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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 25 — Sep. 1, 2005
  • pp: 5166–5340

Optics InfoBase > Applied Optics > Volume 44 > Issue 25 > Table of Contents

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  • Applied Optics, Vol. 44, Iss. 25, pp. 5166–5166 (2005)

  • Applied Optics, Vol. 44, Iss. 25, pp. 5169–5172 (2005)
  • Valeri Orlov, Esteban Luna, and Evguenia Orlova

  • Applied Optics, Vol. 44, Iss. 25, pp. 5173–5179 (2005)
  • Ettore Pedretti, Wesley A. Traub, John D. Monnier, Rafael Millan-Gabet, Nathaniel P. Carleton, F. Peter Schloerb, Michael K. Brewer, Jean-Philippe Berger, Marc G. Lacasse, and Sam Ragland

  • Applied Optics, Vol. 44, Iss. 25, pp. 5180–5189 (2005)
  • Jürgen Czarske, Jasper Möbius, and Karsten Moldenhauer

  • Applied Optics, Vol. 44, Iss. 25, pp. 5190–5197 (2005)
  • Jeremy A. Wahl, Jay S. Van Delden, and Sandip Tiwari

  • Applied Optics, Vol. 44, Iss. 25, pp. 5198–5201 (2005)
  • Masatsugu Yamashita, Mamoru Usami, Kazushiro Fukushima, Ryoichi Fukasawa, Chiko Otani, and Kodo Kawase

  • Applied Optics, Vol. 44, Iss. 25, pp. 5202–5205 (2005)
  • Changsen Sun, Longcheng Yu, Yuxing Sun, and Qingxu Yu

  • Applied Optics, Vol. 44, Iss. 25, pp. 5206–5214 (2005)
  • Fabin Shen and Anbo Wang

  • Applied Optics, Vol. 44, Iss. 25, pp. 5215–5223 (2005)
  • Shojiro Nemoto and Masayuki Tsuchiya

  • Applied Optics, Vol. 44, Iss. 25, pp. 5224–5229 (2005)
  • Yibin Ying, Yande Liu, and Yang Tao

  • Applied Optics, Vol. 44, Iss. 25, pp. 5230–5238 (2005)
  • Laurent Gallais and Mireille Commandré

  • Applied Optics, Vol. 44, Iss. 25, pp. 5239–5248 (2005)
  • David F. Wilson, Sergei A. Vinogradov, Pavel Grosul, M. Noel Vaccarezza, Akiko Kuroki, and Jean Bennett

  • Applied Optics, Vol. 44, Iss. 25, pp. 5249–5256 (2005)
  • Maxim A. Yurkin, Konstantin A. Semyanov, Peter A. Tarasov, Andrei V. Chernyshev, Alfons G. Hoekstra, and Valeri P. Maltsev

  • Applied Optics, Vol. 44, Iss. 25, pp. 5257–5272 (2005)
  • Max Colice, Ted Weverka, Gregory Kriehn, Friso Schlottau, and Kelvin Wagner

  • Applied Optics, Vol. 44, Iss. 25, pp. 5273–5280 (2005)
  • Sébastien Massenot, Jean-Luc Kaiser, Maria Camacho Perez, Raymond Chevallier, and Jean-Louis de Bougrenet de la Tocnaye

  • Applied Optics, Vol. 44, Iss. 25, pp. 5281–5285 (2005)
  • Daisuke Miyazaki, Mark Lasher, and Yeshaiahu Fainman

  • Applied Optics, Vol. 44, Iss. 25, pp. 5286–5291 (2005)
  • Darek J. Bogucki and Julian A. Domaradzki

  • Applied Optics, Vol. 44, Iss. 25, pp. 5292–5303 (2005)
  • Igor Veselovskii, Alexei Kolgotin, Detlef Müller, and David N. Whiteman

  • Applied Optics, Vol. 44, Iss. 25, pp. 5304–5310 (2005)
  • Fabien Ravet, Xiaoyi Bao, and Liang Chen

  • Applied Optics, Vol. 44, Iss. 25, pp. 5311–5314 (2005)
  • Lei Shen, Shaohe Chen, Xiaping Ge, Shizhong Xu, and Dianyuan Fan

  • Applied Optics, Vol. 44, Iss. 25, pp. 5315–5320 (2005)
  • Antonio Ting, Ilya Alexeev, Daniel Gordon, Eldridge Briscoe, Joseph Peñano, Richard Hubbard, Phillip Sprangle, and Glenn Rubel

  • Applied Optics, Vol. 44, Iss. 25, pp. 5321–5331 (2005)
  • Julian Gröbner, Josef Schreder, Stelios Kazadzis, Alkiviadis F. Bais, Mario Blumthaler, Peter Görts, Rick Tax, Tapani Koskela, Gunther Seckmeyer, Ann R. Webb, and Diana Rembges

  • Applied Optics, Vol. 44, Iss. 25, pp. 5332–5340 (2005)
  • Lars Fiedler, Stuart Newman, and Stephan Bakan
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