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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Glenn D. Boreman
  • Vol. 44, Iss. 28 — Oct. 1, 2005
  • pp: 5847–6066

Optics InfoBase > Applied Optics > Volume 44 > Issue 28 > Table of Contents

Topics in this Issue

 
  • Atmospheric and Oceanic Optics
  • Coherence and Statistical Optics
  • Ellipsometry and Polarimetry
  • Imaging Systems
  • Instrumentation, Measurement, and Metrology
  • Interferometry
  • Lasers and Laser Optics
  • Medical Optics and Biotechnology
  • Microscopy
  • Optical Data Storage
  • Optical Design and Fabrication
  • Optical Devices
  • Optics at Surfaces
  • Physical Optics
  • Remote Sensing
  • Scattering
  • Spectroscopy
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Optical Technology and Biomedical Optics

Coherence and Statistical Optics

  • Applied Optics Vol. 44, Iss. 28, pp. 5847–5854 (2005)
  • Xizeng Wu and Hong Liu

  • Applied Optics Vol. 44, Iss. 28, pp. 5855–5858 (2005)
  • Simon Dicker and Mark Devlin

Imaging Systems

  • Applied Optics Vol. 44, Iss. 28, pp. 5859–5871 (2005)
  • Oliver P. Lay

  • Applied Optics Vol. 44, Iss. 28, pp. 5872–5883 (2005)
  • Roberto Accorsi

Instrumentation, Measurement, and Metrology

  • Applied Optics Vol. 44, Iss. 28, pp. 5884–5893 (2005)
  • Angela Davies and Tony L. Schmitz

  • Applied Optics Vol. 44, Iss. 28, pp. 5894–5898 (2005)
  • Jari Hovila, Maria Mustonen, Petri Kärhä, and Erkki Ikonen

  • Applied Optics Vol. 44, Iss. 28, pp. 5899–5904 (2005)
  • Mattias Kuldkepp, Nick C. Hawkes, Elisabeth Rachlew, and Beatrix Schunke

  • Applied Optics Vol. 44, Iss. 28, pp. 5905–5909 (2005)
  • Shashi Prakash, Sumitra Singh, and Santosh Rana

Ellipsometry and Polarimetry

  • Applied Optics Vol. 44, Iss. 28, pp. 5910–5918 (2005)
  • Soichi Otsuki, Koji Ohta, Kaoru Tamada, and Shin-ichi Wakida

Interferometry

  • Applied Optics Vol. 44, Iss. 28, pp. 5919–5927 (2005)
  • Hyug-Gyo Rhee, Theodore V. Vorburger, Jonathan W. Lee, and Joseph Fu

Microscopy

  • Applied Optics Vol. 44, Iss. 28, pp. 5928–5936 (2005)
  • Lisong Yang, Aaron Mac Raighne, Eithne M. McCabe, L. Andrea Dunbar, and Toralf Scharf

Optical Devices

  • Applied Optics Vol. 44, Iss. 28, pp. 5937–5946 (2005)
  • Cavour Yeh, Fred Shimabukuro, and Peter H. Siegel

Physical Optics

  • Applied Optics Vol. 44, Iss. 28, pp. 5947–5955 (2005)
  • Robert L. Lucke, Jacqueline Fischer, Arturo M. Polegre, and Douwe A. Beintema

Medical Optics and Biotechnology

  • Applied Optics Vol. 44, Iss. 28, pp. 5956–5965 (2005)
  • Carlos A. Rabito, Yang Chen, Kevin T. Schomacker, and Mark D. Modell

Information Processing

Optical Data Storage

  • Applied Optics Vol. 44, Iss. 28, pp. 5966–5971 (2005)
  • Masaharu Nakano and Yoshimasa Kawata

Lasers, Photonics, and Environmental Optics

Atmospheric and Oceanic Optics

  • Applied Optics Vol. 44, Iss. 28, pp. 5972–5989 (2005)
  • Guy Moreau, Claude Robert, Valéry Catoire, Michel Chartier, Claude Camy-Peyret, Nathalie Huret, Michel Pirre, Luc Pomathiod, and Gilles Chalumeau

Lasers and Laser Optics

  • Applied Optics Vol. 44, Iss. 28, pp. 5990–5995 (2005)
  • Guiqiu Li, Shengzhi Zhao, Kejian Yang, and Peng Song

Optical Design and Fabrication

  • Applied Optics Vol. 44, Iss. 28, pp. 5996–6006 (2005)
  • Yves St-Amant, Daniel Gariépy, and Denis Rancourt

Optical Devices

  • Applied Optics Vol. 44, Iss. 28, pp. 6007–6016 (2005)
  • Seok-Hwan Jeong, Shinji Matsuo, Yuzo Yoshikuni, Toru Segawa, Yoshitaka Ohiso, and Hiroyuki Suzuki

Optics at Surfaces

  • Applied Optics Vol. 44, Iss. 28, pp. 6017–6022 (2005)
  • Cédric Lenaerts, Fabrice Michel, Bernard Tilkens, Yves Lion, and Yvon Renotte

Remote Sensing

  • Applied Optics Vol. 44, Iss. 28, pp. 6023–6030 (2005)
  • Masaharu Imaki and Takao Kobayashi

  • Applied Optics Vol. 44, Iss. 28, pp. 6031–6031 (2005)
  • Sergey Oshchepkov, Yasuhiro Sasano, Tatsuya Yokota, Nobuyuki Uemura, Hisashi Matsuda, Yasuhiro Itou, and Hideaki Nakajima

Scattering

  • Applied Optics Vol. 44, Iss. 28, pp. 6032–6048 (2005)
  • Frank S. Marzano and Giancarlo Ferrauto

  • Applied Optics Vol. 44, Iss. 28, pp. 6049–6057 (2005)
  • J. E. Labs and T. E. Parker

Spectroscopy

  • Applied Optics Vol. 44, Iss. 28, pp. 6058–6066 (2005)
  • Jason R. Schmidt and Scott T. Sanders
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