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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 25 — Sep. 1, 2003
  • pp: 4989–5219

Optics InfoBase > Applied Optics > Volume 42 > Issue 25 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 25, pp. 4989–5008 (2003)
  • Jonas Zmuidzinas

  • Applied Optics, Vol. 42, Iss. 25, pp. 5009–5016 (2003)
  • Adam L. Woodcraft, Rashmi V. Sudiwala, Peter A. R. Ade, Matthew J. Griffin, Elley Wakui, Ravinder S. Bhatia, Andrew E. Lange, James J. Bock, Anthony D. Turner, Minhee H. Yun, and Jeffrey W. Beeman

  • Applied Optics, Vol. 42, Iss. 25, pp. 5017–5023 (2003)
  • Meng-Chou Wu and Robert S. Rogowski

  • Applied Optics, Vol. 42, Iss. 25, pp. 5024–5032 (2003)
  • Philip Edwards and Martin McCall

  • Applied Optics, Vol. 42, Iss. 25, pp. 5033–5039 (2003)
  • Seungin Baek, Yoonchan Jeong, Hak-Rin Kim, Sin-Doo Lee, and Byoungho Lee

  • Applied Optics, Vol. 42, Iss. 25, pp. 5040–5045 (2003)
  • Silvia Abad, Francisco M. Araújo, Luis Alberto Ferreira, José Luís Santos, and Manuel López-Amo

  • Applied Optics, Vol. 42, Iss. 25, pp. 5046–5053 (2003)
  • Luc Joannes, Frank Dubois, and Jean-Claude Legros

  • Applied Optics, Vol. 42, Iss. 25, pp. 5054–5063 (2003)
  • Robert E. Vest and Steven Grantham

  • Applied Optics, Vol. 42, Iss. 25, pp. 5064–5072 (2003)
  • Etsuo Kawate

  • Applied Optics, Vol. 42, Iss. 25, pp. 5073–5085 (2003)
  • Joachim Heil, Joachim Wesner, Willi Müller, and Thomas Sure

  • Applied Optics, Vol. 42, Iss. 25, pp. 5086–5090 (2003)
  • Paul K. Buah-Bassuah, Bruno Tiribilli, Massimo Vassalli, and Giuseppe Molesini

  • Applied Optics, Vol. 42, Iss. 25, pp. 5091–5095 (2003)
  • Carlos Gerardo Treviño-Palacios, Marcelo David Iturbe-Castillo, David Sánchez-de-la-Llave, Ruben Ramos-García, and Luis Ignacio Olivos-Pérez

  • Applied Optics, Vol. 42, Iss. 25, pp. 5096–5100 (2003)
  • Chien Chou, Wen-Chuan Kuo, and Chien-Yuan Han

  • Applied Optics, Vol. 42, Iss. 25, pp. 5101–5106 (2003)
  • Andreas Kuhn, Mahlen D. T. Fox, Paul W. French, Simon Hettrick, Duncan P. Hand, Yi-Wei Shi, Yuji Matsuura, Mitsunobu Miyagi, Kenneth G. Watkins, Clive L. M. Ireland, and Julian D. C. Jones

  • Applied Optics, Vol. 42, Iss. 25, pp. 5107–5111 (2003)
  • René L. Eriksen, Peter J. Rodrigo, Vincent R. Daria, and Jesper Glückstad

  • Applied Optics, Vol. 42, Iss. 25, pp. 5112–5117 (2003)
  • Paul D. Swift and Geoff B. Smith

  • Applied Optics, Vol. 42, Iss. 25, pp. 5118–5122 (2003)
  • Dominic J. Benford, Michael C. Gaidis, and Jacob W. Kooi

  • Applied Optics, Vol. 42, Iss. 25, pp. 5123–5129 (2003)
  • Marcus Dyba and Stefan W. Hell

  • Applied Optics, Vol. 42, Iss. 25, pp. 5130–5135 (2003)
  • Dario Amodei and Stephen Padin

  • Applied Optics, Vol. 42, Iss. 25, pp. 5136–5139 (2003)
  • Alain Barbe, Marie-Renée De Backer-Barilly, Vladimir G. Tyuterev, and Serguei A. Tashkun

  • Applied Optics, Vol. 42, Iss. 25, pp. 5140–5148 (2003)
  • Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparré

  • Applied Optics, Vol. 42, Iss. 25, pp. 5149–5157 (2003)
  • Richelieu Hemphill, Mark Hurwitz, and Maria G. Pelizzo

  • Applied Optics, Vol. 42, Iss. 25, pp. 5158–5166 (2003)
  • Daqing Piao and Quing Zhu

  • Applied Optics, Vol. 42, Iss. 25, pp. 5167–5172 (2003)
  • Ervin Kolenovic, Wolfgang Osten, Reiner Klattenhoff, Songcan Lai, Christoph von Kopylow, and Werner Jüptner

  • Applied Optics, Vol. 42, Iss. 25, pp. 5173–5180 (2003)
  • Champak Das, Ashish Trivedi, Kunal Mitra, and Tuan Vo-Dinh

  • Applied Optics, Vol. 42, Iss. 25, pp. 5181–5190 (2003)
  • Ang Li, Eric L. Miller, Misha E. Kilmer, Thomas J. Brukilacchio, Tina Chaves, Jonathan Stott, Quan Zhang, Tao Wu, MaryAnn Chorlton, Richard H. Moore, Daniel B. Kopans, and David A. Boas

  • Applied Optics, Vol. 42, Iss. 25, pp. 5191–5197 (2003)
  • Shuliang Jiao, Wurong Yu, George Stoica, and Lihong V. Wang

  • Applied Optics, Vol. 42, Iss. 25, pp. 5198–5208 (2003)
  • Brian Schulkin, Hee C. Lim, Nejat Guzelsu, Glen Jannuzzi, and John F. Federici

  • Applied Optics, Vol. 42, Iss. 25, pp. 5209–5219 (2003)
  • Patrick Stoller, Peter M. Celliers, Karen M. Reiser, and Alexander M. Rubenchik
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