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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 14 — May. 10, 2005
  • pp: 2694–2901

Optics InfoBase > Applied Optics > Volume 44 > Issue 14 > Table of Contents

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  • Applied Optics, Vol. 44, Iss. 14, pp. 2694–2694 (2005)

  • Applied Optics, Vol. 44, Iss. 14, pp. 2695–2704 (2005)
  • Lennert R. van den Doel, Peter T. Nagy, Lucas J. van Vliet, and Paul Neitzel

  • Applied Optics, Vol. 44, Iss. 14, pp. 2705–2709 (2005)
  • Mingli Zhang, Liren Liu, Lingyu Wan, and Zhu Luan

  • Applied Optics, Vol. 44, Iss. 14, pp. 2710–2719 (2005)
  • Andreas Wuttig

  • Applied Optics, Vol. 44, Iss. 14, pp. 2720–2727 (2005)
  • Damien P. Kelly, Bryan M. Hennelly, and John T. Sheridan

  • Applied Optics, Vol. 44, Iss. 14, pp. 2728–2735 (2005)
  • Alejandro Federico and Guillermo H. Kaufmann

  • Applied Optics, Vol. 44, Iss. 14, pp. 2736–2744 (2005)
  • Edvard Cibula and Denis Ðonlagić

  • Applied Optics, Vol. 44, Iss. 14, pp. 2745–2753 (2005)
  • Jacob C. Jonsson, Geoffrey B. Smith, Christine Deller, and Arne Roos

  • Applied Optics, Vol. 44, Iss. 14, pp. 2754–2758 (2005)
  • Leonid Vesselov, William Whittington, and Lothar Lilge

  • Applied Optics, Vol. 44, Iss. 14, pp. 2759–2767 (2005)
  • Gyeong-il Kweon, Kwang Taek Kim, Geon-hee Kim, and Hyo-sik Kim

  • Applied Optics, Vol. 44, Iss. 14, pp. 2768–2771 (2005)
  • Fei Hu, Ke-Yuan Qian, and Yi Luo

  • Applied Optics, Vol. 44, Iss. 14, pp. 2772–2781 (2005)
  • Erwin Hack, Phanindra Narayan Gundu, and Pramod Rastogi

  • Applied Optics, Vol. 44, Iss. 14, pp. 2782–2791 (2005)
  • Paul Steinvurzel, Robert A. MacHarrie, Kirk W. Baldwin, Charles W. Van Hise, Benjamin J. Eggleton, and John A. Rogers

  • Applied Optics, Vol. 44, Iss. 14, pp. 2792–2798 (2005)
  • Eyal Ben-Eliezer, Emanuel Marom, Naim Konforti, and Zeev Zalevsky

  • Applied Optics, Vol. 44, Iss. 14, pp. 2799–2804 (2005)
  • Tuck Wah Ng and Kar Tien Ang

  • Applied Optics, Vol. 44, Iss. 14, pp. 2805–2817 (2005)
  • Robert H. Lehmberg and Yung Chan

  • Applied Optics, Vol. 44, Iss. 14, pp. 2818–2826 (2005)
  • David W. Alderfer, G. C. Herring, Paul M. Danehy, Toshiharu Mizukaki, and Kazuyoshi Takayama

  • Applied Optics, Vol. 44, Iss. 14, pp. 2827–2831 (2005)
  • Mohammed H. Al-Mansoori, Suhairi Saharudin, Hairul Abdul-Rashid, Mohd A. Mahdi, and Mohamad K. Abdullah

  • Applied Optics, Vol. 44, Iss. 14, pp. 2832–2838 (2005)
  • Martin Achtenhagen, Amos Hardy, and Eli Kapon

  • Applied Optics, Vol. 44, Iss. 14, pp. 2839–2845 (2005)
  • Aleksandr Ryasnyansky, Bruno Palpant, Solange Debrus, Rashid Ganeev, Andrey Stepanov, Nurdogan Can, Christoph Buchal, and Sibel Uysal

  • Applied Optics, Vol. 44, Iss. 14, pp. 2846–2856 (2005)
  • Marcel Dobber, Ruud Dirksen, Robert Voors, George H. Mount, and Pieternel Levelt

  • Applied Optics, Vol. 44, Iss. 14, pp. 2857–2862 (2005)
  • Frank E. Hoge, Paul E. Lyon, C. Wayne Wright, Robert N. Swift, and James K. Yungel

  • Applied Optics, Vol. 44, Iss. 14, pp. 2863–2869 (2005)
  • Alexander P. Vasilkov, Jay R. Herman, Ziauddin Ahmad, Mati Kahru, and B. Greg Mitchell

  • Applied Optics, Vol. 44, Iss. 14, pp. 2870–2878 (2005)
  • Luca Palchetti, Giovanni Bianchini, Francesco Castagnoli, Bruno Carli, Carmine Serio, Francesco Esposito, Vincenzo Cuomo, Rolando Rizzi, and Tiziano Maestri

  • Applied Optics, Vol. 44, Iss. 14, pp. 2879–2886 (2005)
  • Michele Marrocco

  • Applied Optics, Vol. 44, Iss. 14, pp. 2887–2894 (2005)
  • Michael T. McCulloch, Nigel Langford, and Geoffrey Duxbury

  • Applied Optics, Vol. 44, Iss. 14, pp. 2895–2901 (2005)
  • Yunqi Liu, Kin Seng Chiang, and Pak Lim Chu
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