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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 28 — Oct. 1, 2003
  • pp: 5621–5792

Optics InfoBase > Applied Optics > Volume 42 > Issue 28 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 28, pp. 5621–5626 (2003)
  • Frank Scholze, Roman Klein, and Thomas Bock

  • Applied Optics, Vol. 42, Iss. 28, pp. 5627–5633 (2003)
  • Jürgen Eichler, Lothar Dünkel, and Odair Gonçalves

  • Applied Optics, Vol. 42, Iss. 28, pp. 5634–5641 (2003)
  • David I. Farrant and Jon N. Petzing

  • Applied Optics, Vol. 42, Iss. 28, pp. 5642–5648 (2003)
  • Steven Richard Kitchen, Carsten Dam-Hansen, and Michael Linde Jakobsen

  • Applied Optics, Vol. 42, Iss. 28, pp. 5649–5660 (2003)
  • Aurel Ymeti, Johannes S. Kanger, Jan Greve, Paul V. Lambeck, Robert Wijn, and Rene G. Heideman

  • Applied Optics, Vol. 42, Iss. 28, pp. 5661–5669 (2003)
  • Jie Zhang, Tetsuya Yamaguchi, Koichi Iwata, Hisao Kikuta, and Choong Sik Park

  • Applied Optics, Vol. 42, Iss. 28, pp. 5670–5678 (2003)
  • Jennifer E. Decker, John R. Miles, Alan A. Madej, Ralph F. Siemsen, Klaus J. Siemsen, Sebastian de Bonth, Krijn Bustraan, Sara Temple, and James R. Pekelsky

  • Applied Optics, Vol. 42, Iss. 28, pp. 5679–5683 (2003)
  • Vladimir Tolmachev, Tatiana Perova, and Kevin Berwick

  • Applied Optics, Vol. 42, Iss. 28, pp. 5684–5692 (2003)
  • Christoph Kocher, Christoph Weder, and Paul Smith

  • Applied Optics, Vol. 42, Iss. 28, pp. 5693–5700 (2003)
  • Lisong Yang, Cian M. Taylor, Yury Rakovich, and Eithne M. McCabe

  • Applied Optics, Vol. 42, Iss. 28, pp. 5701–5705 (2003)
  • Alexander L. Pokrovsky and Alexei L. Efros

  • Applied Optics, Vol. 42, Iss. 28, pp. 5706–5713 (2003)
  • Michael C. Rushford, Jerald A. Britten, Shamasunder N. Dixit, Curly R. Hoaglan, Michael D. Aasen, and Leslie J. Summers

  • Applied Optics, Vol. 42, Iss. 28, pp. 5714–5721 (2003)
  • W. L. Schaich, G. Schider, J. R. Krenn, A. Leitner, F. R. Aussenegg, I. Puscasu, B. Monacelli, and G. Boreman

  • Applied Optics, Vol. 42, Iss. 28, pp. 5722–5725 (2003)
  • Jianhong Shi, Xianfeng Chen, Yuxing Xia, and Yingli Chen

  • Applied Optics, Vol. 42, Iss. 28, pp. 5726–5736 (2003)
  • Xiang-Run Huang and Robert W. Knighton

  • Applied Optics, Vol. 42, Iss. 28, pp. 5737–5743 (2003)
  • Xiang-Run Huang and Robert W. Knighton

  • Applied Optics, Vol. 42, Iss. 28, pp. 5744–5748 (2003)
  • Yuuki Watanabe, Kodo Kawase, Tomofumi Ikari, Hiromasa Ito, Youichi Ishikawa, and Hiroaki Minamide

  • Applied Optics, Vol. 42, Iss. 28, pp. 5749–5749 (2003)
  • Daniel Poitras, J. A. Dobrowolski, Tom Cassidy, and Simona Moisa

  • Applied Optics, Vol. 42, Iss. 28, pp. 5750–5758 (2003)
  • Saša Bajt, Henry N. Chapman, Nhan Nguyen, Jennifer Alameda, Jeffrey C. Robinson, Michael Malinowski, Eric Gullikson, Andrew Aquila, Charles Tarrio, and Steven Grantham

  • Applied Optics, Vol. 42, Iss. 28, pp. 5759–5764 (2003)
  • Haiying Cheng, Qingming Luo, Zheng Wang, Hui Gong, Shangbin Chen, Wenxi Liang, and Shaoqun Zeng

  • Applied Optics, Vol. 42, Iss. 28, pp. 5765–5773 (2003)
  • Mark M. Wang, Catherine A. Schnabel, Mirianas Chachisvilis, Rong Yang, Michael J. Paliotti, Laura A. Simons, Laura McMullin, Norbert Hagen, Kristie Lykstad, Eugene Tu, Luis M. Pestana, Sudipto Sur, Haichuan Zhang, William F. Butler, Ilona Kariv, and Philippe J. Marchand

  • Applied Optics, Vol. 42, Iss. 28, pp. 5774–5776 (2003)
  • Kun-Huang Chen, Cheng-Chih Hsu, and Der-Chin Su

  • Applied Optics, Vol. 42, Iss. 28, pp. 5777–5784 (2003)
  • Tang Xu, Chunping Zhang, Xinyu Wang, Lianshun Zhang, and Jianguo Tian

  • Applied Optics, Vol. 42, Iss. 28, pp. 5785–5792 (2003)
  • Adam Liebert, Heidrun Wabnitz, Dirk Grosenick, Michael Möller, Rainer Macdonald, and Herbert Rinneberg
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