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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 34 — Dec. 1, 2003
  • pp: 6781–6966

Optics InfoBase > Applied Optics > Volume 42 > Issue 34 > Table of Contents

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Articles Sorted by Page Range

  • Applied Optics, Vol. 42, Iss. 34, pp. 6780–6780 (2003)

  • Applied Optics, Vol. 42, Iss. 34, pp. 6783–6796 (2003)
  • Thomas Fricke-Begemann

  • Applied Optics, Vol. 42, Iss. 34, pp. 6797–6803 (2003)
  • Fernando Pérez-Quintián, José Alonso, Jesús Atencia, and Eusebio Bernabeu

  • Applied Optics, Vol. 42, Iss. 34, pp. 6804–6810 (2003)
  • Hanna Lajunen, Jani Tervo, Jari Turunen, Tuomas Vallius, and Frank Wyrowski

  • Applied Optics, Vol. 42, Iss. 34, pp. 6811–6815 (2003)
  • Fadi Issam Baida, Daniel Van Labeke, and Brahim Guizal

  • Applied Optics, Vol. 42, Iss. 34, pp. 6816–6823 (2003)
  • Brent L. Bachim and Thomas K. Gaylord

  • Applied Optics, Vol. 42, Iss. 34, pp. 6824–6829 (2003)
  • Bing Yu and Anbo Wang

  • Applied Optics, Vol. 42, Iss. 34, pp. 6830–6837 (2003)
  • Roman Vander, Stephen G. Lipson, and Ilya Leizerson

  • Applied Optics, Vol. 42, Iss. 34, pp. 6838–6845 (2003)
  • Vesselin Shaoulov and Jannick P. Rolland

  • Applied Optics, Vol. 42, Iss. 34, pp. 6846–6852 (2003)
  • Jesús Muñoz, Marija Strojnik, and Gonzalo Páez

  • Applied Optics, Vol. 42, Iss. 34, pp. 6853–6858 (2003)
  • Shohachi Sonozaki, Koichi Iwata, and Yoshihisa Iwahashi

  • Applied Optics, Vol. 42, Iss. 34, pp. 6859–6868 (2003)
  • Zongtao Ge and Mitsuo Takeda

  • Applied Optics, Vol. 42, Iss. 34, pp. 6869–6876 (2003)
  • Makoto Yamauchi and Kenichi Hibino

  • Applied Optics, Vol. 42, Iss. 34, pp. 6877–6879 (2003)
  • Juan Antonio Rayas, Amalia Martínez, Ramón Rodríguez-Vera, and Sergio Calixto

  • Applied Optics, Vol. 42, Iss. 34, pp. 6880–6888 (2003)
  • Alexandra Fragola, Lionel Aigouy, and Claude Boccara

  • Applied Optics, Vol. 42, Iss. 34, pp. 6889–6896 (2003)
  • Jacques Duparré, Bernt Götz, and Rolf Göring

  • Applied Optics, Vol. 42, Iss. 34, pp. 6897–6904 (2003)
  • Allen H. Rose, Nicolas Feat, and Shelley M. Etzel

  • Applied Optics, Vol. 42, Iss. 34, pp. 6905–6909 (2003)
  • Sergiy Patskovsky, Andrei V. Kabashin, Michel Meunier, and John H. T. Luong

  • Applied Optics, Vol. 42, Iss. 34, pp. 6910–6914 (2003)
  • E. Cojocaru

  • Applied Optics, Vol. 42, Iss. 34, pp. 6915–6918 (2003)
  • Eugene G. Bortchagovsky and Ulrich C. Fischer

  • Applied Optics, Vol. 42, Iss. 34, pp. 6919–6928 (2003)
  • Frédéric Lemarquis and Pierre Riaud

  • Applied Optics, Vol. 42, Iss. 34, pp. 6929–6933 (2003)
  • Takashi Wakamatsu and Shingo Odauchi

  • Applied Optics, Vol. 42, Iss. 34, pp. 6934–6938 (2003)
  • Tina Clausnitzer, Jens Limpert, Karsten Zöllner, Holger Zellmer, Hans-Joerg Fuchs, Ernst-Bernhard Kley, Andreas Tünnermann, Marco Jupé, and Detlev Ristau

  • Applied Optics, Vol. 42, Iss. 34, pp. 6939–6944 (2003)
  • Mohammed H. Modi, Gyanendra S. Lodha, Kawal Jeet S. Sawhney, and Rajendra V. Nandedkar

  • Applied Optics, Vol. 42, Iss. 34, pp. 6945–6952 (2003)
  • Melville P. Ulmer, Robert Altkorn, Michael E. Graham, Anita Madan, and Yong S. Chu

  • Applied Optics, Vol. 42, Iss. 34, pp. 6953–6958 (2003)
  • Andrei B. Vakhtin, Daniel J. Kane, William R. Wood, and Kristen A. Peterson

  • Applied Optics, Vol. 42, Iss. 34, pp. 6959–6966 (2003)
  • Young L. Kim, Joseph T. Walsh, Jr., and Matthew R. Glucksberg
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