Thermal noise and correlations in photon detection

Jonas Zmuidzinas

Appl. Opt. 42(25), 4989-5008 (2003)  View: HTML | PDF

Predicting the response of a submillimeter bolometer to cosmic rays

Adam L. Woodcraft, Rashmi V. Sudiwala, Peter A. R. Ade, Matthew J. Griffin, Elley Wakui, Ravinder S. Bhatia, Andrew E. Lange, James J. Bock, Anthony D. Turner, Minhee H. Yun, and Jeffrey W. Beeman

Appl. Opt. 42(25), 5009-5016 (2003)  View: HTML | PDF

Fabrication of self-apodized short-length fiber Bragg gratings

Meng-Chou Wu and Robert S. Rogowski

Appl. Opt. 42(25), 5017-5023 (2003)  View: HTML | PDF

Diffraction loss in radiometry

Philip Edwards and Martin McCall

Appl. Opt. 42(25), 5024-5032 (2003)  View: HTML | PDF

Electrically controllable in-line-type polarizer using polymer-dispersed liquid-crystal spliced optical fibers

Seungin Baek, Yoonchan Jeong, Hak-Rin Kim, Sin-Doo Lee, and Byoungho Lee

Appl. Opt. 42(25), 5033-5039 (2003)  View: HTML | PDF

Transparent network for hybrid multiplexing of fiber Bragg gratings and intensity-modulated fiber-optic sensors

Silvia Abad, Francisco M. Araújo, Luis Alberto Ferreira, José Luís Santos, and Manuel López-Amo

Appl. Opt. 42(25), 5040-5045 (2003)  View: HTML | PDF

Phase-shifting schlieren: high-resolution quantitative schlieren that uses the phase-shifting technique principle

Luc Joannes, Frank Dubois, and Jean-Claude Legros

Appl. Opt. 42(25), 5046-5053 (2003)  View: HTML | PDF

Response of a silicon photodiode to pulsed radiation

Robert E. Vest and Steven Grantham

Appl. Opt. 42(25), 5054-5063 (2003)  View: HTML | PDF

Symmetry X system and method for absolute measurements of reflectance and transmittance of specular samples

Etsuo Kawate

Appl. Opt. 42(25), 5064-5072 (2003)  View: HTML | PDF

Artificial star test by real-time video holography for the adjustment of high-numerical-aperture micro-objectives

Joachim Heil, Joachim Wesner, Willi Müller, and Thomas Sure

Appl. Opt. 42(25), 5073-5085 (2003)  View: HTML | PDF

Simple portable lens meter

Paul K. Buah-Bassuah, Bruno Tiribilli, Massimo Vassalli, and Giuseppe Molesini

Appl. Opt. 42(25), 5086-5090 (2003)  View: HTML | PDF

Nonlinear common-path interferometer: an image processor

Carlos Gerardo Treviño-Palacios, Marcelo David Iturbe-Castillo, David Sánchez-de-la-Llave, Ruben Ramos-García, and Luis Ignacio Olivos-Pérez

Appl. Opt. 42(25), 5091-5095 (2003)  View: HTML | PDF

Circularly polarized optical heterodyne interferometer for optical activity measurement of a quartz crystal

Chien Chou, Wen-Chuan Kuo, and Chien-Yuan Han

Appl. Opt. 42(25), 5096-5100 (2003)  View: HTML | PDF

Compact effector optics for processing in limited physical access situations

Andreas Kuhn, Mahlen D. T. Fox, Paul W. French, Simon Hettrick, Duncan P. Hand, Yi-Wei Shi, Yuji Matsuura, Mitsunobu Miyagi, Kenneth G. Watkins, Clive L. M. Ireland, and Julian D. C. Jones

Appl. Opt. 42(25), 5101-5106 (2003)  View: HTML | PDF

Spatial light modulator-controlled alignment and spinning of birefringent particles optically trapped in an array

René L. Eriksen, Peter J. Rodrigo, Vincent R. Daria, and Jesper Glückstad

Appl. Opt. 42(25), 5107-5111 (2003)  View: HTML | PDF

Color considerations in fluorescent solar concentrator stacks

Paul D. Swift and Geoff B. Smith

Appl. Opt. 42(25), 5112-5117 (2003)  View: HTML | PDF

Optical properties of Zitex in the infrared to submillimeter

Dominic J. Benford, Michael C. Gaidis, and Jacob W. Kooi

Appl. Opt. 42(25), 5118-5122 (2003)  View: HTML | PDF

Photostability of a fluorescent marker under pulsed excited-state depletion through stimulated emission

Marcus Dyba and Stefan W. Hell

Appl. Opt. 42(25), 5123-5129 (2003)  View: HTML | PDF

Mirrors with regular hexagonal segments

Dario Amodei and Stephen Padin

Appl. Opt. 42(25), 5130-5135 (2003)  View: HTML | PDF

Observations of infrared bands of asymmetrical ozone isotopologues ¹⁶O¹⁶O¹⁸O and ¹⁶O¹⁸O¹⁸O

Alain Barbe, Marie-Renée De Backer-Barilly, Vladimir G. Tyuterev, and Serguei A. Tashkun

Appl. Opt. 42(25), 5136-5139 (2003)  View: HTML | PDF

Effects of interface roughness on the spectral properties of thin films and multilayers

Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparré

Appl. Opt. 42(25), 5140-5148 (2003)  View: HTML | PDF

Osmium atomic-oxygen protection by an iridium overcoat for increased extreme-ultraviolet grating efficiency

Richelieu Hemphill, Mark Hurwitz, and Maria G. Pelizzo

Appl. Opt. 42(25), 5149-5157 (2003)  View: HTML | PDF

Quantifying Doppler angle and mapping flow velocity by a combination of Doppler-shift and Doppler-bandwidth measurements in optical Doppler tomography

Daqing Piao and Quing Zhu

Appl. Opt. 42(25), 5158-5166 (2003)  View: HTML | PDF

Miniaturized digital holography sensor for distal three-dimensional endoscopy

Ervin Kolenovic, Wolfgang Osten, Reiner Klattenhoff, Songcan Lai, Christoph von Kopylow, and Werner Jüptner

Appl. Opt. 42(25), 5167-5172 (2003)  View: HTML | PDF

Experimental and numerical analysis of short-pulse laser interaction with tissue phantoms containing inhomogeneities

Champak Das, Ashish Trivedi, Kunal Mitra, and Tuan Vo-Dinh

Appl. Opt. 42(25), 5173-5180 (2003)  View: HTML | PDF

Tomographic optical breast imaging guided by three-dimensional mammography

Ang Li, Eric L. Miller, Misha E. Kilmer, Thomas J. Brukilacchio, Tina Chaves, Jonathan Stott, Quan Zhang, Tao Wu, MaryAnn Chorlton, Richard H. Moore, Daniel B. Kopans, and David A. Boas

Appl. Opt. 42(25), 5181-5190 (2003)  View: HTML | PDF

Contrast mechanisms in polarization-sensitive Mueller-matrix optical coherence tomography and application in burn imaging

Shuliang Jiao, Wurong Yu, George Stoica, and Lihong V. Wang

Appl. Opt. 42(25), 5191-5197 (2003)  View: HTML | PDF

Polarized light reflection from strained sinusoidal surfaces

Brian Schulkin, Hee C. Lim, Nejat Guzelsu, Glen Jannuzzi, and John F. Federici

Appl. Opt. 42(25), 5198-5208 (2003)  View: HTML | PDF

Quantitative second-harmonic generation microscopy in collagen

Patrick Stoller, Peter M. Celliers, Karen M. Reiser, and Alexander M. Rubenchik

Appl. Opt. 42(25), 5209-5219 (2003)  View: HTML | PDF