Kenji Kato

  • Applied Optics, Vol. 42, Iss. 22, pp. 4529–4540 (2003)
  • Oleg V. Angelsky, Dmitry N. Burkovets, Peter P. Maksimyak, and Steen G. Hanson

  • Applied Optics, Vol. 42, Iss. 22, pp. 4541–4548 (2003)
  • Jérôme Genest and Pierre Tremblay

  • Applied Optics, Vol. 42, Iss. 22, pp. 4549–4559 (2003)
  • Peter Lindblom

  • Applied Optics, Vol. 42, Iss. 22, pp. 4560–4565 (2003)
  • Pengfei Wu, Reji Philip, Ramesh B. Laghumavarapu, Janakriam Devulapalli, Devulapalli V. G. L. N. Rao, Brian R. Kimball, Masato Nakashima, and Barry S. DeCristofano

  • Applied Optics, Vol. 42, Iss. 22, pp. 4566–4572 (2003)
  • Juan I. Larruquert, José A. Aznárez, José A. Méndez, and José Calvo-Angós

  • Applied Optics, Vol. 42, Iss. 22, pp. 4573–4579 (2003)
  • Scott R. Kennedy and Michael J. Brett

  • Applied Optics, Vol. 42, Iss. 22, pp. 4580–4583 (2003)
  • Robert Linsbod, Elmar Ritter, and Klaus Leitner

  • Applied Optics, Vol. 42, Iss. 22, pp. 4584–4589 (2003)
  • Georgiy Vaschenko, Yogesh Godwal, Carmen S. Menoni, Claude Montcalm, Richard Blacker, and Daniel Siegfried

  • Applied Optics, Vol. 42, Iss. 22, pp. 4590–4593 (2003)
  • Friedrich Waibel, Elmar Ritter, and Robert Linsbod

  • Applied Optics, Vol. 42, Iss. 22, pp. 4594–4598 (2003)
  • Masahide Takahashi, Akifumi Sakoh, Kentaro Ichii, Yomei Tokuda, Toshinobu Yoko, and Junji Nishii

  • Applied Optics, Vol. 42, Iss. 22, pp. 4599–4605 (2003)
  • Timo T. Saha and William Zhang

  • Applied Optics, Vol. 42, Iss. 22, pp. 4606–4611 (2003)
  • Amy L. Oldenburg, J. Joshua Reynolds, Daniel L. Marks, and Stephen A. Boppart

  • Applied Optics, Vol. 42, Iss. 22, pp. 4612–4620 (2003)
  • Johannes Swartling, Jan S. Dam, and Stefan Andersson-Engels

  • Applied Optics, Vol. 42, Iss. 22, pp. 4621–4632 (2003)
  • Daniel X. Hammer, R. Daniel Ferguson, John C. Magill, Michael A. White, Ann E. Elsner, and Robert H. Webb
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