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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 30 — Oct. 20, 2003
  • pp: 5937–6225

Optics InfoBase > Applied Optics > Volume 42 > Issue 30 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 30, pp. 5937–5937 (2003)
  • David W. Hahn, Andrzej W. Miziolek, and Vincenzo Palleschi

  • Applied Optics, Vol. 42, Iss. 30, pp. 5938–5946 (2003)
  • José Antonio Aguilera, Carlos Aragón, and Jaione Bengoechea

  • Applied Optics, Vol. 42, Iss. 30, pp. 5947–5962 (2003)
  • Valeri I. Babushok, Frank C. DeLucia, Paul J. Dagdigian, Michael J. Nusca, and Andrzej W. Miziolek

  • Applied Optics, Vol. 42, Iss. 30, pp. 5963–5970 (2003)
  • Anna Rita Casavola, Gianpiero Colonna, Alessandro De Giacomo, Olga De Pascale, and Mario Capitelli

  • Applied Optics, Vol. 42, Iss. 30, pp. 5971–5977 (2003)
  • Vincent Detalle, Mohamad Sabsabi, Louis St-Onge, André Hamel, and René Héon

  • Applied Optics, Vol. 42, Iss. 30, pp. 5978–5985 (2003)
  • Ivan G. Dors and Christian G. Parigger

  • Applied Optics, Vol. 42, Iss. 30, pp. 5986–5991 (2003)
  • Christian G. Parigger, Guoming Guan, and James O. Hornkohl

  • Applied Optics, Vol. 42, Iss. 30, pp. 5992–6000 (2003)
  • Christian G. Parigger, David H. Plemmons, and Eugene Oks

  • Applied Optics, Vol. 42, Iss. 30, pp. 6001–6005 (2003)
  • Ota Samek, Franz Leis, Vanja Margetic, Radomir Malina, Kay Niemax, and Roland Hergenröder

  • Applied Optics, Vol. 42, Iss. 30, pp. 6006–6015 (2003)
  • David C. S. Beddows, Ben C. Griffiths, Ota Samek, and Helmut H. Telle

  • Applied Optics, Vol. 42, Iss. 30, pp. 6016–6021 (2003)
  • Jorge E. Carranza, Emily Gibb, Ben W. Smith, David W. Hahn, and James D. Winefordner

  • Applied Optics, Vol. 42, Iss. 30, pp. 6022–6028 (2003)
  • Jorge E. Carranza, Kenjiro Iida, and David W. Hahn

  • Applied Optics, Vol. 42, Iss. 30, pp. 6029–6035 (2003)
  • Pascal Fichet, Denis Menut, René Brennetot, Evelyne Vors, and Annie Rivoallan

  • Applied Optics, Vol. 42, Iss. 30, pp. 6036–6039 (2003)
  • Saara Kaski, Heikki Häkkänen, and Jouko Korppi-Tommola

  • Applied Optics, Vol. 42, Iss. 30, pp. 6040–6046 (2003)
  • Akshaya Kumar, Fang Y. Yueh, Tracy Miller, and Jagdish P. Singh

  • Applied Optics, Vol. 42, Iss. 30, pp. 6047–6051 (2003)
  • Akshaya Kumar, Fang Y. Yueh, and Jagdish P. Singh

  • Applied Optics, Vol. 42, Iss. 30, pp. 6052–6056 (2003)
  • Akira Kuwako, Yutaka Uchida, and Katsuji Maeda

  • Applied Optics, Vol. 42, Iss. 30, pp. 6057–6062 (2003)
  • María P. Mateo, Luisa M. Cabalín, and Javier Laserna

  • Applied Optics, Vol. 42, Iss. 30, pp. 6063–6071 (2003)
  • Denis Menut, Pascal Fichet, Jean-Luc Lacour, Annie Rivoallan, and Patrick Mauchien

  • Applied Optics, Vol. 42, Iss. 30, pp. 6072–6077 (2003)
  • Richard A. Myers, Arieh M. Karger, and David W. Hahn

  • Applied Optics, Vol. 42, Iss. 30, pp. 6078–6084 (2003)
  • Santiago Palanco and Javier Laserna

  • Applied Optics, Vol. 42, Iss. 30, pp. 6085–6093 (2003)
  • William Pearman, Jon Scaffidi, and S. Michael Angel

  • Applied Optics, Vol. 42, Iss. 30, pp. 6094–6098 (2003)
  • Mohamad Sabsabi, Vincent Detalle, Mohamed A. Harith, Walid Tawfik, and Hisham Imam

  • Applied Optics, Vol. 42, Iss. 30, pp. 6099–6106 (2003)
  • Jon Scaffidi, Jack Pender, William Pearman, Scott R. Goode, Bill W. Colston, J. Chance Carter, and S. Michael Angel

  • Applied Optics, Vol. 42, Iss. 30, pp. 6107–6118 (2003)
  • Linda G. Blevins, Christopher R. Shaddix, Shane M. Sickafoose, and Peter M. Walsh

  • Applied Optics, Vol. 42, Iss. 30, pp. 6119–6132 (2003)
  • Ana R. Boyain-Goitia, David C. S. Beddows, Ben C. Griffiths, and Helmut H. Telle

  • Applied Optics, Vol. 42, Iss. 30, pp. 6133–6137 (2003)
  • Michela Corsi, Gabriele Cristoforetti, Montserrat Hidalgo, Stefano Legnaioli, Vincenzo Palleschi, Azenio Salvetti, Elisabetta Tognoni, and Chiara Vallebona

  • Applied Optics, Vol. 42, Iss. 30, pp. 6138–6147 (2003)
  • Igor V. Cravetchi, Mike Taschuk, Georg W. Rieger, Ying Y. Tsui, and Robert Fedosejevs

  • Applied Optics, Vol. 42, Iss. 30, pp. 6148–6152 (2003)
  • Frank C. De Lucia, Russell S. Harmon, Kevin L. McNesby, Raymond J. Winkel, and Andrzej W. Miziolek

  • Applied Optics, Vol. 42, Iss. 30, pp. 6153–6158 (2003)
  • Christopher R. Dockery and Scott R. Goode

  • Applied Optics, Vol. 42, Iss. 30, pp. 6159–6165 (2003)
  • Miki Kurihara, Koji Ikeda, Yoshinori Izawa, Yoshihiro Deguchi, and Hitoshi Tarui

  • Applied Optics, Vol. 42, Iss. 30, pp. 6166–6173 (2003)
  • Klaus Loebe, Arnold Uhl, and Hartmut Lucht

  • Applied Optics, Vol. 42, Iss. 30, pp. 6174–6178 (2003)
  • Madhavi Martin, Barbara Evans, Hugh O’Neill, and Jonathan Woodward

  • Applied Optics, Vol. 42, Iss. 30, pp. 6179–6183 (2003)
  • Daniel Michaud, Eric Proulx, Jean-Guy Chartrand, and Louis Barrette

  • Applied Optics, Vol. 42, Iss. 30, pp. 6184–6191 (2003)
  • Stéphane Morel, Nicolas Leone, Philippe Adam, and Jacques Amouroux

  • Applied Optics, Vol. 42, Iss. 30, pp. 6192–6198 (2003)
  • Christian G. Parigger, James O. Hornkohl, Anna M. Keszler, and László Nemes

  • Applied Optics, Vol. 42, Iss. 30, pp. 6199–6204 (2003)
  • Laszlo Peter, Volker Sturm, and Reinhard Noll

  • Applied Optics, Vol. 42, Iss. 30, pp. 6205–6209 (2003)
  • Alan C. Samuels, Frank C. DeLucia, Kevin L. McNesby, and Andrzej W. Miziolek

  • Applied Optics, Vol. 42, Iss. 30, pp. 6210–6220 (2003)
  • Michael Stepputat and Reinhard Noll

  • Applied Optics, Vol. 42, Iss. 30, pp. 6221–6225 (2003)
  • Volker Sturm and Reinhard Noll
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