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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 24 — Aug. 20, 2003
  • pp: 4793–4974

Optics InfoBase > Applied Optics > Volume 42 > Issue 24 > Table of Contents

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Articles Sorted by Page Range

  • Applied Optics, Vol. 42, Iss. 24, pp. 4793–4801 (2003)
  • Karl D. Moore

  • Applied Optics, Vol. 42, Iss. 24, pp. 4802–4810 (2003)
  • Stelvio Tassan and Giovanni M. Ferrari

  • Applied Optics, Vol. 42, Iss. 24, pp. 4811–4818 (2003)
  • Brent L. Ellerbroek, Luc Gilles, and Curtis R. Vogel

  • Applied Optics, Vol. 42, Iss. 24, pp. 4819–4826 (2003)
  • René S. Hansen

  • Applied Optics, Vol. 42, Iss. 24, pp. 4827–4834 (2003)
  • Enrico Allaria, Stefano Brugioni, Sergio De Nicola, Pietro Ferraro, Simonetta Grilli, and Riccardo Meucci

  • Applied Optics, Vol. 42, Iss. 24, pp. 4835–4840 (2003)
  • Sanichiro Yoshida, David H. Reitze, David B. Tanner, and Justin D. Mansell

  • Applied Optics, Vol. 42, Iss. 24, pp. 4841–4846 (2003)
  • Marko Galarza, Kurt De Mesel, Roel Baets, Alfredo Martínez, Cándido Aramburu, and Manuel López-Amo

  • Applied Optics, Vol. 42, Iss. 24, pp. 4847–4854 (2003)
  • Peter Modh, Johan Backlund, Jörgen Bengtsson, Anders Larsson, Naoyuki Shimada, and Toshiaki Suhara

  • Applied Optics, Vol. 42, Iss. 24, pp. 4855–4859 (2003)
  • Sailing He, Xianyu Ao, and Vladimir Romanov

  • Applied Optics, Vol. 42, Iss. 24, pp. 4860–4866 (2003)
  • Daoxin Dai and Sailing He

  • Applied Optics, Vol. 42, Iss. 24, pp. 4867–4870 (2003)
  • Yann Louyer, Mark D. Plimmer, Patrick Juncar, Marc E. Himbert, François Balembois, and Patrick Georges

  • Applied Optics, Vol. 42, Iss. 24, pp. 4871–4876 (2003)
  • Marie Houssin, Philippe Courteille, Caroline Champenois, Mustapha Herbane, Martina Knoop, Michel Vedel, and Fernande Vedel

  • Applied Optics, Vol. 42, Iss. 24, pp. 4877–4882 (2003)
  • Chuan Peng, Guipeng Luo, and Han Q. Le

  • Applied Optics, Vol. 42, Iss. 24, pp. 4883–4886 (2003)
  • Sylvie Yiou, François Balembois, Kathleen Schaffers, and Patrick Georges

  • Applied Optics, Vol. 42, Iss. 24, pp. 4887–4900 (2003)
  • Avishai Ben-David and Hsuan Ren

  • Applied Optics, Vol. 42, Iss. 24, pp. 4901–4908 (2003)
  • Brian Perrett, Michael Harris, Guy N. Pearson, David V. Willetts, and Mark C. Pitter

  • Applied Optics, Vol. 42, Iss. 24, pp. 4909–4913 (2003)
  • Jens Reichardt, Rudolf Baumgart, and Thomas J. McGee

  • Applied Optics, Vol. 42, Iss. 24, pp. 4914–4921 (2003)
  • Michele A. Kuester, Kurtis J. Thome, and John A. Reagan

  • Applied Optics, Vol. 42, Iss. 24, pp. 4922–4936 (2003)
  • Wolfgang G. Bessler, Christof Schulz, Tonghun Lee, Jay B. Jeffries, and Ronald K. Hanson

  • Applied Optics, Vol. 42, Iss. 24, pp. 4937–4945 (2003)
  • Jian-Qi Zhao and Yin-Qiao Hu

  • Applied Optics, Vol. 42, Iss. 24, pp. 4946–4954 (2003)
  • Debbie Kedar and Shlomi Arnon

  • Applied Optics, Vol. 42, Iss. 24, pp. 4955–4962 (2003)
  • Sergey N. Savenkov, Ranjan S. Muttiah, and Yevgeny A. Oberemok

  • Applied Optics, Vol. 42, Iss. 24, pp. 4963–4967 (2003)
  • Michael I. Mishchenko

  • Applied Optics, Vol. 42, Iss. 24, pp. 4968–4974 (2003)
  • Richard Phelan, Michael Lynch, John F. Donegan, and Vincent Weldon
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