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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 22 — Aug. 1, 2005
  • pp: 4605–4790

Optics InfoBase > Applied Optics > Volume 44 > Issue 22 > Table of Contents

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Articles Sorted by Page Range

  • Applied Optics, Vol. 44, Iss. 22, pp. 4605–4605 (2005)

  • Applied Optics, Vol. 44, Iss. 22, pp. 4607–4614 (2005)
  • Kyoji Matsushima

  • Applied Optics, Vol. 44, Iss. 22, pp. 4615–4624 (2005)
  • Zikuan Chen and Ruola Ning

  • Applied Optics, Vol. 44, Iss. 22, pp. 4625–4630 (2005)
  • Kaiwei Wang and Lijiang Zeng

  • Applied Optics, Vol. 44, Iss. 22, pp. 4631–4638 (2005)
  • Jian Liu, Mario Noël, and Joanne Zwinkels

  • Applied Optics, Vol. 44, Iss. 22, pp. 4639–4647 (2005)
  • Rebecca Olson, Justin Paul, Scott Bergeson, and Dallin S. Durfee

  • Applied Optics, Vol. 44, Iss. 22, pp. 4648–4653 (2005)
  • Xishi Wang and Huihe Qiu

  • Applied Optics, Vol. 44, Iss. 22, pp. 4654–4658 (2005)
  • Hongxin Luo, Changhe Zhou, and Hua Zou

  • Applied Optics, Vol. 44, Iss. 22, pp. 4659–4665 (2005)
  • Soeren Lichtenberg, Christian Heinisch, Victor Petrov, Juergen Petter, and Theo Tschudi

  • Applied Optics, Vol. 44, Iss. 22, pp. 4666–4670 (2005)
  • Shaul Hanany, Johannes Hubmayr, Bradley R. Johnson, Tomotake Matsumura, Paul Oxley, and Matthew Thibodeau

  • Applied Optics, Vol. 44, Iss. 22, pp. 4671–4677 (2005)
  • Irina A. Kozhinova, Henry J. Romanofsky, Alexander Maltsev, Stephen D. Jacobs, William I. Kordonski, and Sergei R. Gorodkin

  • Applied Optics, Vol. 44, Iss. 22, pp. 4678–4683 (2005)
  • Ion Vasilief, Stéphan Guy, Bernard Jacquier, Brigitte Boulard, You Ping Gao, Claire Duverger, Hervé Haquin, Virginie Nazabal, Jean-Luc Adam, Maurice Couchaud, Laurent Fulbert, Cédric Cassagnettes, Frédéric Rooms, and Denis Barbier

  • Applied Optics, Vol. 44, Iss. 22, pp. 4684–4692 (2005)
  • Johannes Swartling, Andrea Bassi, Cosimo D'Andrea, Antonio Pifferi, Alessandro Torricelli, and Rinaldo Cubeddu

  • Applied Optics, Vol. 44, Iss. 22, pp. 4693–4701 (2005)
  • Alexei Kiselev, Heike Wex, Frank Stratmann, Alexandre Nadeev, and Dmitry Karpushenko

  • Applied Optics, Vol. 44, Iss. 22, pp. 4702–4711 (2005)
  • Ian C. M. Littler, Libin Fu, and Benjamin J. Eggleton

  • Applied Optics, Vol. 44, Iss. 22, pp. 4712–4721 (2005)
  • Kenneth D. Skeldon, Graham M. Gibson, Cathy A. Wyse, Lesley C. McMillan, Steve D. Monk, Chris Longbottom, and Miles J. Padgett

  • Applied Optics, Vol. 44, Iss. 22, pp. 4722–4732 (2005)
  • Yuichi Komachi, Hidetoshi Sato, Katsuo Aizawa, and Hideo Tashiro

  • Applied Optics, Vol. 44, Iss. 22, pp. 4733–4744 (2005)
  • François Hénault

  • Applied Optics, Vol. 44, Iss. 22, pp. 4745–4752 (2005)
  • Oleksandr A. Skydan, Michael J. Lalor, and David R. Burton

  • Applied Optics, Vol. 44, Iss. 22, pp. 4753–4760 (2005)
  • Prosenjit Mal, Jason F. Cantin, and Fred R. Beyette, Jr.

  • Applied Optics, Vol. 44, Iss. 22, pp. 4761–4774 (2005)
  • X. Hachair, S. Barland, J. R. Tredicce, and G. L. Lippi

  • Applied Optics, Vol. 44, Iss. 22, pp. 4775–4784 (2005)
  • Sergey Oshchepkov, Yasuhiro Sasano, Tatsuya Yokota, Nobuyuki Uemura, Hisashi Matsuda, Yasuhiro Itou, and Hideaki Nakajima

  • Applied Optics, Vol. 44, Iss. 22, pp. 4785–4790 (2005)
  • Alexander Y. Zasetsky and James J. Sloan
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