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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 26 — Sep. 10, 2005
  • pp: 5359–5603

Optics InfoBase > Applied Optics > Volume 44 > Issue 26 > Table of Contents

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  • Applied Optics, Vol. 44, Iss. 26, pp. 5359–5360 (2005)

  • Applied Optics, Vol. 44, Iss. 26, pp. 5361–5367 (2005)
  • Kristan P. Gurton and Rachid Dahmani

  • Applied Optics, Vol. 44, Iss. 26, pp. 5368–5373 (2005)
  • Dae Woong Kim, Yan Zhang, Kristie L. Cooper, and Anbo Wang

  • Applied Optics, Vol. 44, Iss. 26, pp. 5374–5380 (2005)
  • Susana Diaz, Charles R. Booth, Roy Armstrong, Claudio Brunat, Sergio Cabrera, Carolina Camilion, Claudio Casiccia, Guillermo Deferrari, Humberto Fuenzalida, Charlotte Lovengreen, Alejandro Paladini, Jorge Pedroni, Alejandro Rosales, Horacio Zagarese, and Maria Vernet

  • Applied Optics, Vol. 44, Iss. 26, pp. 5381–5392 (2005)
  • Atul Srivastava, K. Muralidhar, and P. K. Panigrahi

  • Applied Optics, Vol. 44, Iss. 26, pp. 5393–5397 (2005)
  • Fan Chen, Zhuangqi Cao, Qishun Shen, and Yaojun Feng

  • Applied Optics, Vol. 44, Iss. 26, pp. 5398–5402 (2005)
  • Donghyun Kim

  • Applied Optics, Vol. 44, Iss. 26, pp. 5403–5407 (2005)
  • Youichi Bitou, Hajime Inaba, Feng-Lei Hong, Toshiyuki Takatsuji, and Atsushi Onae

  • Applied Optics, Vol. 44, Iss. 26, pp. 5408–5414 (2005)
  • Xiaodong Zeng, Changqing Cao, and Yuying An

  • Applied Optics, Vol. 44, Iss. 26, pp. 5415–5421 (2005)
  • Eduardo Lorenzo, Claudio J. Oton, Néstor E. Capuj, Mher Ghulinyan, Daniel Navarro-Urrios, Zeno Gaburro, and Lorenzo Pavesi

  • Applied Optics, Vol. 44, Iss. 26, pp. 5422–5428 (2005)
  • Jian-Jyh Kao, Hsin-Ting Wu, and Chen-Wen Tarn

  • Applied Optics, Vol. 44, Iss. 26, pp. 5429–5433 (2005)
  • Feng Xiao, Weiwei Hu, and Anshi Xu

  • Applied Optics, Vol. 44, Iss. 26, pp. 5434–5445 (2005)
  • Brian J. DeBoo, Jose M. Sasian, and Russell A. Chipman

  • Applied Optics, Vol. 44, Iss. 26, pp. 5446–5453 (2005)
  • Takeo Ejima, Atsushi Yamazaki, Takanori Banse, Katsuhiko Saito, Yuji Kondo, Satoshi Ichimaru, and Hisataka Takenaka

  • Applied Optics, Vol. 44, Iss. 26, pp. 5454–5462 (2005)
  • Fujian Ding, Yud-Ren Chen, and Kuanglin Chao

  • Applied Optics, Vol. 44, Iss. 26, pp. 5463–5467 (2005)
  • Shuliang Jiao, Miloš Todorovic, George Stoica, and Lihong V. Wang

  • Applied Optics, Vol. 44, Iss. 26, pp. 5468–5474 (2005)
  • Melisa Gao, George Lewis, Gordon M. Turner, Antoine Soubret, and Vasilis Ntziachristos

  • Applied Optics, Vol. 44, Iss. 26, pp. 5475–5482 (2005)
  • Michael R. Gleeson, John V. Kelly, Feidhlim T. O’Neill, and John T. Sheridan

  • Applied Optics, Vol. 44, Iss. 26, pp. 5483–5490 (2005)
  • Henri H. Arsenault and Pascuala García-Martínez

  • Applied Optics, Vol. 44, Iss. 26, pp. 5491–5496 (2005)
  • Jindong Tian and Xiang Peng

  • Applied Optics, Vol. 44, Iss. 26, pp. 5497–5503 (2005)
  • Ravinder Kumar Banyal and B. Raghavendra Prasad

  • Applied Optics, Vol. 44, Iss. 26, pp. 5504–5511 (2005)
  • James H. Churnside and Richard E. Thorne

  • Applied Optics, Vol. 44, Iss. 26, pp. 5512–5523 (2005)
  • Ping Yang, Heli Wei, Hung-Lung Huang, Bryan A. Baum, Yong X. Hu, George W. Kattawar, Michael I. Mishchenko, and Qiang Fu

  • Applied Optics, Vol. 44, Iss. 26, pp. 5524–5535 (2005)
  • Gerhard Meister, Ewa J. Kwiatkowska, Bryan A. Franz, Frederick S. Patt, Gene C. Feldman, and Charles R. McClain

  • Applied Optics, Vol. 44, Iss. 26, pp. 5536–5543 (2005)
  • A. Y. S. Cheng and M. H. Chan

  • Applied Optics, Vol. 44, Iss. 26, pp. 5544–5548 (2005)
  • Masashi Eguchi

  • Applied Optics, Vol. 44, Iss. 26, pp. 5549–5560 (2005)
  • Rüdiger Röttgers, Wolfgang Schönfeld, Peter-Rüdiger Kipp, and Roland Doerffer

  • Applied Optics, Vol. 44, Iss. 26, pp. 5561–5564 (2005)
  • Rui Wu, Yuping Chen, Junfeng Zhang, Xianfeng Chen, and Yuxing Xia

  • Applied Optics, Vol. 44, Iss. 26, pp. 5565–5581 (2005)
  • Luc R. Bissonnette, Gilles Roy, and Nathalie Roy

  • Applied Optics, Vol. 44, Iss. 26, pp. 5582–5593 (2005)
  • Martin Schenk, Thomas Seeger, and Alfred Leipertz

  • Applied Optics, Vol. 44, Iss. 26, pp. 5594–5603 (2005)
  • James A. Lock
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