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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 31 — Nov. 1, 2003
  • pp: 6239–6426

Optics InfoBase > Applied Optics > Volume 42 > Issue 31 > Table of Contents

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Articles Sorted by Page Range

  • Applied Optics, Vol. 42, Iss. 31, pp. 6239–6244 (2003)
  • Lorenzo Basano, Pasquale Ottonello, Giovanni Rottigni, and Marco Vicari

  • Applied Optics, Vol. 42, Iss. 31, pp. 6245–6254 (2003)
  • William R. Hunter, Michael P. Kowalski, and Raymond G. Cruddace

  • Applied Optics, Vol. 42, Iss. 31, pp. 6255–6260 (2003)
  • Hongbo Wei and Lifeng Li

  • Applied Optics, Vol. 42, Iss. 31, pp. 6261–6266 (2003)
  • Kyung-Rok Kim and Kyunghwan Oh

  • Applied Optics, Vol. 42, Iss. 31, pp. 6267–6275 (2003)
  • Masanori Koshiba and Kunimasa Saitoh

  • Applied Optics, Vol. 42, Iss. 31, pp. 6276–6283 (2003)
  • Juan C. Juarez, Andrew P. Conkey, Robert X. Perez, and Henry F. Taylor

  • Applied Optics, Vol. 42, Iss. 31, pp. 6284–6291 (2003)
  • Ewa Chmielewska, Waclaw Urbańczyk, and Wojtek J. Bock

  • Applied Optics, Vol. 42, Iss. 31, pp. 6292–6304 (2003)
  • Douglas L. Cohen

  • Applied Optics, Vol. 42, Iss. 31, pp. 6305–6313 (2003)
  • Guy Michel, Kjetil Dohlen, Jerome Martignac, Jean-Claude Lecullier, Patrick Levacher, and Claude Colin

  • Applied Optics, Vol. 42, Iss. 31, pp. 6314–6320 (2003)
  • Paramasivam Senthilkumaran

  • Applied Optics, Vol. 42, Iss. 31, pp. 6321–6326 (2003)
  • Donghyun Kim and Kieron Burke

  • Applied Optics, Vol. 42, Iss. 31, pp. 6327–6334 (2003)
  • João M. P. Coelho, Manuel A. Abreu, and F. Carvalho Rodrigues

  • Applied Optics, Vol. 42, Iss. 31, pp. 6335–6341 (2003)
  • Xing-Jie Yu and Hoi-Sing Kwok

  • Applied Optics, Vol. 42, Iss. 31, pp. 6342–6348 (2003)
  • Yoshihiro Uozu and Kazuyuki Horie

  • Applied Optics, Vol. 42, Iss. 31, pp. 6349–6359 (2003)
  • Kris Naessens, Heidi Ottevaere, Roel Baets, Peter Van Daele, and Hugo Thienpont

  • Applied Optics, Vol. 42, Iss. 31, pp. 6360–6366 (2003)
  • Gregory W. Sherman and Curtis C. Bradley

  • Applied Optics, Vol. 42, Iss. 31, pp. 6367–6373 (2003)
  • Luca Poletto, Giuseppe Tondello, and Paolo Villoresi

  • Applied Optics, Vol. 42, Iss. 31, pp. 6374–6381 (2003)
  • John Seely and Benjawan Kjornrattanawanich

  • Applied Optics, Vol. 42, Iss. 31, pp. 6382–6387 (2003)
  • Aleksandra B. Djurišić, Chung Yin Kwong, Tsz Wai Lau, Zheng Tong Liu, Hoi Sing Kwok, Lillian Sze Man Lam, and Wai Kin Chan

  • Applied Optics, Vol. 42, Iss. 31, pp. 6388–6397 (2003)
  • Jörg Neukammer, Carsten Gohlke, Andreas Höpe, Thomas Wessel, and Herbert Rinneberg

  • Applied Optics, Vol. 42, Iss. 31, pp. 6398–6411 (2003)
  • Yasser S. Fawzi, Abo-Bakr M. Youssef, Mohamed H. El-Batanony, and Yasser M. Kadah

  • Applied Optics, Vol. 42, Iss. 31, pp. 6412–6421 (2003)
  • Xuefeng Cheng, Jian-min Mao, Robin Bush, Daniel B. Kopans, Richard H. Moore, and Maryann Chorlton

  • Applied Optics, Vol. 42, Iss. 31, pp. 6422–6426 (2003)
  • Tuqiang Xie, Huikai Xie, Gary K. Fedder, and Yingtian Pan
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