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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 19 — Jul. 1, 2005
  • pp: 3869–4165

Optics InfoBase > Applied Optics > Volume 44 > Issue 19 > Table of Contents

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  • Applied Optics, Vol. 44, Iss. 19, pp. 3869–3876 (2005)
  • Fabrice Bardin, Adolfo Cobo, Jose M. Lopez-Higuera, Olivier Collin, Pascal Aubry, Thierry Dubois, Mats Högström, Per Nylen, Peter Jonsson, Julian D. C. Jones, and Duncan P. Hand

  • Applied Optics, Vol. 44, Iss. 19, pp. 3877–3884 (2005)
  • Mehrdad Shokooh-Saremi and Mir Mojtaba Mirsalehi

  • Applied Optics, Vol. 44, Iss. 19, pp. 3885–3892 (2005)
  • Peter Domachuk, Airlie Chapman, Eric Mägi, Michael J. Steel, Hong C. Nguyen, and Benjamin J. Eggleton

  • Applied Optics, Vol. 44, Iss. 19, pp. 3893–3897 (2005)
  • R. Andrew Hicks and Ronald K. Perline

  • Applied Optics, Vol. 44, Iss. 19, pp. 3898–3903 (2005)
  • Milan S. Kovacevic, Dragoslav Nikezic, and Alexandar Djordjevich

  • Applied Optics, Vol. 44, Iss. 19, pp. 3904–3911 (2005)
  • Yongfa Fan, Neal Lafferty, Anatoly Bourov, Lena Zavyalova, and Bruce W. Smith

  • Applied Optics, Vol. 44, Iss. 19, pp. 3912–3924 (2005)
  • Jérôme Genest and Pierre Tremblay

  • Applied Optics, Vol. 44, Iss. 19, pp. 3925–3936 (2005)
  • Adam P. Gibson, Jeremy C. Hebden, Jason Riley, Nicholas Everdell, Martin Schweiger, Simon R. Arridge, and David T. Delpy

  • Applied Optics, Vol. 44, Iss. 19, pp. 3937–3944 (2005)
  • Hai-Jun Yang, Jason Deibel, Sven Nyberg, and Keith Riles

  • Applied Optics, Vol. 44, Iss. 19, pp. 3945–3953 (2005)
  • Pablo D. Ruiz, Jonathan M. Huntley, and Ricky D. Wildman

  • Applied Optics, Vol. 44, Iss. 19, pp. 3954–3962 (2005)
  • Abundio Davila, Jonathan M. Huntley, Guillermo H. Kaufmann, and David Kerr

  • Applied Optics, Vol. 44, Iss. 19, pp. 3963–3968 (2005)
  • Daniel S. Kaputa, Andrey N. Kuzmin, Aliaksandr V. Kachynski, Alexander N. Cartwright, and Paras N. Prasad

  • Applied Optics, Vol. 44, Iss. 19, pp. 3969–3976 (2005)
  • Fajian Zhang, Liangmin Zhang, You-Xiong Wang, and Richard Claus

  • Applied Optics, Vol. 44, Iss. 19, pp. 3977–3984 (2005)
  • Lluís Martínez-León, Giancarlo Pedrini, and Wolfgang Osten

  • Applied Optics, Vol. 44, Iss. 19, pp. 3985–3991 (2005)
  • Myun-Sik Kim, Kyoung-Woo Jo, and Jong-Hyun Lee

  • Applied Optics, Vol. 44, Iss. 19, pp. 3992–3999 (2005)
  • Mikio Muro and Yoshiaki Takatani

  • Applied Optics, Vol. 44, Iss. 19, pp. 4000–4003 (2005)
  • Juan Manuel Benavides and Robert H. Webb

  • Applied Optics, Vol. 44, Iss. 19, pp. 4004–4008 (2005)
  • L. C. Kwek, Sheng Fu, T. C. Chia, C. H. Diong, C. L. Tang, and S. M. Krishnan

  • Applied Optics, Vol. 44, Iss. 19, pp. 4009–4022 (2005)
  • Kye-Sung Lee, A. Ceyhun Akcay, Tony Delemos, Eric Clarkson, and Jannick P. Rolland

  • Applied Optics, Vol. 44, Iss. 19, pp. 4023–4031 (2005)
  • Marcelo Soto Thompson, Ann Johansson, Thomas Johansson, Stefan Andersson-Engels, Sune Svanberg, Niels Bendsoe, and Katarina Svanberg

  • Applied Optics, Vol. 44, Iss. 19, pp. 4032–4040 (2005)
  • Fernando Romero-Borja, Krishnakumar Venkateswaran, Austin Roorda, and Thomas Hebert

  • Applied Optics, Vol. 44, Iss. 19, pp. 4041–4048 (2005)
  • Lei Sui, Ronald A. Roy, Charles A. DiMarzio, and Todd W. Murray

  • Applied Optics, Vol. 44, Iss. 19, pp. 4049–4052 (2005)
  • Jeffrey A. Davis, Garrett H. Evans, and Ignacio Moreno

  • Applied Optics, Vol. 44, Iss. 19, pp. 4053–4059 (2005)
  • Sotaro Kawata and Akira Hirose

  • Applied Optics, Vol. 44, Iss. 19, pp. 4060–4073 (2005)
  • Wouter H. Knap, Laurent C.- Labonnote, Gérard Brogniez, and Piet Stammes

  • Applied Optics, Vol. 44, Iss. 19, pp. 4074–4085 (2005)
  • Peng Wang, Emmanuel S. Boss, and Collin Roesler

  • Applied Optics, Vol. 44, Iss. 19, pp. 4086–4095 (2005)
  • Jean-Baptiste Renard, Joëlle Ovarlez, Gwenaël Berthet, Didier Fussen, Filip Vanhellemont, Colette Brogniez, Edith Hadamcik, Michel Chartier, and Henri Ovarlez

  • Applied Optics, Vol. 44, Iss. 19, pp. 4096–4101 (2005)
  • Kristan P. Gurton, Rachid Dahmani, David Ligon, and Burt V. Bronk

  • Applied Optics, Vol. 44, Iss. 19, pp. 4102–4118 (2005)
  • Daniel B. Curtis, Bhavani Rajaram, Owen B. Toon, and Margaret A. Tolbert

  • Applied Optics, Vol. 44, Iss. 19, pp. 4119–4122 (2005)
  • Keisuke Furuta, Tetsuo Kojima, Shuichi Fujikawa, and Jun-ichi Nishimae

  • Applied Optics, Vol. 44, Iss. 19, pp. 4123–4129 (2005)
  • Weidong Chen, Emmanuelle Poullet, Jean Burie, Daniel Boucher, Markus W. Sigrist, Jean-Jacques Zondy, Ludmila Isaenko, Alexander Yèlisseyev, and Sergei Lobanov

  • Applied Optics, Vol. 44, Iss. 19, pp. 4130–4135 (2005)
  • Miao He, Xiaocong Yuan, Jing Bu, and Wai Chye Cheong

  • Applied Optics, Vol. 44, Iss. 19, pp. 4136–4143 (2005)
  • Rita Asquini, Andrea Fratalocchi, Antonio d’Alessandro, and Gaetano Assanto

  • Applied Optics, Vol. 44, Iss. 19, pp. 4144–4147 (2005)
  • Yaw-Dong Wu

  • Applied Optics, Vol. 44, Iss. 19, pp. 4148–4156 (2005)
  • Georgii M. Krekov, Margarita M. Krekova, Dmitrii N. Romashov, and Vitalii S. Shamanaev

  • Applied Optics, Vol. 44, Iss. 19, pp. 4157–4165 (2005)
  • Martin Schenk, Thomas Seeger, and Alfred Leipertz
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