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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 3 — Jan. 20, 2005
  • pp: 297–466

Optics InfoBase > Applied Optics > Volume 44 > Issue 3 > Table of Contents

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  • Applied Optics, Vol. 44, Iss. 3, pp. 297–304 (2005)
  • U. S. Dinish, Z. X. Chao, L. K. Seah, A. Singh, and V. M. Murukeshan

  • Applied Optics, Vol. 44, Iss. 3, pp. 305–315 (2005)
  • Hongen Liao, Makoto Iwahara, Takefumi Koike, Nobuhiko Hata, Ichiro Sakuma, and Takeyoshi Dohi

  • Applied Optics, Vol. 44, Iss. 3, pp. 316–327 (2005)
  • Brent L. Bachim and Thomas K. Gaylord

  • Applied Optics, Vol. 44, Iss. 3, pp. 328–336 (2005)
  • I. Montilla, S. F. Pereira, and J. J. M. Braat

  • Applied Optics, Vol. 44, Iss. 3, pp. 337–343 (2005)
  • Pascal Picart, Julien Leval, Denis Mounier, and Samuel Gougeon

  • Applied Optics, Vol. 44, Iss. 3, pp. 344–347 (2005)
  • Glen D. Gillen and Shekhar Guha

  • Applied Optics, Vol. 44, Iss. 3, pp. 348–357 (2005)
  • Daqing Piao and Quing Zhu

  • Applied Optics, Vol. 44, Iss. 3, pp. 358–365 (2005)
  • David Pereda Cubián, José Luis Arce Diego, and Raf Rentmeesters

  • Applied Optics, Vol. 44, Iss. 3, pp. 366–377 (2005)
  • Young L. Kim, Yang Liu, Ramesh K. Wali, Hemant K. Roy, and Vadim Backman

  • Applied Optics, Vol. 44, Iss. 3, pp. 378–383 (2005)
  • Rabi Rabady and Ivan Avrutsky

  • Applied Optics, Vol. 44, Iss. 3, pp. 384–390 (2005)
  • Julien Gautier, Franck Delmotte, Marc Roulliay, Françoise Bridou, Marie-Françoise Ravet, and Arnaud Jérome

  • Applied Optics, Vol. 44, Iss. 3, pp. 391–397 (2005)
  • Qi Luo, Jin Yu, S. Abbas Hosseini, Weiwei Liu, Bruno Ferland, Gilles Roy, and See Leang Chin

  • Applied Optics, Vol. 44, Iss. 3, pp. 398–411 (2005)
  • Jennifer A. Hanafin and Peter J. Minnett

  • Applied Optics, Vol. 44, Iss. 3, pp. 412–422 (2005)
  • Giorgio Dall'Olmo and Anatoly A. Gitelson

  • Applied Optics, Vol. 44, Iss. 3, pp. 423–433 (2005)
  • William Priedhorsky and Jeffrey J. Bloch

  • Applied Optics, Vol. 44, Iss. 3, pp. 434–444 (2005)
  • Evelyn Jäkel, Manfred Wendisch, Anke Kniffka, and Thomas Trautmann

  • Applied Optics, Vol. 44, Iss. 3, pp. 445–454 (2005)
  • Terrence R. Meyer, Sukesh Roy, Vincent M. Belovich, Edwin Corporan, and James R. Gord

  • Applied Optics, Vol. 44, Iss. 3, pp. 455–466 (2005)
  • Nobuyuki Uemura, Satoshi Kuriki, Koji Nobuta, Tatsuya Yokota, Hideaki Nakajima, Takafumi Sugita, and Yasuhiro Sasano
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