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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 33 — Nov. 20, 2003
  • pp: 6559–6770

Optics InfoBase > Applied Optics > Volume 42 > Issue 33 > Table of Contents

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Articles Sorted by Page Range

  • Applied Optics, Vol. 42, Iss. 33, pp. 6559–6563 (2003)
  • Lars Gislén

  • Applied Optics, Vol. 42, Iss. 33, pp. 6564–6568 (2003)
  • Gary J. Kirkpatrick, Cristina Orrico, Mark A. Moline, Matthew Oliver, and Oscar M. Schofield

  • Applied Optics, Vol. 42, Iss. 33, pp. 6569–6577 (2003)
  • Robert T. Menzies and David M. Tratt

  • Applied Optics, Vol. 42, Iss. 33, pp. 6578–6583 (2003)
  • Mattias Åslund, John Canning, Leon Poladian, C. Martijn de Sterke, and Alex Judge

  • Applied Optics, Vol. 42, Iss. 33, pp. 6584–6594 (2003)
  • Charles L. Adler, James A. Lock, Ian P. Rafferty, and Wayne Hickok

  • Applied Optics, Vol. 42, Iss. 33, pp. 6595–6604 (2003)
  • Richard Wehr, Eamonn McKernan, Adrian Vitcu, Roman Ciurylo, and James R. Drummond

  • Applied Optics, Vol. 42, Iss. 33, pp. 6605–6612 (2003)
  • Hideki Yokoi, Tetsuya Mizumoto, and Yuya Shoji

  • Applied Optics, Vol. 42, Iss. 33, pp. 6613–6620 (2003)
  • Li-Min Hu and Zhi Gao

  • Applied Optics, Vol. 42, Iss. 33, pp. 6621–6629 (2003)
  • Yingping Han, Gerard Gréhan, and Gerard Gouesbet

  • Applied Optics, Vol. 42, Iss. 33, pp. 6630–6635 (2003)
  • Haim Abitan and Preben Buchhave

  • Applied Optics, Vol. 42, Iss. 33, pp. 6636–6639 (2003)
  • Gang Liu, Shulian Zhang, Jun Zhu, and Yan Li

  • Applied Optics, Vol. 42, Iss. 33, pp. 6640–6644 (2003)
  • Takamasa Suzuki, Nobuaki Hido, Xuefeng Zhao, and Osami Sasaki

  • Applied Optics, Vol. 42, Iss. 33, pp. 6645–6649 (2003)
  • Yutaka Yoshikawa, Takeshi Umeki, Takuro Mukae, Yoshio Torii, and Takahiro Kuga

  • Applied Optics, Vol. 42, Iss. 33, pp. 6650–6660 (2003)
  • Khaled A. Elsayed, Russell J. DeYoung, Larry B. Petway, William C. Edwards, James C. Barnes, and Hani E. Elsayed-Ali

  • Applied Optics, Vol. 42, Iss. 33, pp. 6661–6665 (2003)
  • Shai Emanueli and Ady Arie

  • Applied Optics, Vol. 42, Iss. 33, pp. 6666–6671 (2003)
  • Costel Flueraru and Chander P. Grover

  • Applied Optics, Vol. 42, Iss. 33, pp. 6672–6677 (2003)
  • Seok-Hwan Jeong, Tetsuya Mizumoto, Mitsuru Takenaka, and Yoshiaki Nakano

  • Applied Optics, Vol. 42, Iss. 33, pp. 6678–6681 (2003)
  • Clémentine Symonds, Isabelle Sagnes, Arnaud Garnache, Sjoerd Hoogland, Guillaume Saint-Girons, Anne C. Tropper, and Jean-Louis Oudar

  • Applied Optics, Vol. 42, Iss. 33, pp. 6682–6695 (2003)
  • Tobias Rossmann, M. Godfrey Mungal, and Ronald K. Hanson

  • Applied Optics, Vol. 42, Iss. 33, pp. 6696–6703 (2003)
  • Jean-Marc Thériault, Eldon Puckrin, and James O. Jensen

  • Applied Optics, Vol. 42, Iss. 33, pp. 6704–6709 (2003)
  • Jianfeng Xu, Xiaobin Ren, Wenping Gong, Rui Dai, and Dahe Liu

  • Applied Optics, Vol. 42, Iss. 33, pp. 6710–6723 (2003)
  • Min Xu

  • Applied Optics, Vol. 42, Iss. 33, pp. 6724–6727 (2003)
  • Gorden Videen and Wenbo Sun

  • Applied Optics, Vol. 42, Iss. 33, pp. 6728–6738 (2003)
  • Stéphane Schilt, Luc Thévenaz, and Philippe Robert

  • Applied Optics, Vol. 42, Iss. 33, pp. 6739–6746 (2003)
  • Vasanthi Sivaprakasam and Dennis K. Killinger

  • Applied Optics, Vol. 42, Iss. 33, pp. 6747–6756 (2003)
  • Vasanthi Sivaprakasam, Robert F. Shannon, Jr., Caiyan Luo, Paula G. Coble, Jennifer R. Boehme, and Dennis K. Killinger

  • Applied Optics, Vol. 42, Iss. 33, pp. 6757–6767 (2003)
  • Joel P. Kuehner, Mark A. Woodmansee, Robert P. Lucht, and J. Craig Dutton

  • Applied Optics, Vol. 42, Iss. 33, pp. 6768–6770 (2003)
  • Frédéric Druon, Nicolas Sanner, Gaëlle Lucas-Leclin, Patrick Georges, Kim P. Hansen, and Anders Petersson
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