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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 6 — Feb. 20, 2003
  • pp: 883–1144

Optics InfoBase > Applied Optics > Volume 42 > Issue 6 > Table of Contents

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  • Applied Optics, Vol. 42, Iss. 6, pp. 883–892 (2003)
  • Børge Hamre, Øyvind Frette, Svein Rune Erga, Jakob J. Stamnes, and Knut Stamnes

  • Applied Optics, Vol. 42, Iss. 6, pp. 893–895 (2003)
  • Yan Li

  • Applied Optics, Vol. 42, Iss. 6, pp. 896–907 (2003)
  • Richard Santer and Nadège Martiny

  • Applied Optics, Vol. 42, Iss. 6, pp. 908–921 (2003)
  • Jeffrey T. Beyer, Michael C. Roggemann, L. John Otten, Timothy J. Schulz, Timothy C. Havens, and Wade W. Brown

  • Applied Optics, Vol. 42, Iss. 6, pp. 922–930 (2003)
  • Maurice A. Jarzembski, Mark L. Norman, Kirk A. Fuller, Vandana Srivastava, and Dean R. Cutten

  • Applied Optics, Vol. 42, Iss. 6, pp. 931–938 (2003)
  • Ammar H. Hakim and Norman J. McCormick

  • Applied Optics, Vol. 42, Iss. 6, pp. 939–951 (2003)
  • Knut Stamnes, Wei Li, Banghua Yan, Hans Eide, Andrew Barnard, W. Scott Pegau, and Jakob J. Stamnes

  • Applied Optics, Vol. 42, Iss. 6, pp. 952–959 (2003)
  • Jonathan D. Posner and Derek Dunn-Rankin

  • Applied Optics, Vol. 42, Iss. 6, pp. 960–971 (2003)
  • Laurent Gallais and Jean-Yves Natoli

  • Applied Optics, Vol. 42, Iss. 6, pp. 972–978 (2003)
  • B. K. Jones, J. R. Saylor, and L. F. Bliven

  • Applied Optics, Vol. 42, Iss. 6, pp. 979–982 (2003)
  • James A. Drallmeier

  • Applied Optics, Vol. 42, Iss. 6, pp. 983–989 (2003)
  • Steven Jackel, Inon Moshe, and Raphy Lavi

  • Applied Optics, Vol. 42, Iss. 6, pp. 990–996 (2003)
  • Marc Longenecker, Lutz Hüwel, Lou Cadwell, and Deborah Nassif

  • Applied Optics, Vol. 42, Iss. 6, pp. 997–1002 (2003)
  • Gaizka Durana, Joseba Zubia, Jon Arrue, Gotzon Aldabaldetreku, and Javier Mateo

  • Applied Optics, Vol. 42, Iss. 6, pp. 1003–1007 (2003)
  • Taehan Bae, Robert A. Atkins, Henry F. Taylor, and William N. Gibler

  • Applied Optics, Vol. 42, Iss. 6, pp. 1008–1012 (2003)
  • Rabah Mokdad, Bertrand Pécheux, Pierre Pfeiffer, and Patrick Meyrueis

  • Applied Optics, Vol. 42, Iss. 6, pp. 1013–1018 (2003)
  • Saeid Behrouzinia, Rasool Sadighi, and Parviz Parvin

  • Applied Optics, Vol. 42, Iss. 6, pp. 1019–1028 (2003)
  • Susanne Picard, Lennart Robertsson, Long-Sheng Ma, Kaj Nyholm, Mikko Merimaa, Tero E. Ahola, Petr Balling, Petr Kr̆en, and Jean-Pierre Wallerand

  • Applied Optics, Vol. 42, Iss. 6, pp. 1029–1035 (2003)
  • Ricardo Duchowicz, Lucía B. Scaffardi, Angel Costela, Inmaculada García-Moreno, Roberto Sastre, and Alberto Ulises Acuña

  • Applied Optics, Vol. 42, Iss. 6, pp. 1036–1039 (2003)
  • Hiroshi Kumagai, Yuichi Asakawa, Tetsuaki Iwane, Katsumi Midorikawa, and Minoru Obara

  • Applied Optics, Vol. 42, Iss. 6, pp. 1040–1047 (2003)
  • Ian N. Ross, Marta Csatári, and Steve Hutchins

  • Applied Optics, Vol. 42, Iss. 6, pp. 1048–1051 (2003)
  • Shaul Pearl, Yosi Ehrlich, Shlomo Fastig, and Salman Rosenwaks

  • Applied Optics, Vol. 42, Iss. 6, pp. 1052–1067 (2003)
  • Kuniharu Takizawa

  • Applied Optics, Vol. 42, Iss. 6, pp. 1068–1074 (2003)
  • Jing Zhang, Hongliang Ma, Changde Xie, and Kunchi Peng

  • Applied Optics, Vol. 42, Iss. 6, pp. 1075–1081 (2003)
  • Aleksey V. Malinka and Eleonora P. Zege

  • Applied Optics, Vol. 42, Iss. 6, pp. 1082–1090 (2003)
  • Rudolf Richter and Andreas Müller

  • Applied Optics, Vol. 42, Iss. 6, pp. 1091–1100 (2003)
  • Christopher A. Hill, Michael Harris, Kevin D. Ridley, Eric Jakeman, and Peter Lutzmann

  • Applied Optics, Vol. 42, Iss. 6, pp. 1101–1114 (2003)
  • Didier Bruneau and Jacques Pelon

  • Applied Optics, Vol. 42, Iss. 6, pp. 1115–1121 (2003)
  • Damien Weidmann and Daniel Courtois

  • Applied Optics, Vol. 42, Iss. 6, pp. 1122–1131 (2003)
  • Edwin Sarkissian and Kevin W. Bowman

  • Applied Optics, Vol. 42, Iss. 6, pp. 1132–1139 (2003)
  • Gennady Shkerdin, Johan Stiens, and Roger Vounckx

  • Applied Optics, Vol. 42, Iss. 6, pp. 1140–1144 (2003)
  • Daniel J. Kane, Jeremy Weston, and Kai-Chien J. Chu
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